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IEC 
62804 
Status 
Update 
NREL 
is 
a 
na3onal 
laboratory 
of 
the 
U.S. 
Department 
of 
Energy, 
Office 
of 
Energy 
...
2 
2 
Phone 
Discussions 
with 
NC-­‐nominated 
Experts: 
Document 
82/685/NP 
Focused 
discussion 
during 
Fall-­‐Winter ...
3 
3 
October 
2014 
(Kyoto) 
– CD 
comments 
received 
and 
discussed, 
major 
items 
include: 
 2nd 
test 
type 
describ...
4 
4 
CD 
comment 
period: 
some 
key 
results 
– 60°C/85% 
RH 
test 
moved 
from 
non 
equilibrium 
startup 
to 
equilibr...
5 
5 
Damp 
heat 
– 
V 
profile 
Thanks 
to 
Bengt 
Jaeckel, 
Karl 
Berger, 
for 
the 
ini3a3ve 
to 
make 
the 
first 
and...
6 
6 
Recent 
revision 
history 
 Dec 
24, 
2013 
– 
Dra  
sent 
by 
email 
to 
WG2 
– Concern 
about 
Al 
foil 
test 
bei...
About 
the 
origin 
of 
the 
60°C/85% 
RH 
condi/on 
7 
7 
In 
Florida, 
USA 
–600 
V 
Horizontal, 
near 
ocean 
Normalize...
8 
8 
Stress 
levels 
 60°C/85% 
RH 
DH 
–Vsys 
condi/on 
now 
rendered 
less 
stressful 
because 
of 
the 
startup 
chang...
9 
9 
Voltage 
applied 
on 
start, 
then 
combined 
T, 
RH 
Ramps 
(early 
dra  
sequence) 
Leakage current 
spike, if dif...
10 
10 
T 
ramp/dwell 
èRH 
ramp 
èV 
ramp 
(later 
dra  
sequence) 
Short 
spike 
of 
leakage 
current, 
otherwise 
ver...
Ini/al/final 
Pmax 
with 
direct 
glass 
grounding 
11 
11 
M1 8 
M 19 
M 2 0 
M 2 1 
M 22 
250 
200 
150 
100 
50 
0 
/ 
...
12 
12 
Stress 
levels 
 60°C/85% 
RH 
DH 
–Vsys 
condi/on 
now 
rendered 
less 
stressful 
because 
of 
the 
startup 
cha...
13 
13 
Stress 
levels 
 60°C/85% 
RH 
DH 
–Vsys 
condi/on 
now 
rendered 
less 
stressful 
because 
of 
the 
startup 
cha...
14 
14 
Silicon nitride degradation (DH +V bias) 
TTF: 
85°C 
85% 
RH 
+600V 
2000 
h 
ΔP= 
-­‐29% 
rela3ve 
Outdoors, 
sa...
Why 
not 
just 
make 
it 
85°C/85% 
RH 
96 
h 
or 
so? 
Type 
1, 
con3nued, 
with 
control 
15 
15 
In 
Florida, 
USA 
–60...
16 
16 
Recent 
revision 
history 
 Dec 
24, 
2013 
– 
Dra  
sent 
by 
email 
to 
WG2 
– Concern 
about 
Al 
foil 
test 
b...
17 
17
18 
18 
Busan 
WG2 
decisions 
 Foil 
and 
Damp 
heat 
tests 
both 
included 
– Language 
around 
the 
foil 
test 
sta3ng ...
19 
19 
Hereout-­‐ 
 IEC 
62804 
distributed 
as 
TDS 
(82/885/DTS), 
comments 
close 
2014-­‐12-­‐05 
– Editorial 
change...
Peter 
Lechner, 
ZSW 
20 
20 
Some 
thin 
film 
technologies 
show 
coulomb-­‐specific 
accelera3on
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IEC 62804 Status Update

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Busan WG2 decisions
– Changed from standard to technical specification.
– TITLE: TEST METHODS FOR DETECTION OF POTENTIAL-­‐INDUCED DEGRADATION OF
CRYSTALLINE SILICON PHOTOVOLTAIC (PV) MODULES

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IEC 62804 Status Update

  1. 1. IEC 62804 Status Update NREL is a na3onal laboratory of the U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, operated by the Alliance for Sustainable Energy, LLC.
