Porter Marcompresentation


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Porter Marcompresentation

  1. 1. New Approach to Marketing CommunicationsDevelop cost-effective, non-traditional marcom tactics to supportgoals and achieve brand recognition. Communication Vehicles & Skills: • Press releases • Email blasts • External and internal Web • Surveys • Product trainings & • Print mailers seminars • Custom Giveaways • Data sheets • Authored Articles • Blogs • Press relationships • eKnowledge • LCD screens • Logos • Posters • Illustrations • Tradeshows & events • Editing • Social Media tools • Wrtiting • Brochures & catalogues • Graphic Design • Powerpoint presentations • Videos Andy Porter • Jessica Faulkner • Evan Kuhlman
  2. 2. Advertisements & Magazine CoversBE BLOWN AWAY DELIVERING THE INDUSTRY’S BEST RF PERFORMANCE AND FASTEST TIME TO MARKET FOR CURRENT AND NEXT GENERATION DEVICES, TERADYNES ULTRAWAVE™ 12G WIRELESS TEST SOLUTION WILL BLOW YOU AWAY. Featuring intuitive programming and highly interactive debugging, the UltraWave 12G saves time with its embedded industry-standard VSA algorithms and tools, and backgrounded VSA DSP processing. Scalable to 96 universal ports, the UltraWave 12G has industry-leading level accuracy, phase noise and settling time.UltraWave 12G Its measurement performance, ease of use and speed will amaze you. 600 Riverpark Drive North Reading, MA 978.370.2700 www.teradyne.com Copy, illustrations, design
  3. 3. Illustrations: Flash $100 Me Million mo ry T est conductor Test SOC Test emi $3 Billion eS n dya r Te According to Teradyne and Industry Sources Teradyne proudly supports the Boston Food Bank Teradyne Expands Total Available Market Ultrawideband Frequency Plan 128 sub carriers 528 MHz BW Band Group 6 Band Group 1 Band Group 2 Band Group 3 Band Group 4 Band Group 5As a leader in the Automatic Test Equipment industry, we are proud totest the technology that makes catching the game on your TV, computer Carrier 1 Carrier 2 Carrier 3and cell phone possible. 3432 3960 4488 5016 5544 6072 6680 7128 7656 8184 8712 9240 9768 10296 MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz
  4. 4. Logos: 1000 thUltraWave TM System Shipped5 Generation Wireless Test th
  5. 5. Tradeshows, events, & meetings:
  6. 6. Media Relations:PRESS RELEASE 600 Riverpark Drive, North Reading, MA 01864 | p: 978.370.2700 | www.teradyne.com More Than 400 Participants Attend Teradyne’s Device Test Seminars in AsiaNORTH READING, Mass. – December 8, 2008 – Teradyne, Inc. (NYSE: TER) announced more than 400 participants fromapproximately 110 companies attended Teradyne’s Device Test Seminar series in October and November. The technicalseminars, held in China, Japan, Korea and Taiwan, discussed evolving device technologies and also presented Teradyne’sindustry leading solutions addressing these test challenges.“The large number of test engineers and test managers who participated from a broad range of companies demonstrates theimportance of the technologies discussed in these seminars,” said Randy Kramer, manager, Teradynes Factory ApplicationsOrganization. “Teradyne differentiates itself by providing customers with the most advanced test products as well as industry-leading device test expertise. Customers count on our expertise to implement the best test solutions for their devices.”Teradyne’s Factory and Field Applications Engineering teams developed and delivered presentations including testing digital TVdevices with an HDMI port, DDR2/DDR3 memory bus interface tests, DigRF bus testing on next-generation mobile phones, andmicrowave test measurements and wafer probe testing. The seminars provided test engineers with an understanding of teststrategies that provide improved test quality, faster time-to-market and lowest cost of test.About TeradyneTeradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumerelectronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2007, Teradyne had sales of$1.1 billion and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) isa registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc.(including its subsidiaries). ###Editor’s Note: For product photography and other resources, please visit Teradyne’s press room at:http://www.teradyne.com/pressRoom/index.html
