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Paper given at RAMS 2013 on a case study for Accelerated Testing for devices expected to withstand a two year storage period.
Two accelerated life tests (ALT’s) explored two failure mechanisms of concern for a product expected to experience a 2-year storage period. Each ALT focused on a specific failure mechanism and required different applied stress.
Making periodic measurements permitted the experiments to illustrate the stability of the performance of the units over the aging process. The life data analysis for each set of data also permitted the calculation of the expected reliability performance of the population after two years of storage.