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IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b
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IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b

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Probe Card Cost Drivers from Architecture to Zero Defects - IEEE Semiconductor Wafer Test Workshop 2011 presentation by Ira Feldman (www.hightechbizdev.com)

Probe Card Cost Drivers from Architecture to Zero Defects - IEEE Semiconductor Wafer Test Workshop 2011 presentation by Ira Feldman (www.hightechbizdev.com)

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  • 1. June 12 to 15, 2011 San Diego, CA Probe Card Cost Drivers from  Architecture to Zero Defects Ira Feldman Feldman Engineering Corp. Overview• Cost, Price, & Cost Drivers• Serial Processing – Drilling Example• NRE• Advanced Process Technology• Profitless Prosperity• Cost Savings• Summary Note: price/cost examples are approximate and from multiple vendors not necessarily those identified or shown. June 12 to 15, 2011 IEEE SW Test Workshop 2 1
  • 2. PriceValue Cost Gross Profit = Price – Cost Gross Margin = Gross Profit / Price June 12 to 15, 2011 IEEE SW Test Workshop 3 Vertical Probe Head Printed Circuit Board BGA (Solder Attach) Space Transformer UpperGuide Plate Spacer LowerGuide PlateMicroProbe Apollo Probes June 12 to 15, 2011 IEEE SW Test Workshop 4 2
  • 3. Machine Shop Cost Drivers Programming Material Setup Time Run Time Inspection Yield June 12 to 15, 2011 IEEE SW Test Workshop 5Don’t bother… “Ferrari” June 12 to 15, 2011 IEEE SW Test Workshop 6 3
  • 4. Machine Cost $300,000  Machine Cost Annual Maintenance 7% 25% utilization $31.44  /hr Useful Life 7 years 85% utilization $9.25  /hr Total Cost $447,000  Facilities Annual Cost $35,000  Tooling per hole $          0.05  Total Annual Cost $68,857 Don’t bother… “Ferrari” June 12 to 15, 2011 IEEE SW Test Workshop 7 Make vs. Buy Utilization Lead Time Quality Fixed vs. Variable Cost Cost (Make) vs. Price (Buy) June 12 to 15, 2011 IEEE SW Test Workshop 8 4
  • 5. Non Recurring Engineering Expense Architecture Design Tester Customer R&D NRE NRE NRE Design Input X X Probes ? Guide Plates XSpace Transformer X Interposer ? PCB Design X (External?) X ? PCB Fab External ? ? Mechanical M h i l H/W ? X ? Electronics Metrology Packaging NRE ? X ? X X ? ? ?June 12 to 15, 2011 IEEE SW Test Workshop 9 Outgoing MetrologyJune 12 to 15, 2011 IEEE SW Test Workshop 10 5
  • 6. ISC Interposers Spring Pin Elastomeric Molded Frame NRE $.5 - 1 K $2 - 3 K $20 - 30 KSmall Area $ / contact $1 - 10 $.50 60 $ 50 - .60 < $.20 - .40 $ 20 40 Large Area NRE $10 - 15 K $100 - 150 K(1/4 wafer +) $ / contact $.40 - . 50 < $.10 - .20 www.ksdk.co.jp ISC InterCon Systems June 12 to 15, 2011 IEEE SW Test Workshop 11 Space Transformers Sequential Punch Material & Processing June 12 to 15, 2011 IEEE SW Test Workshop 12 6
  • 7. Advanced Process Technology Cost Drivers Process Steps Masks Substrates Material Active Area Yield Defect Density Layers Equipment Rework / Repair June 12 to 15, 2011 IEEE SW Test Workshop 13Whitespace Design 1 Design 2 Design 1 Design 2 FormFactor Harmony XP June 12 to 15, 2011 IEEE SW Test Workshop 14 7
  • 8. Solution FormFactor Smart Matrix June 12 to 15, 2011 IEEE SW Test Workshop 15 FORM – 9 years; MJC – 5 years; JEM- 5 years; VRGY - 7 years June 12 to 15, 2011 IEEE SW Test Workshop 16 8
  • 9. Costs Savings STANDARDS Input Data Formats Probe Depth Testhead Configurations Specifications June 12 to 15, 2011 IEEE SW Test Workshop 17 Summary• Understand true cost of architectures – Beware of NRE – New architectures needed for cost reductions• Maintain sufficient Gross Margin – Company health – Funding for R&D• Honest supplier – customer partnerships June 12 to 15, 2011 IEEE SW Test Workshop 18 9
  • 10. Acknowledgments• Amphenol InterCon Systems• BucklingBeam• FormFactor• ISC• Kern• Robin McAdams• MicroProbe• Sergio Perez• SV Probe• Frank Swiatowiec June 12 to 15, 2011 IEEE SW Test Workshop 19 Thank You! Ira Feldman ira@feldmanengineering.com Visit my blog www.hightechbizdev.com www.hightechbi dev.com for my summary of SWTW  June 12 to 15, 2011 IEEE SW Test Workshop 20 10

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