
Be the first to like this
Slideshare uses cookies to improve functionality and performance, and to provide you with relevant advertising. If you continue browsing the site, you agree to the use of cookies on this website. See our User Agreement and Privacy Policy.
Slideshare uses cookies to improve functionality and performance, and to provide you with relevant advertising. If you continue browsing the site, you agree to the use of cookies on this website. See our Privacy Policy and User Agreement for details.
Published on
Paper given at RAMS 2013 on a case study for Accelerated Testing for devices expected to withstand a two year storage period.
Two accelerated life tests (ALT’s) explored two failure mechanisms of concern for a product expected to experience a 2year storage period. Each ALT focused on a specific failure mechanism and required different applied stress.
Making periodic measurements permitted the experiments to illustrate the stability of the performance of the units over the aging process. The life data analysis for each set of data also permitted the calculation of the expected reliability performance of the population after two years of storage.
Clipping is a handy way to collect and organize the most important slides from a presentation. You can keep your great finds in clipboards organized around topics.
Be the first to comment