Low cost New technology High performance
The A3050 delivers up to 512 digital channels in a zero footprint
system entirely contained within a test head. Its high-throughput
parallel testing capabilities up to 16 devices.
The A3050 offers a suite of options to address the variety of testing
needs in the low-end and mid-range semiconductor markets,
including the Converter Test Option, Memory Test Option,
Mixed-Signal Option. Its small footprint and high parallel test
throughput provide the most economical approach to testing
complex VLSI devices with embedded memory and analog cells.