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Test Flow & Handling of WLCSP Devices

Test Flow & Handling of WLCSP Devices

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Bits2010jemison Bits2010jemison Presentation Transcript

  • BiTS 2010 Test Flow and Handling of WLCSP Devices Have Significant Impact on Cost Bob Jemison, RJI Technical Sales 2010 BiTS Workshop March 7-10, 2010
  • Our Challenge Today “ What can I do to lower the cost of testing my company’s WLCSP product? “ WLCSP is here! March 10, 2010 Cost Impact of WLCSP Test & Handling 2
  • Our Employers Demand • Meet increasing production volumes • Limit capital purchases • Lower the cost of test • Do more with less March 10, 2010 Cost Impact of WLCSP Test & Handling 3
  • This Presentation Will examine a possible transition that can be made in today’s test flow to increase effectiveness while lowering the cost of test Will compare the “traditional” test flow with this new flow for WLCSP March 10, 2010 Cost Impact of WLCSP Test & Handling 4
  • WLCSP Growth WLCSP + WLP Forecast 14000 12000 2008 10000 8000 2009 6000 2010 Millions of units 4000 2011 2000 2012 0 2008 2009 2010 2011 2012 March 10, 2010 Cost Impact of WLCSP Test & Handling 5
  • Restating Our Challenge Consider the cost of test • Management needs to lower costs • Test is a complex combination of things • Costs are made up of many factors • Some are built on tradition March 10, 2010 Cost Impact of WLCSP Test & Handling 6
  • Tradition Plays a Role Simplified test flow for packaged product Finished Goods Wafers-Material Wafer Assembly Final Test Probe • ATE • Wafer Saw • ATE • Device Interface • Sort • Test Boards • Probe Cards • Die attach • Test Sockets • Probe Stations • Wire Bond • Device Handlers • Encapsulation • Trim & Form • Marking • Inspection March 10, 2010 Cost Impact of WLCSP Test & Handling 7
  • Cost of Test Is made up of many components Capital Operating Device Expense Expense Throughput • Equipment • Labor • Effective • Upgrades • Floor space UPH • Options • Factory • Downtime • Economic integration • Utilization Life • Service & support March 10, 2010 Cost Impact of WLCSP Test & Handling 8
  • Cost of Test Some items are big contributors Capital Operating Device Expense Expense Throughput • Equipment • Labor • Effective • Upgrades • Floor space UPH • Options • Factory • Downtime • Economic integration • Utilization Life • Service & support March 10, 2010 Cost Impact of WLCSP Test & Handling 9
  • WLCSP Changes Things Revised test flow for WLCSP product Finished Goods Wafers-Material Wafer Assembly Final Test Probe • ATE • Wafer Saw • ATE • Device Interface • Sort • Test Boards • Probe Cards • Test Sockets • Probe Stations • Die attach • Device Handlers • Wire Bond • Encapsulation • Marking • Trim & Form • Inspection March 10, 2010 Cost Impact of WLCSP Test & Handling 10
  • Returns Complicate Matters Return flow for traditional product Finished Goods Wafer Assembly Final Test Probe • ATE • Wafer Saw • ATE • Device Interface • Sort • Test Boards Returned Product • Probe Cards • Die attach • Test Sockets • Probe Stations • Wire Bond • Device Handlers • Encapsulation • Trim & Form • Inspection March 10, 2010 Cost Impact of WLCSP Test & Handling 11
  • WLCSP Returns Flow for WLCSP product returns … oops! Finished Goods Wafer Assembly Final Test Probe • ATE • Wafer Saw • ATE • Device Interface • Sort • Test Boards Returned Product • Probe Cards • Test Sockets • Probe Stations • Die attach • Device Handlers • Wire Bond • Encapsulation • Marking • Trim & Form • Inspection Typical returned product has no final test infrastructure March 10, 2010 Cost Impact of WLCSP Test & Handling 12
  • What Have We Learned If we want to cut costs we need to … • Reduce the equipment needed for test • Shrink the size to save floor space • Reduce the number of operators needed • Accommodate the parts flows that are required for these new WLCSP products March 10, 2010 Cost Impact of WLCSP Test & Handling 13
  • WLCSP Approach Redefine the equipment Input Tester & Output Inspection Options Interface Options • Trays • Direct dock to • 6-way vision • Trays • Tubes tester inspection • Tubes • Wafer Frame platforms • Tape & Reel • De-tape • Allow probe • Marking card use or test contactors Combine all of these functions into one single platform March 10, 2010 Cost Impact of WLCSP Test & Handling 14
  • Financial Justification Consideration Traditional New Process Capital Equip 3 – 6 Machines 1 machine Work Flow 3 - 6 Steps 1 combined step JIT Benefits Multi-step process Simplified process Long cycle time Shorter cycle time High cost of inventory Low cost of inventory Traceability burden Single station Staffing Multi-machines to train Single machine to train Returns Processing Complicated non-std Simple de-tape to tape Qual/Engineering Complicated non-std Simple tray to tray Development Tasks Non-correlated Correlates to production March 10, 2010 Cost Impact of WLCSP Test & Handling 15
  • WLCSP Handler Wafer Frame Input Vision Inspection De-tape Tape & Reel Test Contactor Test head Manipulator March 10, 2010 Cost Impact of WLCSP Test & Handling 16
  • Typical Multipurpose WLCSP Handler An example of a multipurpose WLCSP test handler March 10, 2010 Cost Impact of WLCSP Test & Handling 17
  • Cost of Test So, based on this information … New equipment Effective use of space = Fewer staff Effective UPH March 10, 2010 Cost Impact of WLCSP Test & Handling 18
  • In Conclusion  New methods result in viable manufacturing  New equipment is available in the marketplace  Processes can be revamped today  Improvements will result in cost savings March 10, 2010 Cost Impact of WLCSP Test & Handling 19
  • Acknowledgements Our contributors include: Bob Jemison, GM, RJI Technical Sales bjemison@rjisales.com Afshin Nouri, President, Contech Solutions Werner Foltz, President, Peak Automation March 10, 2010 Cost Impact of WLCSP Test & Handling 20