Yelo laser reliability burn in and lifetest for photonic devices


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Yelo Test Systems for Laser Reliability, Accelerated Lifetime tests, Lifetest, Burn-in and early failure detection and removal

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  • This is our knowledge base, not necessarily our offering, it shows that we understand the customers problems, associated with the manufacture of their product. Ex Nortel Engineers are John Martin, Burt Nathan, Jaz Childs
  • Yelo laser reliability burn in and lifetest for photonic devices

    1. 1. Yelo Laser Reliability Burn in and Lifetest for Active Photonic Device
    2. 2. Company History <ul><li>1983 Yelo founded </li></ul><ul><li>2001 Acquired by Mindready Solutions </li></ul><ul><li>2008 Mindready acquired by Averna </li></ul><ul><li>2010 Management Buyout Out and rebrand Yelo </li></ul>
    3. 3. Clients <ul><li>Yelo’s clients include Telecom Network Equipment Original Equipment Manufacturers, Photonic and opto-electronic device manufacturers, startups and contract manufacturers </li></ul><ul><li>Europe: UK, Germany, Sweden, Finland, France </li></ul><ul><li>North America: Canada, East and West coast USA </li></ul><ul><li>China: Shenzen </li></ul><ul><li>Over 110 systems installed with 34 clients globally </li></ul>
    4. 4. Laser Reliability,Burn-in and Lifetest Expertise <ul><li>Over 100 man years of photonics experience </li></ul><ul><li>Ex Nortel / Bookham / Oclaro engineers </li></ul><ul><li>Photonic device manufacturing and QA expertise </li></ul><ul><li>Photonic device Qualification/Burn-in/Lifetest Equipment </li></ul><ul><li>Thermal Management </li></ul><ul><li>Device reliability-Telcordia standards </li></ul><ul><li>Device packaging (40Gb / 100 Gb) </li></ul><ul><li>Testing and fixturing (40Gb / 100 Gb) </li></ul>
    5. 5. Low Power Module Design <ul><li>Low Power Module Designs </li></ul><ul><ul><li>Probed Devices </li></ul></ul><ul><ul><ul><li>VCSEL Array </li></ul></ul></ul><ul><ul><ul><li>Laser Array 10 channel </li></ul></ul></ul><ul><ul><ul><li>APD </li></ul></ul></ul><ul><ul><li>Chip-on Carrier </li></ul></ul><ul><ul><ul><li>Photonics Integrated Circuit (Lasers, Amplifiers, Modulator, Photodiode, Thermistor) </li></ul></ul></ul><ul><ul><ul><li>SOA (Semi conductor Optical Amplifier) </li></ul></ul></ul><ul><ul><ul><li>Lasers </li></ul></ul></ul><ul><ul><ul><li>Laser Arrays </li></ul></ul></ul><ul><ul><ul><li>APD (150V) </li></ul></ul></ul><ul><ul><ul><li>PIN Photodiodes </li></ul></ul></ul><ul><ul><li>Packaged </li></ul></ul><ul><ul><ul><li>VCSEL TO Headers </li></ul></ul></ul><ul><ul><ul><li>Mini DIL </li></ul></ul></ul><ul><ul><ul><li>Butterfly </li></ul></ul></ul>
    6. 6. Why Yelo? <ul><li>Device fixturing research and development and expertise including </li></ul><ul><ul><li>Tight temperature control of devices </li></ul></ul><ul><ul><li>Sufficient downward pressure on devices to ensure good thermal contact </li></ul></ul><ul><ul><li>Accurate electrical probing to drive and measure devices </li></ul></ul><ul><ul><li>Optical analysis </li></ul></ul><ul><li>Photonics Domain expertise </li></ul><ul><ul><li>We have designed, manufactured and tested devices and understand the constraints </li></ul></ul><ul><li>Time to market </li></ul><ul><ul><li>Modular approach using standard laser drive cards and standard flexible software enables new systems to be delivered faster than building your own </li></ul></ul>
    7. 7. Laser Reliability, Burn-in, Lifetest & Qualification System <ul><li>Lifetest and burn-in at different temperatures </li></ul><ul><li>Test different products and packages in different modules </li></ul><ul><li>Suitable for contract manufacturers, startups and mid volume </li></ul><ul><li>One control rack can test up to up to 2,048 devices per rack </li></ul><ul><li>Can be expanded by the addition of up to 2 slave racks as volume production increases </li></ul>
