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ALEX de GUZMAN FERRER
Lot 8, Block 8 Rajah Townhomes, Soong, Lapu-lapu City
Cebu, Philippines
Mobile # (+63) 998-9666621
Email: portialex031002@yahoo.com
PROFESSION:
 REGISTERED ELECTRONICS AND COMMUNICATIONS ENGINEER (0019098)
WORK EXPERIENCE:
FAIRCHILD SEMICONDUCTOR PHILIPPINES, INC.
Senior Failure Analysis Engineer
February 2012 to Present
 Lead FA Laboratory Operation for comprehensive analysis of customer returned parts (PQA), NPI,
Assembly & Test fallouts, Qualification and Reliability Monitoring failures
 Spearhead the team on FA projects, new capabilities, and enhancement of FA processes
 Liaise closely the failure analysis results with internal and external customers
 Ensure enhanced FA procedures by failure modes are applied to determine the failure mechanism of
WLCSP, Analog/Logic, MOSFET, Module, and Automotive devices.
 Review and publish FA reports including Destructive Physical Analysis and Construction Analysis in FA
database
 Knowledge on the analysis of WLCSP, Wire bonded (Gold, Copper, and Aluminum), Ribbon, and Clip
bonded parts
 Formulate decision analysis for the procurement of new or additional equipment
VISHAY (PHILIPPINES), INC.
Failure Analysis and Reliability Engineer
February 2001 - February 2011
 Supervise and conduct failure analysis on Analog IC (AIC) and Discrete (MOSFET and JFET) customer
returned parts, reliability monitoring and qualification tests fallouts, and low yield production lots
 Perform reliability monitoring on all Siliconix products
 Conduct qualification testing for new products and packages
 Provide disposition on assembly/process related issues on Analog IC (AIC), Power IC (PIC), and Military
devices
PSI TECHNOLOGIES, INC
Reliability Technician
July 1999 - January 2001
1 of 3
 Perform loading and unloading of units from life and environmental tests for qualification and reliability
monitoring of Siliconix products
 Prepare monthly report and encode data in Reliability monitoring and Quality database.
 Design program cards for burn-in stress test of integrated circuits.
 Troubleshoot and maintains reliability burn-in boards.
SCHOLASTIC RECORD:
1993-1998 LYCEUM-NORTHWESTERN UNIVERSITY
Graduated with the Degree of Bachelor of Science in Electronics and
Communications Engineering
1989.1993 BINMALEY CATHOLIC HIGH SCHOOL
1983.1989 BINMALEY NORTH ELEMENTARY SCHOOL
PERSONAL DATA:
 Born in Binmaley, Pangasinan on July 20, 1977. Fluent in English and Filipino. Familiar with Microsoft Office
tools.
TRAININGS ATTENDED:
 Energy Dispersive X-ray Fluorescence for material analysis in electronic and semiconductor at Days Hotel
Cebu (Phils) – 2015
 Microelectronic Defects, Fault Isolation, & Failure Analysis in IC Packaging at Acacia Hotel Manila (Phils) -
2014
 Noran System Six (NSS) Energy Dispersive X-ray (EDX) training at Madison, Wisconsin (USA) – 2002
KNOWLEDGEABLE IN THE OPERATION AND APPLICATION OF
FAILURE ANALYSIS & RELIABILITY EQUIPMENT:
 Microprober
• Micromanipulator Model 6000 and Model 8860 Probestation
• Cascade Probestation
 Low and High Power Microscopes
• Olympus SZ61 LPM
• Olympus BX51M, STM6, MX61L HPM
• Nikon LV50 HPM
• Olympus LEXTOLS3100 Laser Microscope
 Decapsulation System
2 of 3
• D Cap d2i Auto Decapsulator
• Decaptech LD-10 Laser Decapper
 Mechanical Decapper for Metal Cans
 Liquid Crystal Analysis / Hotspot Detection
 Dry Etching Using Reactive Ion Etcher
• March Jupiter III RIE
• NSC ES301 RIE
 Polisher / Grinder for Metallography or Cross-sectioning Analysis
• Leco Spectrum System 2000
• Allied Multiprep system
 Scanning Electron Microscope / Energy dispersive X-ray Spectroscopy
• Hitachi S-570/S-3000N SEM with EDX (Kevex/Noran System Six)
• JEOL 5410LV / 6510LV SEM with EDX (Oxford Inca)
 Tektronix 576/370A/371A/371B Curve Tracers
 Precision Semiconductor Parameter Analyzer
• Agilent 4156B
• Keithley 4200
 Misonix Aura-250E Ductless Fume Hood
 Scanning Acoustic Microscopy (SAM)
• Sonoscan D9000
• Sonix Fusion
 X-ray System
• Glenbrook / Softex / Cougar Finefocus
 Perkin Elmer Spectrum 100 and Spotlight 200 Fourier Transform Infrared System
 Finetech Pico Rework/Reball Station
 Jarvis burn-in oven with system monitoring panel / APOEM Oven
 ESPEC HAST system TPC-422M
 Tabai Pressure Cooker TPC-211
 Emitech K550 Gold Ion Sputter / Coater
 Dima SMT Systems Reflow
 Cincinnati Sub-Zero (CSZ) Temperature Cycle
CHARACTER REFERENCES: (Available Upon Request)
3 of 3

