SPICE MODEL of 2SD1164-Z in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: DARLINGTON TRANSISTOR
PART NUMBER: 2SD1164-Z
MANUFACTURER: NEC CORPORATION
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

2. BIPOLAR JUNCTION TRANSISTOR MODEL
PSpice
model Model description
parameter
IS Saturation Current
BF Ideal Maximum Forward Beta
NF Forward Current Emission Coefficient
VAF Forward Early Voltage
IKF Forward Beta Roll-off Knee Current
ISE Non-ideal Base-Emitter Diode Saturation Current
NE Non-ideal Base-Emitter Diode Emission Coefficient
BR Ideal Maximum Reverse Beta
NR Reverse Emission Coefficient
VAR Reverse Early Voltage
IKR Reverse Beta Roll-off Knee Current
RE Emitter Resistance
RB Base Resistance
RC Series Collector Resistance
CJE Zero-bias Emitter-Base Junction Capacitance
VJE Emitter-Base Junction Potential
MJE Emitter-Base Junction Grading Coefficient
CJC Zero-bias Collector-Base Junction Capacitance
VJC Collector-base Junction Potential
MJC Collector-base Junction Grading Coefficient
TF Forward Transit Time
TR Reverse Transit Time
XTB Forward Beta Temperature Coefficient
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

3. DIODE MODEL
PSpice model
Model description
parameter
IS Saturation Current
RS Series Resistance
CJO Zero-bias Junction Capacitance
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

4. Ic-hFE Characteristics
Simulation result
Simulation
Evaluation Circuit
V2
0Vdc
U1 2(C)
V3
1(B)
0Vdc
R1 R2
V1
3(E) 2Vdc
Q2SD1164-Z
I1
0Adc
0
Peak of hFE Measurement Simulation % Error
IC(A) 1 1.0484 -4.84
hFE 10 k 9.5 k 5
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

5. Vce(sat) Voltage & Vbe(sat) Voltage Characteristics
Simulation result
Vbe(sat) Voltage/Simulation
Vce(sat) Voltage/Simulation
Evaluation Circuit
U1 2(C)
1(B)
R1 R2
3(E) I2
Q2SD1164-Z
1Adc
I1
1mAdc
0
Measurement Simulation % Error
Vce(sat) 0.75 V 0.729 V 2.80
Vbe(sat) 1.15 V 1.1483 V 0.148
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

6. Output Characteristics
Simulation result
Ib=200u
Ib=180u Ib=160u
Ib=140u
u
u u
u
Ib=120u
u
Ib=100u
Evaluation Circuit
U1 2(C)
1(B)
R1 R2 V1
5Vdc
3(E)
Q2SD1164-Z
I1
220uAdc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004