  7. 7. Published Articles: Postscript DUMMY MECHANICAL« Back | Print Sign-OffFrom potential energy to value added by test (Guest commentary)Dr. Fang Xu, Teradyne -- Test & Measurement World, 9/19/2007 11:23:00 AM PRINT PROOF Next Generation RFIC & RFSOCRecently, there have been many discussions in the press about how people have changed their perceptions of being an engineer. More and NEW PDFmore young people are reluctant to consider engineering as their lifetime profession, and it seems unlikely that many among those who are REVISED PDFcurrently studying engineering are willing to become future test engineers. Moreover, how many of our talented test-engineering colleagueshave quit the test profession?It is unfortunate that interest in engineering in general and test engineering in particular is diminishing, because test itself has becomeincreasingly challenging and important. In the semiconductor industry, for instance, we predict that the cost of testing an equivalent transistorwill eventually be higher than its manufacturing cost. Test ChallengesIt is my contention that test is at least as important and valuable as any other stage in production. I employ the concept of generalizedpotential to demonstrate that using test to screen scrap from a production line to make the final product is not fundamentally different fromextracting silicon from its dioxide in order to make wafers. They all elevate the potential and add value to the product in the same way. EE This three-part article series written by Ken Harvey from Teradyne focuses on the test cost impactWe have learned in our physics class that if we elevate an object of a mass m from level 0 to a height h using a force of mg, we need to PG. 2 of next generation consumer wireless semiconductors. Ken is responsible for the RF product line architecture at Teradyne. His twenty years of RF/microwave experience includes productengage a certain amount of work: development and business management roles for R&D, manufacturing, and field maintenance applications of commercial and military instrumentation through millimeterwave frequencies. He graduated from the University of Akron with a B.S.E.E. and Santa Clara University with anwhere g is the standard gravity (approximately 9.8 m/s2 at the earths surface). M.B.A. Ken holds two patents in the microwave instrumentation and precision sensor technology.If that object falls to level 0, it can produce work of equivalent energy value. So we say that when this object of a mass m is at height h fromlevel 0, its potential energy is: The first article looks at the structural differences between device generations to suggest the likely impact by using existing RF ATE. The second article examines key performance aspects CIRCLE/RS# of future device generations to assess where instrumentation improvements are most likely to LIT# occur. The third article synthesizes the combined needs and proposes a cost structure and sys-Then we learned that the weight of that object is due to universal attraction between the object and the earth. Surprisingly, the reference todefine the zero of mutual potential energy of that object and the earth is when their distance is infinite. Therefore, the potential energy of that tem-level requirements based on established multisite economic principles. SHOWLINEobject at a distance r from the center of gravity of earth is: I/O CHECK Contact: PROD MGR Ken Harvey, Teradyne, MS 600-2, 600 Riverpark Drive, North Reading, MA 01864, Telephone: 978-370-3670, e-mail: ken.harvey@teradyne.comwhere M is the mass of the earth; G is the gravitational constant, 6.6742 x 10-11m3s-2kg-1.Indeed, this means any object on earth, including us humans, has a negative potential energy according to the definition in physics!The more lessons learned, the more this statement rings true: almost every formula to calculate potential energy in physics starts with anegative sign; electrons around the nuclei; atoms in a crystal; planets around the sun; solar systems in the universe! As electronic engineers,we are all familiar with the electrostatic potential energy: Nelson Publishing 2500 Tamiami Tr N Nokomis, FL 34275 1-800-226-6113 Home Buyers Guides EE Online Magazine Article Archives Product Briefing Editorial Calendar For Advertisers Nelson Publishing Write for EE Industry News Subscribe / Renew Contact EE EE October 2007 Feature Article Next-Generation RF Devices Impact Test by Ken Harvey, Teradyne The past decade’s build-up of RF ATE for second-generation (2G) cellular transceivers now is testing more than two billion RF devices annually (Figure 1). Next-generation consumer wireless devices are © EYEWIRE much more complex due to additional RF pin-count, new standards support, and increased digital pin-counts for RF system on a chip (RFSOC) and RF system in a package (RFSIP) designs. Replacing real values with complex can lead