The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily. For more information about the CIX100 technical cleanliness inspection system, visit: http://www.olympus-ims.com/en/microscope/cix100/

1. The cleanliness of components and parts is at the center of the manufacturing process. Meeting high demands for counting,
measuring, and classifying foreign particles is important for the production and quality control of final parts and assemblies.
International and company-specific directives outline the requirements for determining particle contamination on machined
parts and fluids. Modern industry standards demand repeatable and reproducible data with detailed information, including the
number of particles, particle size distribution, and particle composition.
The OLYMPUS CIX100 Cleanliness Inspector accurately and intuitively enables manufacturers to meet industry standards.
OLYMPUS CIX100 System
Turnkey Solution for Technical Cleanliness Inspection

2. To learn more about the OLYMPUS CIX100 system contact your local sales representative or visit http://www.olympus-ims.com/en/microscope/cix100/
www.olympus-ims.com
CIX100_Flyer_201610
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is certified to ISO 9001, ISO 14001, and OHSAS 18001.
*All specifications are subject to change without notice.
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Copyright © 2016 by Olympus.
Automated
After washing parts and extracting particulate residue on a
filter membrane, place the filter on the microscope stage.
The system automatically counts, measures, and classifies
particles in accordance with the selected cleanliness
standard. No stereo microscopes, no eyepiece reticles, no
adjusting polarizers.
Intuitive
Step-by-step guidance minimizes inspection and process
time; users of all experience levels can operate the
OLYMPUS CIX100 system, increasing reproducibility and
productivity.
Fast
Using an innovative polarization method, the OLYMPUS
CIX100 system improves throughput by a factor of two as
compared with other optical inspection systems. Obtain
live analytics of both reflective and non-reflective particles
ranging from 2.5 µm to 42 mm in one scan.
Reliable
The design eliminates the need for users to adjust
microscope settings, making the inspection process more
reproducible than both manual and other optical inspection
systems. The built-in performance standard device makes it
easy to perform a system check at any time.
Compliant
The OLYMPUS CIX100 system performs particle counting
in accordance with international standards, such as ISO
16232, ISO 4407, and VDA 19, in addition to company-
specific standards. The system automatically generates
reports that can be exported to MS Word or PDF,
enabling direct data exchange via email, saving time when
communicating results.