Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry  Sujan Sami, Industry Manager Test &...
Focus Points 1. Introduction – Traditional vs. Virtual vs. Embedded Instrumentation 2. Validation, Inspection and Test Tec...
Introduction – Traditional vs. Virtual vs. Embedded Instrumentation Traditional instruments  – comprised of pre-defined ha...
Validation, Inspection and Test Technologies Oscilloscopes Logic analyzers  BERTs Test In-circuit Testers (ICTs) Flying Pr...
Existing Technical Discontinuities Primary Challenges catering to circuit boards Accessibility Complexity Cost The migrati...
Embedded Instrumentation – Solving Validation, Test and Debug  Problems Technology Roadmap Embedded Instrumentation <ul><l...
Market Trends and Analysis <ul><li>Instruments: </li></ul><ul><li>Collect and analyze data. </li></ul><ul><li>Software bas...
Conclusion <ul><li>CAPEX in downward-trend market </li></ul><ul><li>Access to chips critical </li></ul><ul><li>Development...
“ Turning Test & Measurement Inside Out”  March 10, 2010 Glenn Woppman ASSET President and CEO “ 2008 EDN Innovator of the...
ASSET InterTech - origin <ul><li>Spin-off of Texas Instruments in 1995 </li></ul><ul><li>Boundary Scan Test Market leader*...
What is our T&M strategy?
What is Embedded Instrumentation? <ul><li>Any logic structure within a device   with a purpose of: Design-for-Test (DFT) D...
Diminishing test probe access <ul><li>Multi-layered boards with internal-only traces </li></ul><ul><li>BGAs and other inte...
Degradation of high-speed signals <ul><li>Intrusive, probe-based systems are not able to measure high-speed signals withou...
Stacked die – no probe access Through-Silicon Vias Bond Wire
Embedded Instrumentation: Validation of this Technology Trend  <ul><ul><li>“Software Solutions to Hardware Problems” </li>...
Embedded Instrumentation:  Re-Use at Each Level of Integration <ul><li>Any Design Validation, Test or Debug IP embedded in...
Significant Product-Life Cycle Savings <ul><li>Re-Use Saves Time and Money…but there’s more </li></ul><ul><ul><li>Semicond...
ASSET Market Opportunity and Strategy
Intel ®  IBIST (Interconnect Built-In Self Test) <ul><li>An embedded instrument which enables high-speed I/O testing </li>...
IEEE P1687 (IJTAG) based solutions <ul><li>PLX  visionPAK ™ is an embedded instrument PCIe pattern generator/analyzer </li...
Non-intrusive Board Test (NBT) <ul><li>Intel ® Greencity Customer Reference Board </li></ul><ul><li>Convergence of Boundar...
Next Steps <ul><li>Register for Frost & Sullivan’s  Growth Opportunity Newsletter  and keep   abreast of innovative growth...
Your Feedback is Important to Us <ul><li>Growth Forecasts? </li></ul><ul><li>Competitive Structure? </li></ul><ul><li>Emer...
Follow Frost & Sullivan on Twitter http://twitter.com/Frost_Sullivan Frost & Sullivan on Twitter
For Additional Information Sarah Saatzer Corporate Communications Measurement & Instrumentation (210) 477-8427 [email_addr...
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Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry

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  • Could we change the 3 rd bullet to “Actively involved in defining new test methodologies, e.g. IEEE 1687 (IJTAG)”? The reason for this is that mentioning Embedded Instrumentation in this slide detracts from the following 2 slides.
