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Tomorrow's software testing for embedded systems

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A presentation on a vision of innovative software testing paradigms for embedded systems such as automotive

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Tomorrow's software testing for embedded systems

  1. 1. Tomorrow’s Software Testing for Embedded Systems 25th July 2019 (Tue) Yasuharu NISHI Department of Informatics Graduate School of Informatics and Engineering The University of Electro-Communications @YasuharuNishi / Yasuharu.Nishi@uec.ac.jp Also Read: https://www.slideshare.net/YasuharuNishi/line-developer-meetup-in-tokyo-39-presentation-modified
  2. 2. Profile • Assistant professor: – The University of Electro-Communications, Tokyo, Japan • President: – Association of Software Test Engineering, Japan - Nonprofit organization (ASTER) • President: – Japan Software Testing Qualifications Board (JSTQB) • National delegate: – ISO/IEC JTC1/SC7/WG26 Software testing (ISO/IEC(/IEEE) 29119, 33063, 20246) • Founder: – Japan Symposium on Software Testing (JaSST) • Founder: – Testing Engineers’ Forum (TEF: Japanese community on software testing) • Judgement Panel Chair / member: – Test Design Contest Japan, Test Design Competition Malaysia (TDC) • Vice chair: – Software Quality Committee of JUSE (SQiP) • Vice chair: – Society of Embedded Software Skill Acquisition for Managers and Engineers (SESSAME) • Steering Committee Chair – QA4AI Consortium • Advisor: – Software Testing Automation Research group (STAR) © NISHI, Yasuharup.2
  3. 3. Today’s Software Testing for Embedded Systems
  4. 4. © NISHI, Yasuharup.4 QA/Test Architecture Test Viewpoint TDD+NarrowCI E2E Test Automation+KDT+MBT Exp. Based Shift Left / Frontloading Balanced Cloud-ization Full MBD-ization and Agilitization Full Model-based Testing and CI AI supported Shift Left / Frontloading Shift Right Huge Technical Debt No Concept of Technical Logistics Bureaucratic Quality Management Passive Engineers Lack of Responsibility in Management Product Variability Mission Criticality No Big Picture of Development Concepts Innovator's Dilemma / Hesitating Investment Integration with Serious Hardware Development Current Background Innovative Technologies Management Considerations Development Problems Current Technologies
  5. 5. © NISHI, Yasuharup.5 Volatility Uncertainty Complexity Ambiguity Scalability & DX QA/Test Architecture Test Viewpoint TDD+NarrowCI E2E Test Automation+KDT+MBT Exp. Based Shift Left / Frontloading Balanced Cloud-ization Full MBD-ization and Agilitization Full Model-based Testing and CI AI supported Shift Left / Frontloading Shift Right Huge Technical Debt No Concept of Technical Logistics Bureaucratic Quality Management Passive Engineers Lack of Responsibility in Management Product Variability Mission Criticality No Big Picture of Development Concepts Innovator's Dilemma / Hesitating Investment Integration with Serious Hardware Development
  6. 6. p.6 Tomorrow’s Software Testing for Embedded Systems
  7. 7. Tomorrow’s Software Testing in Embedded Systems Current Technologies • QA/Test Architecture • Test Viewpoint • TDD+NarrowCI • E2E Test Automation +KDT+MBT • Exp. Based Shift Left / Frontloading Innovative Technologies • Balanced Cloud-ization • Full MBD-ization and Agilitization • Full Model-based Testing and CI • AI supported Shift Left / Frontloading • Shift Right © NISHI, Yasuharu OTAOSS/COTS/ML
  8. 8. Innovation (1) – Cloud-ization and De-centralization © NISHI, Yasuharup.8 ECU Virtualization Cloud-ization and De-centralization Current Unit A Unit B Unit C Cloud Platform Application Dev. Team
  9. 9. Innovation (2) – Full MBD-ization and Agilitization © NISHI, Yasuharup.9 Edge-Cloud Balance Optimization Full MBD-ization Agilitization and Asyncronization
  10. 10. Innovation (3) – Full Model-based Testing and Full CI © NISHI, Yasuharup.10 Manual Testing Full CI Full Model-based Testing
  11. 11. Current Technologies (1) – QA Architecture Design © NISHI, Yasuharup.11 Fragmented Well-organized “What quality as a whole are we assuring?”
  12. 12. Current Technologies (1) – QA Architecture Design © NISHI, Yasuharup.12 Fragmented Well-organized “What quality as a whole are we assuring?”
  13. 13. Current Technologies (1) – Test Architecture Design © NISHI, Yasuharup.13 Test Container Test Viewpoint Test architecture design in Daimler Systematic Test Platform Selection - Reducing Costs for Testing Software-based Automotive E/E Systems C. Schwarzl and J. Herrmann in ICST 2018 Industry session ・ Test Viewpoint Test Container
  14. 14. Current Technologies (2) – Test Viewpoint © NISHI, Yasuharup.14 Kind of OS OS Platform Environment - Win10 - Win8 - Win7 Test Values Bottom viewpoint = Parameter Viewpoint Viewpoint Viewpoint Example of a viewpoint diagram on a mindmap format
  15. 15. Current Technologies (3) – TDD+Narrow CI © NISHI, Yasuharup.15 “Test Yourself” by Takuto Wada @ JaSST Hokkaido 2014 https://cloud.google.com/solutions/continuous-integration/
  16. 16. Current Technologies (4) – E2E Test Automation+KDT+MDT © NISHI, Yasuharup.16 ISO/IEC/IEEE 29119-5:2016 Quality Commander https://www.jnovel.co.jp/service/qc/product/ “It is great that we automate our tests, but why are they so bad?” by Jeff Offutt @ ICST 2018
  17. 17. Current Technologies (5) – Experienced-based Shift Left / Frontloading © NISHI, Yasuharup.17 Reusable Development RecommendationDevelopment Data Non-reusable Development Data Development Data Experience-based Frontloading No Frontloading
  18. 18. Innovation (4) – AI/ML-supported Shift-Left / Frontloading © NISHI, Yasuharup.18 Digitalized Development Data Development Recommendation by AI/ML AI/ML supported Frontloading Development Data Non-reusable Development Data No Frontloading
  19. 19. Innovation (5) – Shift Right © NISHI, Yasuharup.19 Phase-gate (but actually unfinished) Testing Full CI Shift Right (Test after Release) OTAOSS/COTS/ML
  20. 20. Tomorrow’s Software Testing in Embedded Systems Current Technologies • QA/Test Architecture • Test Viewpoint • TDD+NarrowCI • E2E Test Automation +KDT+MBT • Exp. Based Shift Left / Frontloading Innovative Technologies • Balanced Cloud-ization • Full MBD-ization and Agilitization • Full Model-based Testing and CI • AI supported Shift Left / Frontloading • Shift Right © NISHI, Yasuharu OTAOSS/COTS/ML
  21. 21. p.21 Tomorrow’s Software Testing for Embedded Systems

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