to new ideas Fang Xu Figure 1. Growth in consumer wireless devices The test requirements also are changing to include added modulation N tests and DSP requirements, concurrent test capability, and more ow that we are adults, we may not remember exactly how we learned to count but it multisite testing. Both sets of trends impact costs. probably involved associating numbers with real objects. If we have children and are teaching them to count, we ask them questions like “How many people are there in this New standards for wireless communications are expanding mobile picture?” During school days, children learn about decimals, fractions, and eventually handset capability at a seemingly relentless pace. Just as relentless is the complex numbers before going to college. When the concept of complex numbers was first intro- pace of competitive cost pressure. duced, it served the purpose of accommodating the square root of negative numbers. Rarely has any- one realized the full usefulness of complex numbers; it goes far beyond the initial application. The next generation of wireless semiconductors appears to threaten In instrumentation and measurement, when we measure a voltage, a current, a power, or when cost-reduction objectives. New RF standards tend to require either new we measure acceleration, force, pressure, or temperature, traditionally we dealt only with real num- transmission frequencies or new noninterference capabilities with bers. We used complex numbers only once in a while; for instance, to calculate the impedance of an respect to existing RF signals. But, new RF products maintain RC circuit. Despite the fact that complex numbers were obtained in more sophisticated measure- compatibility with previous standards: Backward compatibility with the ments when Fourier’s analysis was performed, phase information was usually considered as a side installed network enhances the value of both the wireless network and product and ignored in most applications. February 2007 IEEE Instrumentation & Measurement Magazine 29 1094-6969/07/$25.00©2007IEEE Editing, manage publication schedule, pitch to publications, graphics
  8. 8. External Web: Banners, copy, design, editing, images
  9. 9. PowerPoint Presentations:
  10. 10. Posters: BECAUSE TESTING MATTERSB ECAU S E T E ST I N G M AT T E R S The electronics industry challenges Teradyne D Ex employees to develop creative approaches to testing the next big thing...before it is born. Introducing, Teradyne’s Next Generation LCD Here, work is innovative, Driver Test System cross-functional, and — The D750Ex fast-paced with a vision. B E C A U S E T E S T I N G M AT T E R S Gain hands-on experience with today’s most complex technologies. Visit us in our Meeting Suite Second Floor, West Hall Booth 8010 www.teradyne.com/careers
  11. 11. Tradeshows, events, & meetings:
  12. 12. Email blasts: Teradyne Introduces the UltraWave Teradyne’s UltraWave 12G Named Finalist 12G Wireless Test Solution The New D750Ex Test System is designed for testing high- in Test and Measurement World’s definition LCD driver devices. It is based on the highly Best in Test Awards Building on four generations of Teradyne wireless test solutions successful J750 platform, which is approaching 2700 systems and over 30 years of RF test experience, Teradyne introduces the installed worldwide. Test & Measurement World editors have selected UltraWave™ wireless test instrument. the UltraWave 12G test instrument as a finalist for the 2009 Best in Test awards. The winner in The D750Ex system provides a true high density resource per each category will be chosen by a vote of readers UltraWave offers customers 12 GHz source and measurement pin architecture that supports over 97 percent parallel test and editorial staff. Voting deadline is February 6. performance, with greater parallel test efficiency to ultimately efficiency of the overall program. It also features both an lower the cost of test. Combined with the UltraFLEX™ test platform, UltraWave covers the entire spectrum of current and embedded DSP and central DSP architecture to improve VOTE FOR TERADYNE TODAY emerging connectivity and cellular technologies, including wireless processing throughput. And its zero footprint design takes up http://www.tmworld.com/article/CA6619985.html LAN, Bluetooth, 3G cellular, and new emerging standards like 4G 50-85 percent less floor space than competitive systems. cellular and ultrawideband. Teradyne’s wireless device test solutions, including the UltraWave 12G instrument, For more information on D750Ex, click here. cover