• Share
  • Email
  • Embed
  • Like
  • Save
  • Private Content
A3050 Eng
 

A3050 Eng

on

  • 590 views

A3050 Brochure in English

A3050 Brochure in English

Statistics

Views

Total Views
590
Views on SlideShare
588
Embed Views
2

Actions

Likes
0
Downloads
2
Comments
0

1 Embed 2

http://www.lmodules.com 2

Accessibility

Categories

Upload Details

Uploaded via as Adobe PDF

Usage Rights

© All Rights Reserved

Report content

Flagged as inappropriate Flag as inappropriate
Flag as inappropriate

Select your reason for flagging this presentation as inappropriate.

Cancel
  • Full Name Full Name Comment goes here.
    Are you sure you want to
    Your message goes here
    Processing…
Post Comment
Edit your comment

    A3050 Eng A3050 Eng Document Transcript

    • Low cost  New technology High performance TM Cogent ATE A3050 The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices. The A3050 offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.
    • Cogent ATE Series Leopard applications summary Logic ✱ The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices. Memory ✱ specications FPGA ✱ Digital I/O Channels 512 Max, 32Channels/Board Consumer soc ✱ Parallel Test Site 16 Microcontrollers ✱ Data Rate 50MHz Clock Rate 100MHz ASIC ✱ Timing Generators 6 edge/Pin Edge Placement Res. 1nS Pattern Memory Depth 4M Strobe Mode Edge/Windows Pin Electronics Driver -2.0V~+7.0V Rise/Fall 2.8nS/3V Min Pulse Width 4nS/5V Pin Electronics -2.0V~+11.0V Comparator Utility Relay 64 Format NRZ/RZ/RO/XOR/INVNRZ/INVRZ/INVRO/INVXOR APG X-GEN16bits, Y-GEN 16bits, D-GEN 16bits PMU PPMU,BPMU DPS 16 DPS Device Power Supply HDVI High density VI Source OPTIONS MT Memory Test Option APMU Analog Pin Measuerment Unit ADT Converter Test Option *All specifications subject to change without notice. CogentATE Systems Corporation Room 705,SOHO Shangdu North Tower B No.8 Dongdaqiao Road,Chaoyang District Beijing 100020, P.R.China Tel: +86(10)59000102 | Fax: +86(10)58850677 World Wide Web | www.CogentATE.com CogentATE is a registered trademark; the CogentATE logo and Leopard Series are trademarks of CogentATE Systems Corporation. All other trademarks are the property of their respective owners. © 2008 CogentATE Systems Corporation. All rights reserved.