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Leakage Power Power Reduction Techniques in VLSI Circuits by Vivek Maheshwari
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Leakage Power Power Reduction Techniques in VLSI Circuits by Vivek Maheshwari

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Leakage Power Power Reduction Techniques in VLSI Circuits by Vivek Maheshwari Presentation Transcript

  • 1. “LEAKAGE POWER REDUCTION TECHNIQUES IN CMOS VLSI CIRCUITS” By: Name: VIVEK MAHESHWARI Branch: M.Tech (M.E.T.) Enrl. No.: 12305161
  • 2. OUTLINE  Effect of Leakage Power in IC Industry  Types of Leakages  Modes of operation  Controlling techniques Reduction Of Switched Capacitance Conclusions  References
  • 3. EFFECT OF LEAKAGE POWER IN IC INDUSTRY  With the rapid progress in semiconductor technology, chip density and operation frequency have increased, making the power consumption in battery-operated portable devices a major concern.  High power consumption reduces the battery service life. The goal of low-power design for battery-powered devices is thus to extend the battery service life while meeting performance requirements.  With the advent of battery operated devices and scaling trends in deep submicron (DSM) regime, leakage power is becoming large component of total power dissipation.
  • 4.  Reports indicate that 40% or even higher percentage of the total power consumption is due to the leakage of transistors for the recent CMOS feature sizes (e.g., 90nm and 65nm).  The combination of higher clock speeds, greater functional integration, and smaller process geometries has contributed to significant growth in power density.
  • 5. SOURCES OF LEAKAGE POWER Dynamic power disspation is given by, Pd =C. V2.f There are four main sources of leakage current in a CMOS transistor (see Figure 1):     Reverse-biased junction leakage current (IREV) Gate induced drain leakage (IGIDL) Gate direct-tunneling leakage (IG) Sub threshold (weak inversion) leakage (ISUB)
  • 6. The JUNCTION LEAKAGE occurs from the source or drain to the substrate through the reverse biased diodes when a transistor is OFF. A reversebiased pn junction leakage has two main components:  minority carrier diffusion/drift near the edge of the depletion region;  due to electron-hole pair generation in the depletion region of the reversebiased junction. For instance, in the case of an inverter with low input voltage, the NMOS is OFF, the PMOS is ON, and the output voltage is high. Subsequently, the drain-to-substrate voltage of the OFF NMOS transistor is equal to the supply voltage. This results in a leakage current from the drain to the substrate through the reverse-biased diode. The magnitude of the diode’s leakage current depends on the area of the drain diffusion and the leakage current density, which is in turn determined by the doping concentration.
  • 7. The GATE INDUCED DRAIN LEAKAGE (GIDL) is caused by high field effect in the drain junction of MOS transistors. For an NMOS transistor with grounded gate and drain potential at VDD, significant band bending in the drain allows electron-hole pair generation through avalanche multiplication and band-to-band tunneling. A deep depletion condition is created since the holes are rapidly swept out to the substrate. At the same time, electrons are collected by the drain, resulting in GIDL current. This leakage mechanism is made worse by high drain to body voltage and high drain to gate voltage. Transistor scaling has led to increasingly steep halo implants, where the substrate doping at the junction interfaces is increased (cf. Figure 1), while the channel doping is low. This is done mainly to control punch-through and drain-induced barrier lowering while having a low impact on the carrier mobility in the channel.
  • 8.  The GATE LEAKAGE flows from the gate through the ―leaky‖ oxide insulation to the substrate. b) In oxide layers thicker than 3–4 nm, this kind of current results from the Fowler-Nordheim tunneling of electrons. For lower oxide thicknesses (which are typically 0.15µm and lower technology nodes), however, direct tunneling through the silicon oxide layer is the leading effect.  Mechanisms for direct tunneling include electron tunneling in the conduction a) band (ECB)(most dominant), electron tunneling in the valence band (EVB), and hole tunneling in the valence band (HVB). The magnitude of the gate direct tunneling current increases exponentially with the gate oxide thickness Tox and supply voltage VDD.  As transistor length and supply voltage are scaled down, gate oxide thickness must also be reduced to maintain effective gate control over the channel region. Unfortunately this results in an exponential increase in the gate leakage due to direct tunneling of electrons through the gate oxide.
