1. IEEE 2013-2014 VLSI TITLES
1.
A High Speed Low Power Cam With A Parity Bit And Power-Gated Ml Sensing
2.
A Low-Complexity Turbo Decoder Architecture For Energy-Efficient Wireless
Sensor Networks
3.
Active Filter-Based Hybrid On-Chip Dc–Dc Converter For Point-Of-Load Voltage
Regulation
4.
Analysis And Design Of A Low-Voltage Low-Power Double-Tail Comparator
5.
Broad Side And Skewed-Load Tests Under Primary Input Constraints
6.
Built-In Generation Of Functional Broadside Tests Using A Fixed Hardware
Structure
7.
C-Based Complex Event Processing On Reconfigurable Hardware
8.
Design And Analysis Of Dual-Mode Digital-Control Step-Up Switched-Capacitor
Power Converter With Pulse-Skipping And Numerically Controlled OscillatorBased Frequency Modulation
9.
Eliminating Synchronization Latency Using Sequenced Latching
10.
Error Detection In Majority Logic Decoding Of Euclidean Geometry Low Density
Parity Check (Eg-Ldpc) Codes
11.
Gate Mapping Automation For Asynchronous Null Convention Logic Circuits
12.
Glitch-Free Nand-Based Digitally Controlled Delay-Lines
13.
Isonet: Hardware-Based Job Queue Management For Many-Core Architectures
14.
Low-Power Digital Signal Processor Architecture For Wireless Sensor Nodes
15.
Low-Resolution Dac-Driven Linearity Testing Of Higher Resolution Adcs Using
Polynomial Fitting Measurements
16.
MDC FFTIFFT Processor with Variable Length For MIMO-OFDM Systems

2. 17.
Multi voltage Aware Resistive Open Fault Model
18.
Power-Planning-Aware Soft Error Hardening via Selective Voltage Assignment
19.
RATS Restoration-Aware Trace Signal Selection for Post-Silicon Validation
20.
Robust Hybrid Memristor-CMOS Memory Modeling and Design
21.
Self-Repairing Digital System With Unified Recovery Process Inspired By
Endocrine Cellular Communication
22.
Smart Reliable NetworkonChip
23.
Split-SAR ADCs Improved Linearity With Power and Speed Optimization
24.
Spur-Reduction Frequency Synthesizer Exploiting Randomly Selected PFD
25.
Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode
Power Switches
26.
Test Patterns of Multiple SIC Vectors Theory and Application in BIST Schemes
27.
The LUT-SR Family of Uniform Random Number Generators for FPGA
Architectures
28.
Time-Based All-Digital Technique for Analog Built-in Self-Test