Track g when did test - da integrated


Published on

Published in: Education
  • Be the first to comment

  • Be the first to like this

No Downloads
Total views
On SlideShare
From Embeds
Number of Embeds
Embeds 0
No embeds

No notes for slide

Track g when did test - da integrated

  1. 1. Chipex 2011 When Did Test Become a Designer’s Challenge? DA-Integrated Confidential
  2. 2. Chipex 2011 When Did Test Become a Designer’s Challenge? Conclusion: in 2001! DA-Integrated Confidential
  3. 3. Chipex 2011 When Did Test Become a Designer’s Challenge? Conclusion: in 2001! • about DA-Integrated • evolution of microelectronics from a test perspective • business realities of ATE industry • 4 principles of IC test design considerations • trends and DA-Integrated Confidential
  4. 4. DA-Integrated DA-Integrated is a pure play services provider Featuring all the capabilities and tools of a fabless semiconductor company, we serve • Systems companies, as their semiconductor division • Fabless startups, as the complement to their core capability • Established fabless and IDM, as elastic resource and advanced DA-Integrated Confidential
  5. 5. DA-Integrated Test is Design and Manufacturing Founded in 2002 as the world’s first fully independent test development services provider The key strength in test development is design and manufacturing engineering capability Growth of our business has been based on high level of expertise, independence and breadth of DA-Integrated Confidential
  6. 6. IC Evolution Evolution of silicon IC from a test perspective • Through to the mid-1990’s, a silicon IC was a smaller, cheaper commoditized version of an electronic DA-Integrated Confidential
  7. 7. IC Evolution Evolution of silicon IC from a test perspective • Through to the mid-1990’s, a silicon IC was a smaller, cheaper commoditized version of an electronic function • VLSI, Embedded Memory, Serial IO allowed the silicon IC to become a system enabler The DUTs are now by far the highest performance electronic devices in the lab! DA-Integrated Confidential
  8. 8. ATE Realities Business realities of ATE industry • Cost of test = time * rate • Time α IC Complexity • Rate α IC Complexity • Test development effort (interval, cost) α IC Complexity All trending in the wrong direction! DA-Integrated Confidential
  9. 9. ATE Realities Revenue of Two Semiconductor Bellwether Companies Churn in ATE industry since 2001 $12,000,000,000 • Divesting $10,000,000,000 • Buyouts • Mergers $8,000,000,000 • Exits $6,000,000,000 • Restructuring • Downsizing $4,000,000,000 • Platform Discontinuation $2,000,000,000 $0 19 9 19 0 19 1 92 19 3 94 19 5 19 6 19 7 19 8 20 9 20 0 20 1 02 20 3 20 4 20 5 20 6 20 7 20 8 20 9 10 8 9 9 9 9 9 9 9 9 0 0 0 0 0 0 0 0 0 19 19 19 20 Big ATE Revenue Big Fab Equipment DA-Integrated Confidential
  10. 10. Best Practices BIST TAP BOST DA-Integrated Confidential
  11. 11. Best Practices Built-in self test (BIST) BIST has been employed for embedded memory BIST (mBIST) and digital logic (Scan) TAP for many years. BOST In general, BIST means including an on-chip circuit that verifies the correct structural fabrication of the device and provides a highly simplified electrical PIPELINE signature enabling a vastly simplified and, often, faster production screen. Embracing the reality that the sole purpose of production test is to verify the absence of manufacturing defects is often the most difficult challenge for SoC DA-Integrated Confidential
  12. 12. Best Practices Test access ports (TAPs) BIST can be created as a standalone input/output (I/O) or by muxing TAP functionality TAP with system function-related I/O. BOST Fundamentally, electrical access to BIST I/O or functional I/O of embedded blocks must be provided to enable practical production testing. DA-Integrated Confidential
  13. 13. Best Practices Built-out self test (BOST) BIST refers to the use of custom circuitry or instrumentation that is not fully integrated TAP into either the SoC device or the ATE system. BOST Usually, BOST is included on loadboards as custom circuitry or modules. PIPELINE Traditionally, BOST was frowned upon due to factory floor considerations such as scalability, calibration and maintenance. However, with SoC ATE instrumentation quickly losing ground to SoC device functionality, production test solutions, including BOST, are becoming DA-Integrated Confidential
  14. 14. Best Practices Pipelined test flows BIST directly address the mismatch of test instrument cost versus utilization by TAP disassembling test into multiple stages. A major drawback of highly sophisticated SoC ATE systems is that the value and cost of any specific BOST instrument is inversely proportional to its utilization and contribution to fault coverage. PIPELINE The principles of defect clustering dictate that the low-complexity tests such as supply current testing, direct current (DC) parametrics and low-speed signal tests capture the vast majority of the defect-related dropout and justifiably occupy the bulk of test time. The high-performance, high-cost instruments provide only incremental fault coverage along with a non-linear contribution to test cost while sitting idle for the majority of the test DA-Integrated Confidential
  15. 15. Conclusion When Did Test Become a Designer’s Challenge? 2001 Testers are becoming: - Operator and Handler interfaces - Data handling machines - Power supplies - TAP controllers Product Definition, Device architects, Designers must have a thorough understanding of manufacturing test to be considered current Test Engineers must have a thorough understanding of design and develop new skills to define and implement BIST, TAP, BOST Industry and Supply Management must adapt to Pipelined DA-Integrated Confidential
  16. 16. Thank You Your Microelectronics Partner DA-Integrated is the Semiconductor Industrys first and leading provider of comprehensive Integrated Circuit Development and Supply Engineering Services. DA-Integrated features the full suite of tools and expertise of a fabless semiconductor company, offered as pure play services, complementing our customer’s core capability. Customer Core Expertise DA-Design Product Definition, DA-Supply Architecture, Internal IC Capability, Supply Management, Digital and Analog Design, Application Oriented Technology and IP Reliability, Verification, Product Engineering DFT, Physical Design DA-Test DA-Operations ATE Solutions, Hardware, Software Specialized Production Facilities, Instruments, Loadboard Circuitry, High Complexity, Test Related IP Moderate DA-Integrated Confidential