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What is HALT?

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What is HALT?

  1. 1. HALT - Highly Accelerated Life Test What is HALT Presented By: Trace Laboratories
  2. 2. Background - What is HALT <ul><li>Developed in the 1980(s) </li></ul><ul><li>Excellent Reliability Tool. </li></ul><ul><li>NOT a Pass/Fail Test. </li></ul><ul><li>Uses Temperature and Vibration stresses to expose latent and other defects. </li></ul><ul><li>Establishes Operating and Destructive limits for the unit under test. </li></ul>
  3. 3. HALT - Profiles <ul><li>Cold Step Stress – Establishes lower operating and destructive limits. </li></ul><ul><li>Hot Step Stress – Establishes upper operating and destructive limits. </li></ul><ul><li>Rapid Thermal Cycling – Similar to thermal shock. </li></ul><ul><li>Vibration Step Stress – 6DoF quasi-random vibration spread over broad band frequency. Establishes vibration operating and destructive limits. </li></ul><ul><li>Combined Environment Step Stress – Simultaneous thermal and vibration stresses. </li></ul>
  4. 4. HALT Profile Vibration Step Stress Combined Step Stress Rapid Thermal Cycling Hot Step Stress Cold Step Stress
  5. 5. Fixturing <ul><li>Considerations to mount DUT as per field orientation. </li></ul><ul><li>Considerations to reduce resonances and increase transmissibility. </li></ul><ul><li>Ensure the fixture doesn’t short out the circuitry </li></ul><ul><li>Make it easy to replace DUT (Device Under Test ) </li></ul><ul><li>Allow a uniform air flow across the fixture </li></ul>
  6. 6. HALT and Reliability Destructive Limits Destructive Limits Product Specs Destructive Specs (New) Operating Limits (New) Operating Specs (New) Operating Limits
  7. 7. HALT and Reliability <ul><li>Apply higher stresses at to expose design weaknesses. </li></ul><ul><li>Accelerate stress levels to reduce time and cost affiliated with testing. </li></ul>HALT ESS
  8. 8. HALT and Reliability <ul><li>HALT lowers the ‘floor’ – reduces failure rate, by removing design weaknesses </li></ul><ul><li>HALT increases product life by expanding the ‘flat’ part </li></ul>
  9. 9. <ul><li>Stress levels substituted for sample size and time compression </li></ul><ul><li>Failure modes are the focal point, the stress margins used are not </li></ul><ul><li>Every weakness found represents an opportunity for improvement </li></ul><ul><li>No improvements results in field failures </li></ul><ul><li>If it is found in HALT, it is relevant </li></ul>Conclusion…

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