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IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
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IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621

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Ira Feldman's presentation about cost drivers for the design and fabrication of semiconductor wafer test probe cards. Presented at the IEEE Semiconductor Wafer Test Workshop, June 2011.

Ira Feldman's presentation about cost drivers for the design and fabrication of semiconductor wafer test probe cards. Presented at the IEEE Semiconductor Wafer Test Workshop, June 2011.

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  • 1. June 12 to 15, 2011 San Diego, CAProbe  Card  Cost  Drivers  from   Architecture  to  Zero  Defects   Ira  Feldman   Feldman  Engineering  Corp.  
  • 2. Overview  •  Cost,  Price,  &  Cost  Drivers  •  Serial  Processing  –  Drilling  Example  •  NRE  •  Advanced  Process  Technology  •  Profitless  Prosperity  •  Cost  Savings  •  Summary   Note: price/cost examples are approximate and from multiple vendors not necessarily those identified or shown. June 12 to 15, 2011 IEEE SW Test Workshop 2
  • 3. PriceValue Cost Gross Profit = Price – Cost Gross Margin = Gross Profit / Price June 12 to 15, 2011 IEEE SW Test Workshop 3
  • 4. Vertical Probe Head Printed Circuit Board BGA (Solder Attach) Space Transformer UpperGuide Plate Spacer LowerGuide PlateMicroProbe Apollo Probes June 12 to 15, 2011 IEEE SW Test Workshop 4
  • 5. Machine Shop Cost Drivers   Programming Material Setup Time Run Time Inspection YieldJune 12 to 15, 2011 IEEE SW Test Workshop 5
  • 6. Don’t bother… “Ferrari” June 12 to 15, 2011 IEEE SW Test Workshop 6
  • 7. Machine  Cost   $300,000     Machine  Cost       Annual  Maintenance   7%   25%  uElizaEon   $31.44    /hr   Useful  Life   7  years   85%  uElizaEon   $9.25    /hr   Total  Cost   $447,000           FaciliEes  Annual  Cost   $35,000     Tooling  per  hole    $                    0.05     Total  Annual  Cost   $68,857    Don’t bother… “Ferrari” June 12 to 15, 2011 IEEE SW Test Workshop 7
  • 8. Make vs. Buy Utilization Lead Time Quality Fixed vs. Variable Cost Cost (Make) vs. Price (Buy)June 12 to 15, 2011 IEEE SW Test Workshop 8
  • 9. Non Recurring Engineering Expense Architecture Design Tester Customer R&D NRE NRE NRE Design Input X X Probes ? Guide Plates XSpace Transformer X Interposer ? PCB Design X (External?) X ? PCB Fab External ? ? Mechanical H/W ? X ? Electronics Metrology Packaging NRE ? X ? X X ? ? ?June 12 to 15, 2011 IEEE SW Test Workshop 9
  • 10. Outgoing MetrologyJune 12 to 15, 2011 IEEE SW Test Workshop 10
  • 11. ISC Interposers Spring Pin Elastomeric Molded Frame NRE $.5 - 1 K $2 - 3 K $20 - 30 KSmall Area $ / contact $1 - 10 $.50 - .60 < $.20 - .40 Large Area NRE $10 - 15 K $100 - 150 K(1/4 wafer +) $ / contact $.40 - . 50 < $.10 - .20 www.ksdk.co.jp ISC InterCon Systems June 12 to 15, 2011 IEEE SW Test Workshop 11
  • 12. Space Transformers Sequential Punch Material & ProcessingJune 12 to 15, 2011 IEEE SW Test Workshop 12
  • 13. Advanced Process Technology Cost Drivers Process Steps Masks Substrates Material Active Area Yield Defect Density Layers Equipment Rework / Repair June 12 to 15, 2011 IEEE SW Test Workshop 13
  • 14. Whitespace Design 1 Design 2 Design 1 Design 2 FormFactor Harmony XP June 12 to 15, 2011 IEEE SW Test Workshop 14
  • 15. Solution FormFactor Smart Matrix June 12 to 15, 2011 IEEE SW Test Workshop 15
  • 16. June 12 to 15, 2011IEEE SW Test Workshop16 FORM – 9 years; MJC – 5 years; JEM- 5 years; VRGY - 7 years
  • 17. Costs Savings STANDARDS Input Data Formats Probe Depth Testhead Configurations SpecificationsJune 12 to 15, 2011 IEEE SW Test Workshop 17
  • 18. Summary  •  Understand  true  cost  of  architectures   –  Beware  of  NRE   –  New  architectures  needed  for  cost  reducEons  •  Maintain  sufficient  Gross  Margin   –  Company  health   –  Funding  for  R&D  •  Honest  supplier  –  customer  partnerships   June 12 to 15, 2011 IEEE SW Test Workshop 18
  • 19. Acknowledgments  •  Amphenol  InterCon  Systems  •  BucklingBeam  •  FormFactor  •  ISC  •  Kern  •  Robin  McAdams  •  MicroProbe  •  Sergio  Perez  •  SV  Probe  •  Frank  Swiatowiec   June 12 to 15, 2011 IEEE SW Test Workshop 19
  • 20. Thank  You!     Ira  Feldman   ira@feldmanengineering.com     Visit  my  blog   www.hightechbizdev.com   for  my  summary  of  SWTW    June 12 to 15, 2011 IEEE SW Test Workshop 20

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