the entire spectrum of current and emerging connectivity and cellular For more information, click here. technologies, including wireless LAN, Bluetooth®, 3G cellular, 4G cellular, WiMAX™ Teradyne is the top story today on the Semiconductor To read the announcement press release, click here. and ultrawideband. To read the full press release, click here. International web site. See what Rod Stewart, Teradyne’s Teradyne is a leading worldwide supplier of For more information on the UltraWave 12G, visit http://www.teradyne.com/flex/UltraWave.html. general manager of System-On-a-Chip (SOC) test, and Mark automatic test equipment for logic, RF, © 2008 Teradyne, Inc. All rights reserved. Kohalmy, Teradyne’s marketing manager for semiconductor analog, power, mixed- signal, and memory © 2009 Teradyne, Inc. All rights reserved. © 2008 Teradyne, Inc. All rights reserved. technologies. test, had to say about the ATE market. Click here to read the article. AUTOTESTCON 2007 YOUR INVITATION TO JOIN US AT AUTOTESTCON 2007Teradyne is a Join us at Autotestcon 2007 in Baltiimore, Maryland from Youre invited to see the next generation of testleading worldwide September 17 - 20 at the Renaissance Hotel and Baltimore Convention Center. Bring a copy of this e-mail to our booth Teradyne invites you to see the next generation of commercial #445 for a free gift!supplier of Join us for a brief avionics test, featuring: Spectrum CTS presentation followed Teradyne Celebration:automatic test 787 support stretegy by a reception in the second floor Regency Be our guest for a special celebration of tradition and technology. Date: Tuesday, following dinner, September 18 from 8:00 PM to 11: PM Teradynes Spectrum CTSequipment for logic, (Common Test System) and Room on Monday, March 30 from 5-7 Location: Renaissance Hotel, Baltimore Harbor, Maryland Ballroom Why: Prizes and gifts to fortunate winners. 240 OEM-certified test p.m. ComplimentaryRF, analog, power, programs beer, wine and hors d’oeuvres will be served. New Product Demonstrations: Teradyne will demonstrate its Core System Instrumentation (CSi) products, including the Di-Seriesmixed-signal, and New at 2009 AMC: Teradyne, Boeing and other key 787 of high-performance digital test instruments and the Ai-760 high-density analog test instrument. Also on display will be our Spectrum 9100 Test System. Please visit our booth for more detailed suppliers have agreed on a support strategy. Visit Teradyne at Suitememory 2421 each evening during the conference to information and technical demonstrations.technologies. Spectrum CTS replaces the ATS-182a for testing Boeing 737, 747, 757, 767 avionics and features new capability for 737NG, learn more about Spectrum CTS, and for Daily Raffle Prizes Tuesday at 2:00 PM your chance to win a Wednesday at 11:30 AM and 3:00 PM 777 and now the 787 airplanes. Nintendo Wii Fit Game Thursday at 11:30 AM Package, Garmin GPS Drop your business card at either registration desk to enter! © 2008 Teradyne, Inc. All rights reserved. Suite Hours: and other great prizes. IEEE Paper Presentations Monday: 7:00 p.m. - 12:00 a.m. Tuesday: 6:00 p.m. - 12:00 a.m. Wednesday: 5:00 p.m. - 12:00 a.m "Digital Test Program Re-hosting Considerations and Applications" by Eric Truebenbach. Tuesday, Sept 18, 3:15 PM - 5:00 PM, Track D.1 We look forward to seeing you at 2009 AMC! This paper examines simultaneously upgrading digital test instruments and maintaining compatibility with older programs. Specific features are included in a new instrument to minimize or eliminate conversion effort. For more information, call (978) 370-6528 email attila.shevket@teradyne.com "ATML Capabilities Explained" by Teresa Lopes. Wednesday, Sept 19, 8:00 AM - 9:45 PM, Track C.2 or visit www.teradyne.com/AMC This paper describes the major concepts of ATML Capabilities and how they are used to describe instrument performance and capabilities, using simple examples and use casesr. © 2009 Teradyne, Inc. All rights reserved. "Benefits of LRU-centric Fibre Channel Testing" by Yonet Eracar Thursday, Sept 20, 10:00 AM - 11:45 AM, Track D.7 This paper provides a brief overview of the Fibre Channel technology, the Military/Avionics applications, and test requirements. The Paper specifies an LRU-centric Fibre Channel testing framework and provides implementation guidelines using example applications. "Managing Testability" Panel co-hosted by Dean Matsuura Wednesday, Sept 19, 10:00 AM - 11:45 AM, Track D.3., Track C.2 Moderator is Louis Ungar of A.T.E. Solutions, Inc.. Copy, design, management of lists, Web integration