  • 9. SUBTHRESHOLD LEAKAGE CURRENTS  When gate voltage is lower than the threshold voltage and there is a voltage applied between drain and source of a MOS transistor, a diffusion current appears due to the different carrier concentrations at the inversion layer in source and drain terminals. This current depends exponentially on gate-tosource voltage VGS and drain-to-source voltage V through the carrier concentrations.  For an NMOS transistor, the subthreshold current is given by, where, µN is the electron carrier mobility, Cox is the gate capacitance per unit area, WN is the channel width, LN is the channel length, Vt is the thermal voltage, and VTH is the threshold voltage.
  • 10. The inverse slope of the subthreshold current n is given by, where C is the depletion channel region capacitance per unit area. The subthreshold parameter n is related to the subthreshold swing S — the gate voltage change needed to raise the subthreshold current by one decade:
  • 11. Putting It All Together Let IOFF denote the leakage of an OFF transistor (V =0V) for an NMOS device. From the above discussion, we know that Clearly, IREV and IGIDL are maximized when VDB = VDD. Similarly, for short-channel devices, ISUB increases with VDB because of the DIBL effect. Note the IG is not a component of the OFF current, since the transistor gate must be at a high potential with respect to the source and substrate for this current to flow. Among the three components of IOFF, ISUB is clearly the dominant component.
  • 12. MODES OF OPERATION On the basis of operation, the circuit blocks can be of following types:  Active mode The circuit block is said to be in active mode if it is operational and its input pattern could not be controlled  Stand-By mode A circuit is in standby, if it is not in operation of the complete logic circuit, for some span of time.
  • 13. Previous low-power techniques are primarily target reducing leakage power consumption of CMOS circuits. Each prior technique reduces leakage dramatically as well as some delay and area penalty. By concluding, the previous technique, leakage is categorized into two different factors: (i) State-saving technique (ii) State destructive technique. State savings techniques preserve the generic logic state in both active and sleep mode, but state destructive technique save the state in active mode, but lose the state in sleep mode. So, state destructive technique had long wake up time while preserving the logic state.
  • 14. CONTROLLING TECHNIQUES  USING SLEEP TRANSISTORS: The most common technique for semiconductor leakage reduction: Sleepy stack Sleepy keeper Dual sleep Dual threshold transistor stacking
  • 15. SLEEPY STACK APPROACH: It is the combined structure of sleep transistor and forced stack method. In this method two transistors is stacking with the inverter circuit and two sleep transistors are parallel with the inverter circuit in both pull-up and pull-down network. This approach works in two mode, in active mode when S=1, S’=0, two sleep transistor is ON and if in=0 asserted, two PMOS transistors is ON pull-up network. So, there is high internal resistance in between the pull-up network which suppressed the leakages the dramatically. But this approaches had an area and propagation delay penalty.
  • 16. SLEEPY KEEPER APPROACH In sleepy keeper technique ,two sleep transistors are parallel in both pull-up and pull-down network. These two extra sleep transistors are used to save the logic state. The leakage reduction of this method is similarly like as the sleep transistors technique. During the sleep mode two extra transistors are turned ON to saving the logic state. So this is obvious technique. state saving
  • 17. In DUAL SLEEP METHODS, two sleep transistors are parallel similarly as in sleepy keeper. In both active and inactive mode two sleep transistors is always ON in both pull-up and pull-down network. So, output has an always connectivity with the Gnd and Vdd. This is obvious state savings technique. This method has excellent trade-offs between power, delay and area.
  • 18. In DUAL THRESHOLD TRANSISTOR STACKING TECHNIQUE, the body of one transistor is connected with the other body of transistors. So, when one transistor is ON the threshold of another body connected transistors is also changed. That does actually reduce the sub-threshold leakage while maintaining the dual Vth. But this method increases propagation delay and area.
  • 19. COMBINATIONS: This technique is actual modification of two prior technique namely sleepy keeper approach and dual sleep method. Here two sleep transistors (M1 & M5) is parallel in both pull-up and pull down network with two extra transistors(M2 & M6). This two extra transistors (M2 & M6) is used for saving state because in both active and sleep mode M2 and M6 transistors are helps the novel circuit to make contact with output and ground. In this architecture same aspect ratio w/l=1 is maintained in both pull-up and pull- down network and aspect ratio w/l=6 and w/l=3 is maintained respectively in inverter circuit (M3 & M4).