  2. 2. 2 2 Phone Discussions with NC-­‐nominated Experts: Document 82/685/NP Focused discussion during Fall-­‐Winter 2013/2014 Francois Rummens Claudio Licio1 Karl Berger Michael Koehl Yoshihito Deguchi
  3. 3. 3 3 October 2014 (Kyoto) – CD comments received and discussed, major items include: 2nd test type described: Al foil test providing full surface ground electrode applied to glass, proposed by DKE, included per decision at WG2(non-­‐voted) Moving test from pass/fail “qualifica3on test” to descrip3on of how to do the test, without pass/fail criteria (voted) – Title: Test Method for Detec3on of Poten3al Induced Degrada3on of Photovoltaic (PV) Modules (non-­‐voted)
  4. 4. 4 4 CD comment period: some key results – 60°C/85% RH test moved from non equilibrium startup to equilibrium startup Non-­‐equilibrium startup placed excess humidity on sample surface, applying significant stress. – G. Mathiak (TUV Rheinland) confirmed by others. Requested by DKE to move to an equilibrium start-­‐up, significant 12-­‐24 h wait at T/RH stress condi3ons. RH tolerance moved from ± 5% to ± 3%, a five-­‐lab round robin shows this was readily feasible. Temperature tolerance remains at ± 2° C, with a sec3on from references IEC 60068-­‐2-­‐78, Environmental tes3ng -­‐ Part 2-­‐78, included, discussing the precedence of cri3cality of maintaining 3ghter temperature tolerance. In view that “test method” values reproducibility over the specific magnitude of the stress level, the change to equilibrium start-­‐up was made.
  5. 5. 5 5 Damp heat – V profile Thanks to Bengt Jaeckel, Karl Berger, for the ini3a3ve to make the first and second itera3ons of this example profile
  6. 6. 6 6 Recent revision history Dec 24, 2013 – Dra sent by email to WG2 – Concern about Al foil test being Not severe enough Not represen3ng frameless/rear rail modules – Wish for 85°C/85% RH condi3on (reality in China) Increased clarity that equilibrium start-­‐up of damp heat test was less sever than turning on voltage at the beginning of the damp heat cycle. Some more severe
  7. 7. About the origin of the 60°C/85% RH condi/on 7 7 In Florida, USA –600 V Horizontal, near ocean Normalized Power 1.0 0.8 0.6 0.4 0.2 0.0 Type 1, 60° Type 2, 60° 0 50 100 150 200 0 Test Hours 1.000 Normalized Power 0.975 0.950 0.925 0.900 0 2000 4000 6000 8000 t (h) In chamber 85% RH –600 V Type 2, 85° Type 2, 50° Type 1 Type 2 Module Type 1: Acceptable performance in the field survives with less than 5% power drop in chamber with 85% RH, 60°C, rated system voltage, for 96 h Type 1, con3nued, with control 32 months In Florida, USA –600 V Horizontal, near ocean
  8. 8. 8 8 Stress levels 60°C/85% RH DH –Vsys condi/on now rendered less stressful because of the startup change.
  9. 9. 9 9 Voltage applied on start, then combined T, RH Ramps (early dra sequence) Leakage current spike, if different from chamber to chamber could conceivably contribute to poorer reproducibility excess stress Spike in leakage current from excess humidity on module Simultaneous ramp of T, RH, and voltage bias Simultaneous ramp down OK 60°C/85%RH/8 h dwell Also see: G. Mathiak, et.al. TÜV-­‐R 27th EU-­‐PVSEC
  10. 10. 10 10 T ramp/dwell èRH ramp èV ramp (later dra sequence) Short spike of leakage current, otherwise very stable Sequen3al ramp of T, RH, and voltage bias Na3onal Renewable Energy Laboratory Simultaneous ramp down OK 60°C/85%RH/8 h dwell
  11. 11. Ini/al/final Pmax with direct glass grounding 11 11 M1 8 M 19 M 2 0 M 2 1 M 22 250 200 150 100 50 0 / W PM PP before test after test Test condi/ons: 25°C, -­‐1000 V DC, 120 h M18 – perforated foil M19 – water/foil M20 – mat/foil M21 – foil with gaps for some cells M22 – Al plate
  12. 12. 12 12 Stress levels 60°C/85% RH DH –Vsys condi/on now rendered less stressful because of the startup change. I suggested 35% increase in stress, based on leakage current analysis and work of J. Berghold., 60°Cà65°C. – Idea not favored based on 62804 experts feedback 60°C/85% RH already adopted in na3onal documents “Just a minimum basic test, no need to change”