  • ERA A&amp;T |V 1 |R SV/AM |E AM |A
  • Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry

    1. 1. Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry Sujan Sami, Industry Manager Test & Measurement March 10, 2010
    2. 2. Focus Points 1. Introduction – Traditional vs. Virtual vs. Embedded Instrumentation 2. Validation, Inspection and Test Technologies 3. Existing Technical Discontinuities 6. Conclusion 5. Market Trends and Analysis 4. Embedded Instrumentation – Solving Validation, Test and Debug Problems
    3. 3. Introduction – Traditional vs. Virtual vs. Embedded Instrumentation Traditional instruments – comprised of pre-defined hardware components. Virtual instrumentation – use of customizable software and modular instrumentation hardware. Embedded instrumentation - a concept of entrenching and enhancing the capabilities of traditional external test equipment as an additional resource on the chip and/or on dedicated instrumentation chips on a circuit board. Hardware Embedded Software Application Software Traditional Embedded
    4. 4. Validation, Inspection and Test Technologies Oscilloscopes Logic analyzers BERTs Test In-circuit Testers (ICTs) Flying Probe Testers Boundary Scan Testers Functional Testers Validation, Inspection & Test Technologies Test In-circuit Testers (ICTs) Manufacturing Defect Analyzers (MDA) Flying Probe Testers Boundary Scan Testers Functional Testers Inspection Inspection Automated optical inspection/ Automated X-ray inspection (AOI/AXI) systems Validation
    5. 5. Existing Technical Discontinuities Primary Challenges catering to circuit boards Accessibility Complexity Cost The migration to chip interconnects speeds in excess of 5 Gbps The need for protocol-aware high-speed I/O test Limited capacity of testers Lack of test access for signal integrity testing Lack of test access for PCB structural testing
    6. 6. Embedded Instrumentation – Solving Validation, Test and Debug Problems Technology Roadmap Embedded Instrumentation <ul><li>Embedded instruments are IP inserted within chips to perform specific validation, test and debug functions. </li></ul><ul><li>Some of the test technologies that utilize embedded instrumentation include boundary scan test, processor-controlled test, I/O instrumentation test and core instrumentation test. </li></ul><ul><li>Examples of this embedded instrumentation include Intel®’s Interconnect Built-In Self Test (IBIST) for QuickPath Interconnect (QPI) and PCIe BERT/margining, and PLX Technology’s visionPAK™ PCIe packet generator/analyzer toolkit. </li></ul>1998 1950s Analog Oscilloscope Digital Oscilloscope VXI Embedded Instrumentation Present and Future PXI LXI 1993 1971 2005
    7. 7. Market Trends and Analysis <ul><li>Instruments: </li></ul><ul><li>Collect and analyze data. </li></ul><ul><li>Software based T&M instruments. </li></ul><ul><li>Boundary scan testing. </li></ul><ul><li>Cost: </li></ul><ul><li>Cost-effective, agile and flexible. </li></ul><ul><li>Easy to use interface. </li></ul><ul><li>Modular Instrumentation – software used to replace prescribed hardware functionality. </li></ul><ul><li>Standard: </li></ul><ul><li>According to Moore’s law, the number of transistors on chips will double every two years. </li></ul><ul><li>IJTAG Family of Standards: IEEE 1149.1, IEEE P1687, IEEE 1500, IEEE 1149.6, IEEE 1149.7. </li></ul>Trend Analysis Traditional Instruments Embedded Hardware Cost Software ... To ... From GPIB Standard IEEE IJTAG
    8. 8. Conclusion <ul><li>CAPEX in downward-trend market </li></ul><ul><li>Access to chips critical </li></ul><ul><li>Development in standards and better price-to-performance ratio </li></ul>Pre 1980 Traditional Instruments 1980s Virtual Instruments 2010 and beyond Embedded Instruments Opportunities in the ATE testing industry Future of Testing 2008 6.4 Intel QPI 2009 6.0 Serial ATA III 2008 4.8 USB 3.0 2005 3.125 XAUI 2010 8.0 PCI Express III 2006 10.2 HDMI 1.3 Initial Adoption Speed (Gbps or GT/s) Standard Busses
    9. 9. “ Turning Test & Measurement Inside Out” March 10, 2010 Glenn Woppman ASSET President and CEO “ 2008 EDN Innovator of the Year Finalist & 2009 EDN Innovation of the Year Finalist”
    10. 10. ASSET InterTech - origin <ul><li>Spin-off of Texas Instruments in 1995 </li></ul><ul><li>Boundary Scan Test Market leader* </li></ul><ul><li>Leading the efforts to establish the Embedded Instrumentation market segment </li></ul><ul><li>Company Characteristics </li></ul><ul><ul><li>Standards oriented </li></ul></ul><ul><ul><li>Software focused </li></ul></ul><ul><ul><li>Global </li></ul></ul>* Frost & Sullivan report for 2007 (about 30% market share) plus Agilent & Intel endorsements
    11. 11. What is our T&M strategy?