  • 20. The main feature of this technique is that, M2 transistor is connected with the power rails and M6 transistor is connected with the Gnd. So, in active mode pull-up NMOS M2 transistor is always ON and Inactive mode pull-down PMOS M6 transistors is always ON. So, in both active and inactive modes, output always have connectivity with the Vdd and Gnd, for that reason, this novel technique name is Common Vdd And Gnd. During active mode, S=1 and S’=0 are asserted, and all sleep transistors (M1 & M5) are turned ON. Due to the added sleep transistor, the resistance Increases, and the propagation delay decreases and then this novel technique reduce leakages like prior forced stack and sleep transistors technique. Moreover, M1 and M3 transistors are ON, the internal resistance is increases and which reduced the leakage dramatically.
  • 21. REVERSE BODY BIASING (RBB) TECHNIQUE The reverse body biasing (RBB) technique increases the threshold voltage (Vth) of transistors during standby mode.
  • 22. Figure shows the leakage current (Ileakage) components under the reverse body-bias condition. The total leakage current in the OFF-state n-MOSFET is given by, where, and
  • 23. MULTIPLE THRESHOLD CELLS The high threshold transistors can suppress the subthreshold leakage current, while the low threshold transistors are used to achieve the high performance. There are four classes of dual VTh designs based on how low and high threshold voltage transistors are mixed within a logic cell : Class 1: Using the same type of transistors (i.e., low threshold or high threshold) in a logic cell. Class 2: Using the same type of transistors in a pull up or pull down network. Class 3: Using the same type of transistors in a stack of transistors. Class 4: Mixing transistors freely.
  • 24. In MTCMOS technique, a high-threshold voltage transistor is inserted in series with the power supply and the existing design and ground. In fact, only one type (either PMOS or NMOS) of high VTH transistor is sufficient for leakage reduction. When in active mode, sleep transistors are turned ON, while in standby mode sleep transistors are turned OFF by applying appropriate voltage levels in the power gated mode, and large inserted MOSFET increase area and delay. These high threshold sleep transistors act as a current gate to the low threshold designed circuit, so this technique is also referred as Power Gating. Inserting additional sleep transistor(s) has an adverse effect on the circuit delay. Therefore, sizing sleep transistors is an important design consideration. The drain current (IDS) flowing through the NMOS sleep transistor
  • 25. LONG CHANNEL DEVICES Active leakage of CMOS gates can be reduced by increasing their transistor channel lengths . This is because there is a V roll-off due to the Short Channel Effect (SCE). Therefore, different threshold voltages can be achieved by using different channel lengths. In such technologies, it is non-trivial to control threshold voltages by using multiple channel lengths. The longer transistor lengths used to achieve high threshold transistors tend to increase the gate capacitance, which has a negative impact on the performance and dynamic power dissipation.
  • 26. REDUCTION OF SWITCHED CAPACITANCE  System-level Measures  Circuit-level Measures  Mask-level Measures
  • 27. CONCLUSIONS We reviewed various sources of leakage current in CMOS integrated circuits and described a number of proven circuit optimizations for controlling the OFF current of CMOS circuits in both standby and active modes of circuit operation. In way of enumerating some of the design conclusions & challenges that lie ahead, are mentioned in the following:  Need robust subthreshold leakage control techniques that do not adversely affect the circuit performance and layout cost.  Develop physical design tools that support multiple voltages on the chip, MTCMOS, and adaptive supply voltage and/or body biasing.  Consider power plane integrity in light of sleep transistor insertions, accounting for both DC voltage drop during the active mode, and ground bounce during the wakeup transition from sleep mode.  Develop RT-level design flows and tools that allow early evaluation and insertion of power gating structures and other leakage reduction mechanisms.
  • 28. REFERENCES:       MOSFET MODELING FOR CIRCUIT ANALYSIS AND DESIGN by Galup-Montoro and Schneider Low-Power CMOS Circuits Technology, Logic Design and CAD Tools by Christian Piguet Low-Power Digital VLSI Design by Mohamed Elmasry Standby and Active Leakage Current Control and Minimization in CMOS VLSI Circuits by Farzan Fallah & Massoud Pedram (IEICEleakage-review-journal) Standby Leakage Power Reduction Technique forNanoscale CMOS VLSI Systems by HeungJun Jeon, Yong-Bin Kim, and Minsu Choi (Senior Member, IEEE) Analysis of Leakage Power Reduction Techniques in Digital Circuits by Anup Jalan and Mamta Khosla