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Resume_ALEX DGF

  • 1. ALEX de GUZMAN FERRER Lot 8, Block 8 Rajah Townhomes, Soong, Lapu-lapu City Cebu, Philippines Mobile # (+63) 998-9666621 Email: portialex031002@yahoo.com PROFESSION:  REGISTERED ELECTRONICS AND COMMUNICATIONS ENGINEER (0019098) WORK EXPERIENCE: FAIRCHILD SEMICONDUCTOR PHILIPPINES, INC. Senior Failure Analysis Engineer February 2012 to Present  Lead FA Laboratory Operation for comprehensive analysis of customer returned parts (PQA), NPI, Assembly & Test fallouts, Qualification and Reliability Monitoring failures  Spearhead the team on FA projects, new capabilities, and enhancement of FA processes  Liaise closely the failure analysis results with internal and external customers  Ensure enhanced FA procedures by failure modes are applied to determine the failure mechanism of WLCSP, Analog/Logic, MOSFET, Module, and Automotive devices.  Review and publish FA reports including Destructive Physical Analysis and Construction Analysis in FA database  Knowledge on the analysis of WLCSP, Wire bonded (Gold, Copper, and Aluminum), Ribbon, and Clip bonded parts  Formulate decision analysis for the procurement of new or additional equipment VISHAY (PHILIPPINES), INC. Failure Analysis and Reliability Engineer February 2001 - February 2011  Supervise and conduct failure analysis on Analog IC (AIC) and Discrete (MOSFET and JFET) customer returned parts, reliability monitoring and qualification tests fallouts, and low yield production lots  Perform reliability monitoring on all Siliconix products  Conduct qualification testing for new products and packages  Provide disposition on assembly/process related issues on Analog IC (AIC), Power IC (PIC), and Military devices PSI TECHNOLOGIES, INC Reliability Technician July 1999 - January 2001 1 of 3
  • 2.  Perform loading and unloading of units from life and environmental tests for qualification and reliability monitoring of Siliconix products  Prepare monthly report and encode data in Reliability monitoring and Quality database.  Design program cards for burn-in stress test of integrated circuits.  Troubleshoot and maintains reliability burn-in boards. SCHOLASTIC RECORD: 1993-1998 LYCEUM-NORTHWESTERN UNIVERSITY Graduated with the Degree of Bachelor of Science in Electronics and Communications Engineering 1989.1993 BINMALEY CATHOLIC HIGH SCHOOL 1983.1989 BINMALEY NORTH ELEMENTARY SCHOOL PERSONAL DATA:  Born in Binmaley, Pangasinan on July 20, 1977. Fluent in English and Filipino. Familiar with Microsoft Office tools. TRAININGS ATTENDED:  Energy Dispersive X-ray Fluorescence for material analysis in electronic and semiconductor at Days Hotel Cebu (Phils) – 2015  Microelectronic Defects, Fault Isolation, & Failure Analysis in IC Packaging at Acacia Hotel Manila (Phils) - 2014  Noran System Six (NSS) Energy Dispersive X-ray (EDX) training at Madison, Wisconsin (USA) – 2002 KNOWLEDGEABLE IN THE OPERATION AND APPLICATION OF FAILURE ANALYSIS & RELIABILITY EQUIPMENT:  Microprober • Micromanipulator Model 6000 and Model 8860 Probestation • Cascade Probestation  Low and High Power Microscopes • Olympus SZ61 LPM • Olympus BX51M, STM6, MX61L HPM • Nikon LV50 HPM • Olympus LEXTOLS3100 Laser Microscope  Decapsulation System 2 of 3
  • 3. • D Cap d2i Auto Decapsulator • Decaptech LD-10 Laser Decapper  Mechanical Decapper for Metal Cans  Liquid Crystal Analysis / Hotspot Detection  Dry Etching Using Reactive Ion Etcher • March Jupiter III RIE • NSC ES301 RIE  Polisher / Grinder for Metallography or Cross-sectioning Analysis • Leco Spectrum System 2000 • Allied Multiprep system  Scanning Electron Microscope / Energy dispersive X-ray Spectroscopy • Hitachi S-570/S-3000N SEM with EDX (Kevex/Noran System Six) • JEOL 5410LV / 6510LV SEM with EDX (Oxford Inca)  Tektronix 576/370A/371A/371B Curve Tracers  Precision Semiconductor Parameter Analyzer • Agilent 4156B • Keithley 4200  Misonix Aura-250E Ductless Fume Hood  Scanning Acoustic Microscopy (SAM) • Sonoscan D9000 • Sonix Fusion  X-ray System • Glenbrook / Softex / Cougar Finefocus  Perkin Elmer Spectrum 100 and Spotlight 200 Fourier Transform Infrared System  Finetech Pico Rework/Reball Station  Jarvis burn-in oven with system monitoring panel / APOEM Oven  ESPEC HAST system TPC-422M  Tabai Pressure Cooker TPC-211  Emitech K550 Gold Ion Sputter / Coater  Dima SMT Systems Reflow  Cincinnati Sub-Zero (CSZ) Temperature Cycle CHARACTER REFERENCES: (Available Upon Request) 3 of 3