IDENTIFICATION OF FIBER STRUCTURE firstname.lastname@example.org By Aravin prince .P
INTRODUCTION email@example.com Fiber physics is the study of the structure and physical properties of the fibers So fiber investigation methods and studying of fiber structure is very important to knowing about the fiber properties
METHOD OF INVESTIGATION OF FIBER STRUCTURE Absorption of IR radiation X- Diffraction studies firstname.lastname@example.org Optical microscopy Electron microscopy Thermal analysis Density method Nuclear magnetic resonance Atomic force microscopy
X-RAY DIFFRACTION X rays are electro magnetic waves. Range is between (1 to 2 Å i.e. 1*10 10) email@example.com It is a independent method to determine the amount of crystalline matter present in a fiber This idea is based on classical approach in which fibers are considered as a mixture of crystalline and amorphous matrix with each part producing a different type of X-Ray diffraction
When X-Ray beam is incident on a crystalline material, diffraction give rise to sharp rings or firstname.lastname@example.org peaks Where as non crystalline material produce broad diffuse scattering The diffraction efficiency of crystalline and non crystalline pattern are same
ELECTRON MICROSCOPE Normal optical microscope we can find out up to 0.5Åresolution only , email@example.com By using of electron microscope we can able to find out up to 5Å, The rays from electron source are condensed on the specimen, Here only dry sample can be examined, Contrast in the image depends on the variation in scattering of the electrons by parts of the specimen of differing density.
firstname.lastname@example.org Electron microscope method is better to examining the surface of the fiber, The main use of EM in fiber science has been in the range of medium to high magnification, which is near or beyond the limit of the microscope.
INFRA RED It is a composed by electro magnetic waves email@example.com Wave length between 1 to 15 µ It is used to determine the chemical formula for the textile fiber I.R is used to study about the crystalline and non crystalline part ( where as X Ray is only study about crystalline part) Reflection of CH3 is differ from CH2 so I will help to find out the atom structure and its chemical structure
LINE DIAGRAM OF I.R SPECTROSCOPY firstname.lastname@example.org
ATOMIC FORCE MICROSCOPE The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscopy , with demonstrated resolution of fractions of a nanometre, email@example.com more than 1000 times better than the optical diffraction limit The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface AFM include mechanical contact force , Vander walls forces, capillary forces, chemical bonding ,electrostatic forces , magnetic forces, and etc.
ATOMIC FORCE MICROSCOPE firstname.lastname@example.org
Thank You email@example.com ARAVIN PRINCE .P