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Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
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Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"

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  • 1. 1886<br />Saint Petersburg Electrotechnical University "LETI "<br />TEP Conference presentation<br />Theme: «Resonance Method of Measuring a Stuff Dielectric<br />Properties at Microwave Frequencies»<br />Student: Dvortsov A. V.<br />Managers: Medvedeva N. Y.<br />Mikerov A. G.<br />
  • 2. The purpose of the work: <br />Investigation of the resonance method of measuring the dielectric properties of materials at microwave frequencies, which includes:<br />methodology for calculating the dielectric constant, quality factor and loss tangent of the samples of materials<br />calculation error of method<br />using this method to study the degradation phenomena in packages of integrated circuits and dielectric materials.<br />Dvortsov A. V., 6202<br />2<br />
  • 3. Test bench<br />Measured parameters:<br />-resonant frequency,<br />-transfer coefficient<br />(S21-parameter)<br />Vector Network Analyzer Rohde&Schwarz ZVA-40<br />Characteristics of the vector network analyzer Rohde&SchwarzZVA-40:<br />Operating frequency range:10 MHz-40 GHz<br />The sensitivity of the frequency -0,5 Hz<br />Sensitivity of the transfer -0,01 dB<br />-no sample<br />- pattern<br />S21, dB<br />0<br />-50<br />-100<br />-150<br />-200<br />1<br />2<br />3<br />1.5<br />2.5<br />GHz<br />Coaxial Resonator<br />Dvortsov A. V., 6202<br />3<br />
  • 4. Microwave input<br />L<br />b<br />a<br />Microwave input<br />Sample<br />Mobile terminal<br />Movable sample holder<br />Design scheme of the resonator<br />L = 100 mm<br />a = 10 mm<br />b = 20 mm<br />The equivalent circuit of the resonator:<br /><ul><li> impedance of the capacitor С</li></ul>at a frequency ω<br />- input resistance of short-line<br />- impedance of the coaxial line<br />Resonance condition:<br />- wave number<br />Dvortsov A. V., 6202<br />4<br />
  • 5. Calculation formulas<br />Capacity of the measured sample<br />Capacity of a flat capacitor<br />Permittivity<br />Q-factor of empty resonator and resonator with the sample :<br />Q-factor of the sample :<br />Loss tangent <br />Dvortsov A. V., 6202<br />5<br />
  • 6. Treatment of experimental results<br />Sample under investigation<br />Measurement error was calculated :<br />- for the resonant frequency<br />- for the capacity<br />- for permittivity<br />The dependence of the dielectric constant of the sample frequency<br />The calculation results of ε<br />Dvortsov A. V., 6202<br />6<br />
  • 7. Results of the research<br />baseline<br />baseline after exposure to moisture<br />aged<br />aged after exposure <br />to moisture<br />aged<br />0<br />1<br />2<br />3<br />4<br />5<br />6<br />f, <br />baseline<br />baseline<br />8<br />8<br />4<br />fresh _dry<br />baseline after exposure to moisture<br />fresh _ moistened<br />7<br />EMC_dry<br />7<br />aged _dry<br />EMC _ moistened<br />3<br />6<br />6<br />aged _ moistened <br />C, pF<br />5<br />5<br />2<br />4<br />4<br />3<br />3<br />1<br />0<br />1<br />2<br />3<br />4<br />5<br />6<br />0<br />1<br />2<br />3<br />4<br />5<br />0<br />1<br />2<br />3<br />4<br />5<br />f, GHz<br />f, GHz<br />f, <br />Corps of Integrated Circuits<br />Epoxy Compound<br />ε<br />7<br />Dvortsov A. V., 6202<br />
  • 8. Conclusion<br /><ul><li>A method for measuring permittivity materials at microwave frequencies (UHF), based on the dependence of the resonance frequency of bulk coaxial microwave cavity of the electrical parameters embedded in the cavity of the samples of the materials.
  • 9. Calculated measurement error.
  • 10. The calculation of the dielectric constant epoxy compound and determined its dependence on frequency.
  • 11. Evaluated the possibility of applying the method to assess the degradation phenomena in packages of integrated circuits and dielectric materials.</li></ul>Studies have shown that the investigated method is accurate, reliable and informative.<br />8<br />Dvortsov A. V., 6202<br />
  • 12. Thankyou for your attention!<br />Dvortsov A. V., 6202<br />9<br />

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