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National Taiwan UniversityNational Taiwan University
A Parallel Test Pattern
Generation Algorithm to Meet
Multiple Quality...
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion  
2
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion  
3
Outline  
• Introduction
– Background  knowledge  
– PODEM  Quick  Review  
• Split-­into-­W-­Clones(SWK)  
• Experiment  ...
Introduction  -­ Background  Knowledge  
• Single  stuck-­at  fault  (SSF)  model  is  no  longer  
effective  enough  in ...
Introduction  -­ Background  Knowledge  
• Quality  metrics  
– N-­detect  
– Physical-­aware  N-­detect  (PAN)
– Gate  ex...
Introduction  -­ Background  Knowledge  
• To  achieve  high  quality  test  pattern  generation  (TPG),  
quality  object...
Introduction  -­ PODEM  Quick  Review    
• Path-­sensitizing  ATPG  algorithm  
• After  fault  activation,  system  choo...
Outline  
• Introduction
– Background  knowledge  
– PODEM  Quick  Review  
• Split-­into-­W-­Clones(SWK)  
• Experiment  ...
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion  
10
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion  
11
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
– 7-­Valued  Logic  
– System  Flow  
• Experiment  Result  
• ...
SWK  -­ 7-­Valued  Logic  
13
SWK  -­ 7-­Valued  Logic  
14
SWK  -­ System  Flow  
15
SWK  -­ System  Flow  
16
SWK  -­ System  Flow  
17
SWK  -­ System  Flow  
18
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
– 7-­Valued  Logic  
– System  Flow  
• Experiment  Result  
• ...
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion
20
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion
21
Experiment  Result  
22
Experiment  Result  
23
Outline  
• Introduction  
• Split-­into-­W-­Clones(SWK)  
• Experiment  Result  
• Conclusion  
24
Conclusion  
• SWK  optimize  test  pattern  quality  during  TPG  
• Might  able  to  integrate  SWK  into  other  
paral...
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Paper-review: A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives

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- Author: Kuan-Yu Liao, Chia-Yuan Chang, and James Chien-Mo Li, National Taiwan University
- Publication: IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, 2011

Published in: Engineering
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Paper-review: A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives

  1. 1. National Taiwan UniversityNational Taiwan University A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives K.Y. Liao, IEEE Trans. Comput.-Aided Design Intergr. Circuits Syst., Vol. 30, Issue 11 1 J.Y.  Chen,  2015/09/15
  2. 2. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   2
  3. 3. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   3
  4. 4. Outline   • Introduction – Background  knowledge   – PODEM  Quick  Review   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   4
  5. 5. Introduction  -­ Background  Knowledge   • Single  stuck-­at  fault  (SSF)  model  is  no  longer   effective  enough  in  deep  sub-­micron  (DSM)   circuits • Several  quality  metrics  are  introduced  to  grade   patterns 5
  6. 6. Introduction  -­ Background  Knowledge   • Quality  metrics   – N-­detect   – Physical-­aware  N-­detect  (PAN) – Gate  exhaustive  (GE) – Bridging  coverage  Estimate  (BCE) 6
  7. 7. Introduction  -­ Background  Knowledge   • To  achieve  high  quality  test  pattern  generation  (TPG),   quality  objective  are  introduced  during  the  process   • Additional  quality  objectives  may  cause  lots  of   backtracks  during  TPG   • Some  tries  to  grade  and  select  patterns  from  large-­N-­ detect  test  set  generated  by  traditional  TPG  tool   • SWK  adopted  bit-­wise  parallel  strategy  to  realize  search-­ space  parallelism,  thus  get  more  chance  to  justify   additional  quality  objectives     7
  8. 8. Introduction  -­ PODEM  Quick  Review     • Path-­sensitizing  ATPG  algorithm   • After  fault  activation,  system  choose  a  gate  from   D-­frontier  and  then  gradually  map  corresponding   D-­drive  objective  to  a  PI/PPI  decision,  called   backtrace • After  each  decision  make,  run  implication to   update  the  logic  value  of  circuit   • Heuristics  such  as  X-­path  search are  adopted   for  early  avoidance  of  backtrack   8
  9. 9. Outline   • Introduction – Background  knowledge   – PODEM  Quick  Review   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   9
  10. 10. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   10
  11. 11. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   11
  12. 12. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   – 7-­Valued  Logic   – System  Flow   • Experiment  Result   • Conclusion   12
  13. 13. SWK  -­ 7-­Valued  Logic   13
  14. 14. SWK  -­ 7-­Valued  Logic   14
  15. 15. SWK  -­ System  Flow   15
  16. 16. SWK  -­ System  Flow   16
  17. 17. SWK  -­ System  Flow   17
  18. 18. SWK  -­ System  Flow   18
  19. 19. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   – 7-­Valued  Logic   – System  Flow   • Experiment  Result   • Conclusion   19
  20. 20. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion 20
  21. 21. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion 21
  22. 22. Experiment  Result   22
  23. 23. Experiment  Result   23
  24. 24. Outline   • Introduction   • Split-­into-­W-­Clones(SWK)   • Experiment  Result   • Conclusion   24
  25. 25. Conclusion   • SWK  optimize  test  pattern  quality  during  TPG   • Might  able  to  integrate  SWK  into  other   parallelism  strategy   • Word  size  are  predefined  and  less  flexible   • Only  support  parallel  pattern  generation  target   on  single  fault     25

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