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組み合わせテストの歴史(PictMaster勉強会)20080717

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組み合わせテストの歴史(PictMaster勉強会)20080717

  1. 1. 組み合わせテスト技法の歴史1950 1960 1970 1980 85 1990 95 2000 05 (1983 ~ )1984: 直交表 / 組合せ (199x ~ )2004: 直交表 (HAYST 法 (1957: Decision table) 表 ) ~ 1967: Equivalence [ 佐藤 , 下川 ( 富士通 )] [ 富士ゼロックス ] partitioning, Boundary value 1987: ATAF analysis [ 辰巳 ( 富士 通 )] 1998: IPO 2007: FireEye 1970: Cause Effect Graph [Lei, Tai] (IPOG)[Lei, Kuhn] [Elmendorf] (1983 ~ )1985: Orthogonal Latin Squares [R. Mandl] 2000: CTE XL 組み合わせ手法 (198x ~ )1992: OATS [Daimler Chrystler] [Brownlie, Prowse, Phadke] (1990 ~ )1994: 2000: Covering arrays CATS [Williams] [Sherwood] AT&T, Bellcore (1992 ~ )1994: AETG (2000 ~ )2004: PICT [Cohen, et. al] [Microsoft] (1976: テスト要因分 1988: Category-partition method 析) [Ostrand, Balcer] [ 富士通 ] 入力条件分析手法 1993: Classification-tree method [Grochtmann, Grimm] 1 (C) Keizo Tatsumi 2008

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