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Are you working to optimize the performance of your MEMS device? Learn how Polytec's latest technology is used for characterization MEMS devices in cutting edge applications. Our tools for analysis and visualization of structural vibrations of MEMS feature laser vibrometry for measurement of out-of-plane motion with resolution down to picometers and bandwidth out to MHz. Scanning measurements provide full-field mapping and 3D visualization of deflection shapes. By adding stroboscopic video microscopy, we are able to extend our measurement capability to the in-plane direction for complete 3D motion analysis. We present several real-world application studies where our tools have been instrumental in the design and development of MEMS. We invite you to join this web presentation to find out what Polytec can do for you.