Biased Reflectometry (International Zurich Congress On Emc September 2007)

309 views
268 views

Published on

A method for building up signal/power integrity models of active devices is presented in this papaper. The method is based on TDR measures taken at varying operating points of the device.

Published in: Technology, Business
0 Comments
0 Likes
Statistics
Notes
  • Be the first to comment

  • Be the first to like this

No Downloads
Views
Total views
309
On SlideShare
0
From Embeds
0
Number of Embeds
5
Actions
Shares
0
Downloads
6
Comments
0
Likes
0
Embeds 0
No embeds

No notes for slide

×