  13. 13. 13 13 Stress levels 60°C/85% RH DH –Vsys condi/on now rendered less stressful because of the startup change. I suggested 35% increase in stress based on work of J. Berghold and leakage current examina/on, 60°Cà65°C. – Idea not favored based on 62804 experts feedback 60°C/85% RH already adopted in na3onal documents “Just a minimum basic test, no need to change” Why not just make it 85°C/85% RH China frequently tes3ng to 85°C/85% RH/96h PI Berlin championed 85°C/85% RH/48 h condi3on Concerns about SiN cell AR coa3ng degrada3on some3mes seen at 85°C/85% RH thought not representa3ve of field failure also happens in the field
  14. 14. 14 14 Silicon nitride degradation (DH +V bias) TTF: 85°C 85% RH +600V 2000 h ΔP= -­‐29% rela3ve Outdoors, same type of module +1500 V bias ~4 y ΔP = -­‐6.8% rela3ve
  15. 15. Why not just make it 85°C/85% RH 96 h or so? Type 1, con3nued, with control 15 15 In Florida, USA –600 V Horizontal, near ocean Normalized Power 1.0 0.8 0.6 0.4 0.2 0.0 1.000 0.900 0.800 0.700 0.600 Type In Florida, USA –600 V Horizontal, near ocean 1, 60° Type 2 Type 2, 60° 0 50 100 150 200 0 Test Hours 1.000 Normalized Power 0.975 0.950 0.925 0.900 0 2000 4000 6000 8000 t (h) 3 Y, now In chamber 85% RH –600 V Type 2, 85° Type 2, 50° Type 1 Type 2 Module Type 1: Acceptable performance in the field degrades to 5%, In just 8 h (non equilibrium start-­‐up) Normalized Power 0.500 Generic Make Type 1 04/2011 07/2011 10/2011 01/2012 04/2012 07/2012 10/2012 01/2013 04/2013 07/2013 10/2013 Date 32 months Module Type 1: conven3onal, PV module made before PID even hit the radar. It does OK in the field Concern: pu6ng 85/85 as the only reference condi3on may needlessly raise cost.
  16. 16. 16 16 Recent revision history Dec 24, 2013 – Dra sent by email to WG2 – Concern about Al foil test being Not severe enough Not represen3ng frameless/rear rail modules – Wish for 85°C/85% RH condi3on (reality in China) Also, increased clarity that equilibrium start-­‐up of damp heat test was less severe than turning on voltage at the beginning of the damp heat cycle. April 8, 2014, Dra sent by email to WG2 – 85°C/60% RH, and 25°C Foil test given as minimum stress levels, alterna3ve higher test temperatures also given per the feedback to the dra$s. – Mr. Deguchi (Japan expert) requested alterna3ve higher test levels be changed to notes. Done. – Discussions and sugges3ons in expert commi5ee about just choosing 1 condi3on each for the test types (Foil, DH), but no jus3fying data provided.
  17. 17. 17 17
  18. 18. 18 18 Busan WG2 decisions Foil and Damp heat tests both included – Language around the foil test sta3ng it does not account for module-­‐level designs intended to mi3gate degrada3on by reducing leakage current pathways to ground. For example, it defeats protec3ons that may be placed in the PV module construc3on to minimize metal contact to the module. – Changed from standard to technical specifica3on. – TITLE : TEST METHODS FOR DETECTION OF POTENTIAL-­‐INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC (PV) MODULES
  19. 19. 19 19 Hereout-­‐ IEC 62804 distributed as TDS (82/885/DTS), comments close 2014-­‐12-­‐05 – Editorial changes Reference IEC 61215 Ed. 2 or Ed. 3? What does the future look like? Needs – Qualifica3on test Need to boil down to one stress level for qualifica3on test Environment –dependence is of interest – Inclusion of thin film in another rev of 62804 First Solar says they are essen3ally in favor of the 62804 document: They are good with it applied to their modules More data is needed to say the stress levels are meaningful with respect to the various technologies and mechanisms
  20. 20. Peter Lechner, ZSW 20 20 Some thin film technologies show coulomb-­‐specific accelera3on

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