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SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK
 

SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK

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SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

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    SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK SPICE MODEL of TPCC8066-H (Professional+BDP Model) in SPICE PARK Document Transcript

    • Device Modeling Report COMPONENTS: MOSFET (Professional Model) PART NUMBER: TPCC8066-H MANUFACTURER: TOSHIBA REMARK: Body Diode (Professional Model) Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1
    • MOSFET MODEL PSpice model parameter LEVEL L W KP RS RD VTO RDS TOX CGSO CGDO CBD MJ PB FC RG IS N RB PHI GAMMA DELTA ETA THETA KAPPA VMAX XJ UO Model description Channel Length Channel Width Transconductance Source Ohmic Resistance Ohmic Drain Resistance Zero-bias Threshold Voltage Drain-Source Shunt Resistance Gate Oxide Thickness Zero-bias Gate-Source Capacitance Zero-bias Gate-Drain Capacitance Zero-bias Bulk-Drain Junction Capacitance Bulk Junction Grading Coefficient Bulk Junction Potential Bulk Junction Forward-bias Capacitance Coefficient Gate Ohmic Resistance Bulk Junction Saturation Current Bulk Junction Emission Coefficient Bulk Series Resistance Surface Inversion Potential Body-effect Parameter Width effect on Threshold Voltage Static Feedback on Threshold Voltage Mobility Modulation Saturation Field Factor Maximum Drift Velocity of Carriers Metallurgical Junction Depth Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2
    • Transconductance Characteristics Circuit Simulation Result 40.00 Measurement Simulation gfs(S) 30.00 20.00 10.00 0.00 0.0 5.0 10.0 15.0 20.0 Drain Current ID (A) Comparison table gfs (s) Measurement Simulation Id(A) %Error 1 2 10.000 13.700 10.389 14.076 3.89 2.74 5 20.800 20.544 -1.23 10 27.500 26.737 -2.77 20 34.900 33.979 -2.64 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3
    • Vgs-Id Characteristics Circuit Simulation result 20A 15A 10A 5A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 TPCC8066-H V2 10 V1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4
    • Comparison Graph Circuit Simulation Result 20.00 Measurement Simulation Drain Current ID (A) 15.00 10.00 5.00 0.00 0.0 1.0 2.0 3.0 4.0 5.0 Gate - Source Voltage VGS (V) Simulation Result VGS(V) ID(A) 0.5 1 2 5 10 15 20 Measurement 2.430 2.500 2.600 2.730 2.870 3.000 3.150 Simulation 2.397 2.452 2.534 2.706 2.916 3.089 3.243 %Error -1.37 -1.92 -2.55 -0.89 1.60 2.98 2.96 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5
    • Rds(on) Characteristics Circuit Simulation result 5.0A 4.0A 3.0A 2.0A 1.0A 0A 0V 20mV 40mV 60mV 70mV I(V3) V_VDS Evaluation circuit V3 0Vdc U1 TPCC8066-H VDS 0Vdc V1 10 0 Simulation Result ID =5.5A, VGS = 10V R DS (on) m Measurement 12.400 Simulation 12.400 %Error 0.00 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6
    • Gate Charge Characteristics Circuit Simulation result 1 12V 2 30V 8V 20V 4V 10V 0V >> 0V 0 1 V(W1:2) 4n 2 8n 12n 16n V(U1:7) Time*1mA Evaluation circuit U1 TPCC8066-H I1 TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n 0 W1 D2 Dbreak I2 11 VDD + W IOFF = 1mA ION = 0uA 24 0 Simulation Result VDD=24V, ID=11A, VGS=10V Unit Qgs nC 3.400 3.300 -2.94 Qgd nC 1.600 1.631 1.94 Qg nC 15.000 14.789 -1.41 Measurement Simulation %Error All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7
    • Capacitance Characteristics Measurement Simulation Simulation Result Cbd(pF) VDS(V) 0.1 0.2 0.5 1 2 5 10 20 30 Measurement 725.000 635.000 485.000 375.000 285.000 190.000 138.000 100.000 82.000 Simulation %Error 726.000 633.000 485.800 376.800 283.500 189.200 137.900 100.110 82.900 0.14 -0.31 0.16 0.48 -0.53 -0.42 -0.07 0.11 1.10 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8
    • Switching Time Characteristics Circuit Simulation result 12V 10V 8V 6V 4V 2V 0V 0.96us V(U1:4) 0.98us 1.00us V(U1:5)/1.51 1.02us 1.04us 1.06us Time Evaluation circuit L2 RL 50nH 2.73 U1 TPCC8066-H VDD 15.1Vdc V2 V1 = 0 V2 = 20 TD = 1u TR = 5n TF = 5n PW = 10u PER = 20u R1 4.7 L1 30nH R2 4.7 0 Simulation Result ID=5.5A, VDD=15V VGS=10/0V ton ns Measurement 7.500 Simulation %Error 7.489 -0.15 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9
    • Output Characteristics Circuit Simulation result 20A 10 3.4 4 4.5 16A 5 6 8 3.2 12A 8A 3 4A VGS=2.7V 0A 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 TPCC8066-H V2 V1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10
    • Forward Current Characteristics Circuit Simulation Result 100A 10A 1.0A 100mA 0V -0.2V I(Vsense) -0.4V -0.6V -0.8V -1.0V V_VDS Evaluation Circuit Vsense 0Vdc U1 TPCC8066-H VDS 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11
    • Comparison Graph Circuit Simulation Result Drain Reverse Current IDR (A) 100.00 Measurement Simulation 10.00 1.00 0.10 0.0 0.2 0.4 0.6 0.8 1.0 Drain - Source Voltage -VDS (V) Simulation Result IDR(A) 0.1 0.2 0.5 1 2 5 10 20 -VDS(V) Measurement Simulation 0.660 0.6591 0.678 0.6782 0.703 0.7046 0.725 0.7266 0.755 0.7522 0.800 0.7982 0.850 0.8530 0.945 0.9441 %Error -0.13 0.03 0.23 0.22 -0.37 -0.22 0.35 -0.09 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12
    • Reverse Recovery Characteristics Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 0.88us I(R1) 0.96us 1.04us 1.12us 1.20us 1.28us Time Evaluation Circuit R1 50 V1 = -9.35v V2 = 10.7v TD = 30ns TR = 10ns TF = 10ns PW = 1us PER = 100us V1 U1 DTPCC8066-H_P 0 Compare Measurement vs. Simulation Parameter Unit Measurement Simulation %Error trj ns 12.000 12.192 1.60 trb ns 21.600 21.493 -0.50 trr ns 33.600 33.685 0.25 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13
    • Reverse Recovery Characteristics Reference Measurement Trj=12.0(ns) Trb=21.6(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14