    12. 12. What is Embedded Instrumentation? <ul><li>Any logic structure within a device with a purpose of: Design-for-Test (DFT) Design-for-Debug (DFD) Design-for-Yield (DFY) Test or Functional items. (extract from IEEE P1687 documentation) </li></ul>
    13. 13. Diminishing test probe access <ul><li>Multi-layered boards with internal-only traces </li></ul><ul><li>BGAs and other integrated packages with inaccessible nodes, SoC, SiP, etc. </li></ul>ICT/MDA Accessibility Presented by Intel at Test Tech Forum 2008
    14. 14. Degradation of high-speed signals <ul><li>Intrusive, probe-based systems are not able to measure high-speed signals without disrupting their integrity </li></ul><ul><li>“ You probe it...... you break it” </li></ul>
    15. 15. Stacked die – no probe access Through-Silicon Vias Bond Wire
    16. 16. Embedded Instrumentation: Validation of this Technology Trend <ul><ul><li>“Software Solutions to Hardware Problems” </li></ul></ul><ul><ul><li>Transition of external hardware to chip IP + software </li></ul></ul><ul><li>µP emulation </li></ul><ul><li>Structural Test for </li></ul><ul><li>printed circuit boards </li></ul><ul><li>Instrumentation for </li></ul><ul><li>Validation </li></ul><ul><li>Structural & Functional </li></ul><ul><li>Test & Debug for ICs </li></ul>
    17. 17. Embedded Instrumentation: Re-Use at Each Level of Integration <ul><li>Any Design Validation, Test or Debug IP embedded in a core that can be used by design, test and manufacturing engineers is an embedded instrument </li></ul>
    18. 18. Significant Product-Life Cycle Savings <ul><li>Re-Use Saves Time and Money…but there’s more </li></ul><ul><ul><li>Semiconductor PCB </li></ul></ul>
    19. 19. ASSET Market Opportunity and Strategy
    20. 20. Intel ® IBIST (Interconnect Built-In Self Test) <ul><li>An embedded instrument which enables high-speed I/O testing </li></ul><ul><li>Bit Error Rate (BER) testing, as well as margining (eye diagrams) </li></ul><ul><li>Resident in Intel ® next-generation chips and chipsets </li></ul><ul><li>Validates and tests QPI, PCIe, SMI and DDR3 high-speed buses </li></ul>
    21. 21. IEEE P1687 (IJTAG) based solutions <ul><li>PLX visionPAK ™ is an embedded instrument PCIe pattern generator/analyzer </li></ul><ul><li>New generation of PCIe Gen 3 switch silicon incorporates tools for receiver eye capture; pattern generation; fault injection; and packet performance monitoring. </li></ul><ul><li>Used by PLX to validate its own products, and by its customers to check signal integrity and manufacturing quality of their board designs. </li></ul><ul><li>Gen 3 devices will run under ASSET ScanWorks® </li></ul>
    22. 22. Non-intrusive Board Test (NBT) <ul><li>Intel ® Greencity Customer Reference Board </li></ul><ul><li>Convergence of Boundary Scan Test, Processor-Controlled Test, and Intel® IBIST </li></ul><ul><li>Combination of three embedded instrumentation-based technologies offers unmatched levels of test coverage and cost reduction. </li></ul>See the case study at http://tinyurl.com/scanworks-greencity
    23. 23.
    24. 24. Next Steps <ul><li>Register for Frost & Sullivan’s Growth Opportunity Newsletter and keep abreast of innovative growth opportunities ( www.frost.com/news ) </li></ul><ul><li>Register for the next Chairman’s Series on Growth : </li></ul><ul><li>Accelerating Growth through Vertical Market Expansion: A How-To Primer (April 6) ( http://www.frost.com/growth ) </li></ul>
    25. 25. Your Feedback is Important to Us <ul><li>Growth Forecasts? </li></ul><ul><li>Competitive Structure? </li></ul><ul><li>Emerging Trends? </li></ul><ul><li>Strategic Recommendations? </li></ul><ul><li>Other? </li></ul>Please inform us by taking our survey. What would you like to see from Frost & Sullivan? Frost & Sullivan’s Growth Consulting can assist with your growth strategies
    26. 26. Follow Frost & Sullivan on Twitter http://twitter.com/Frost_Sullivan Frost & Sullivan on Twitter
    27. 27. For Additional Information Sarah Saatzer Corporate Communications Measurement & Instrumentation (210) 477-8427 [email_address] Sujan Sami Industry Manager Test & Measurement +91 – 44 – 42044640 [email_address] Kiran Unni Research Manager Measurement & Instrumentation (210) 247 2495 [email_address]

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