    8. 8. Independent Temperature Controlled Modules <ul><li>A drawer can hold up to 8 modules </li></ul><ul><li>A module can hold up to 16 devices </li></ul><ul><li>This provides for up to 128 devices per drawer </li></ul><ul><li>Each module can operate at different temperature and testing cycle </li></ul>
    9. 9. Customised Module Design <ul><li>Each module can hold up to 16 devices </li></ul><ul><li>The number of devices per module depends upon the complexity of the device </li></ul><ul><li>Devices held at temperature on hot plate </li></ul><ul><li>Light detectors can be added and cooled if required </li></ul>
    10. 10. High Power System <ul><li>One control rack can test up to up to 480 devices per rack </li></ul><ul><li>Can be expanded by the addition of up to 2 slave racks as volume production increases </li></ul>
    11. 11. High Volume Drawer Based System <ul><li>This system uses the same rack and laser drive cards. </li></ul><ul><li>Each rack contains 4 drawers with no modules. </li></ul><ul><li>Each drawer contains a customised heating plate allowing up to 256 devices to be loaded. </li></ul><ul><li>Suitable for packaged devices such as TO-CAN. </li></ul>
    12. 12. High Power Module <ul><li>Uses a liquid-cooled baseplate with a peltier option </li></ul><ul><li>Off-the-shelf fixturing includes high accuracy pogo pins for chip-on-carrier devices, clamps for C-mount and W-mount devices, connectors for packaged devices and TO headers </li></ul><ul><li>Liquid-cooled Integrating spheres dissipate high optical powers </li></ul>
    13. 13. Automation Software <ul><li>Over 2 man years of software engineering development </li></ul><ul><li>Sophisticated temperature control algorithms </li></ul><ul><li>Clear, flexible user interface displaying the status of units under test including module temperature </li></ul><ul><li>Programmable alarm conditions and notification via email </li></ul><ul><li>Data recording to any ODBC compliant database </li></ul><ul><li>Graphical displays of device performance during testing including degradation </li></ul><ul><li>Laser control constant current or constant power modes </li></ul><ul><li>LIV sweep analysis & spot measurements </li></ul><ul><li>Burn-in at one temperature & characterize at another, with programmable cycle times </li></ul><ul><li>All module parameters may be set independently (drive current, temperature, burn-in time etc.) </li></ul>
    14. 14. Main User Interface
    15. 15. Diagnostics & Configuration
    16. 16. Cost Effective Benchtop System <ul><li>Suitable for laboratory or for low volume use </li></ul><ul><li>2 Modules – not expandable </li></ul><ul><li>Up to 32 devices </li></ul>
    17. 17. High Power Module Design <ul><li>High Power Module Designs </li></ul><ul><ul><li>Chip on Carrier </li></ul></ul><ul><ul><ul><li>C Mount – 20 Amp </li></ul></ul></ul><ul><ul><ul><li>BA Mount – 40 Amp </li></ul></ul></ul><ul><ul><li>Packaged </li></ul></ul><ul><ul><ul><li>Butterfly – 20 Amp </li></ul></ul></ul>
    18. 18. Probed Photonic Integrated Circuit / Laser Bar Test & Qualification <ul><li>Burn-in and lifetest of a 12 chip VCSEL array using a probe card. </li></ul>
    19. 19. Burn In and Life Test – Benefits <ul><li>Easy reconfiguration for new products </li></ul><ul><ul><li>(wide range of modules) </li></ul></ul><ul><li>Flexible use – </li></ul><ul><ul><li>Burn-in, Lifetest and Qualification at the same time </li></ul></ul><ul><li>Automatic in-situ measurement </li></ul><ul><ul><li>(reduces handling time) </li></ul></ul><ul><li>NIST standard measurement precision for every device </li></ul><ul><li>Ease of calibration / maintenance </li></ul><ul><li>Each drawer is independent of others </li></ul><ul><ul><li>(virtually no single point of failure) </li></ul></ul><ul><li>Individual independent temperature zones in groups of 16 </li></ul><ul><li>Price effective at low volume </li></ul><ul><ul><li>(suitable for R+D facilities) </li></ul></ul>