Orthogonal Defect Classification: An Agile Test/QA Primer

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Can defect root cause analysis be made agile? Can we transform a multi-hour task from the classical world of software engineering into one that takes minutes and yields greater insights? Learn how Orthogonal Defect Classification (ODC) extracts semantics from defects and turns them into insights on the development process using analytics. After a quick overview of ODC, Ram Chillarege presents a case study to illustrate the method using real-world data on an agile project. They used ODC Triggers to measure test effectiveness at the end of every sprint to evaluate the effectiveness of testing compared to earlier sprints. This ODC process takes just minutes and brings its insight into the realm of the agile development practices. Put a powerful analytical technique in your agile toolbox to increase the velocity of your agile project and find new ways to reduce defects while measuring the quality of testing.

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Orthogonal Defect Classification: An Agile Test/QA Primer

  1. 1.           AW8 Concurrent Session  11/7/2012 2:15 PM                "Orthogonal Defect Classification: An Agile Test/QA Primer"       Presented by: Ram Chillarege Chillarege, Inc.                 Brought to you by:        340 Corporate Way, Suite 300, Orange Park, FL 32073  888‐268‐8770 ∙ 904‐278‐0524 ∙ sqeinfo@sqe.com ∙ www.sqe.com
  2. 2.     Ram Chillarege Chillarege, Inc. Ram Chillarege is president of Chillarege Inc., a consulting firm focused on software engineering optimization using Orthogonal Defect Classification (ODC). In 2004, he received the IEEE technical achievement award for the invention of ODC. Ram founded and led the Center for Software Engineering at IBM for almost a decade, and helped conceive and lead the corporate-wide Testing and Process initiatives in the 90s. Ram is chair of the IEEE Steering committee for Software Reliability, has published around fifty peer-reviewed articles, and is an IEEE fellow. Ram chaired the ISSRE 2009 conference and co-guest edited the September/October 2010 issue of the Security and Privacy magazine.  
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