RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs.]]>

RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs.]]>

The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters ]]>

The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters ]]>

A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function]]>

A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function]]>

Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process]]>

Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process]]>

Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient]]>

Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient]]>

This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes]]>

This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes]]>

Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them.]]>

Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them.]]>

Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle]]>

Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle]]>

Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use]]>

Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use]]>

Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system]]>

Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system]]>

This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST)]]>

This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST)]]>

This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers’ requirements. ]]>

This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers’ requirements. ]]>

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