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DSX Opto-Digital Microscope Application

DSX Opto-Digital Microscope Application



Images of different samples as seen through DSX Series scopes. Discover more: http://bit.ly/1eTJHO8 ...

Images of different samples as seen through DSX Series scopes. Discover more: http://bit.ly/1eTJHO8

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    DSX Opto-Digital Microscope Application DSX Opto-Digital Microscope Application Document Transcript

    • DSX ApplicationsOpto-digital MicroscopeDSX SeriesHigh-resolutionUpright scopeHigh-resolutionInverted scopeFree-angleWide zoom scope
    • 2DSX ApplicationsPressure sensor/Inspection of a crimped terminalUser’s Department:Quality ControlSample Information:A metal terminal at the end of a flexible pressure sensor.This terminal is crimped with a pattern.Sample Usage:Embedded in gas or liquid pressure gaugesPurpose of Inspection/Observation:Since poor crimping of terminals may causea power distribution failure, inspection is required andimages of defects need to be captured.Current Method of Inspection/Observation:An optical microscope is used, which requires additionaladjustments including tilting the sample.User’s Concern:Using a standard microscope, thedent of a crimped type terminalis often difficult to see due toshadowing. This is caused bythe light beam hits the slope ofthe crimped terminal, and as aresult, the sensor does not receiveenough light back.Solution by DSX:MIX (bright-field and dark-fieldobservation) contrast provides theideal observation conditions byproviding enough reflected lightto the sensor by using two lightbeams. First, a light from above(bright-field) hits the flat bottomof the crimped terminal, and thesecond oblique illumination lightbeam (dark-field) hits the slope andremoves the shadows.Electrical partsDSX500MPLFLN5XBDP, 1x zoomMIX observation, EFIPrinted circuit board/Inspection of electrodes and circuitsUser’s Department:Quality ControlSample Information:Bare electrodes and laminated patterns on a flexible printedcircuit. The patterns on the right-hand side of the image arelaminated.Sample Usage:Flexible printed circuit board for a printerPurpose of Inspection/Observation:Inspect the condition of the electrode surface and thelaminated pattern in order to prevent a possible conductivitymalfunction. The coated surface requires inspection.Current Method of Inspection/Observation:An optical microscope is currently used. Effective for theobservation of the surface of the electrode when usingbright-field illumination, but the surface of the laminatedpattern cannot be observed.User’s Concern:Inspection of the darker, laminatesurface cannot be achieved usingstandard bright-field mode becauseit reflects the direct light.Solution by DSX:Using dark-field observation aneffective image can be acquired.because of the oblique illumination.It is also possible to switch betweenbright-field and dark-field modeswith the touch of a button.Electrical partsDSX500MPLFLN10XBDP, 2x zoomDark-field observation1mm1mm200µm200µm
    • 3DSX ApplicationsMulti-layer Circuit Board/Observation of inner circuitUser’s Department:Quality ControlSample Information:Inner circuit of a multi-layer circuit board.Sample Usage:This board is typically found in a personal computerPurpose of Inspection/Observation:To inspect whether there are any defects such as scratches,etc. on the surface pattern of the multi-layer circuit board. Atthe same time, confirm the inner pattern.Current Method of Inspection/Observation:An optical microscope is typically used but the issue is thatthe bright pattern on the surface is easily imaged but theinner pattern is not.User’s Concern:Often when performing thisinspection the inner patterncannot be imaged. It is difficultto find almost any details aboutthe inner pattern because of thehigh reflectance pattern on thesurface which drives the camerasexposure.Solution by DSX:A live image can be displayedusing HDR observation to combinemultiple images with differentexposure times. This makes itpossible to observe both bright anddark areas at the same time.Electrical partsDSX100DSXPLFL3.6X, 2x zoomUpright observation, HDRFlexible printed circuit board/Inspection of foiled circuitUser’s Department:Quality ControlSample Information:The sample is a flexible printed circuit that is laminatedexcept for the end.Sample Usage:Flexible printed circuit board for printerPurpose of Inspection/Observation:Inspect whether there are scratches, etc. in the foil circuitunder the laminate layer. The sample must be inspected in anon-destructively.Current Method of Inspection/Observation:An optical microscope is used. A sharp image can not beobtained due to the affect of the laminate layer, blurring theimage.User’s Concern:When using bright-field illuminationthe circuit below the laminatelayer cannot be sharply observedbecause of the coating, reflectingand blurring the image.Solution by DSX:Polarized light illumination providesa colored and high contrast imageby using polarization propertiesof the material and also reducesreflection from the laminate layer.This allows you to achieve a sharpimage of the circuit under thelaminate layer without impact fromthe laminate coating.Electrical partsDSX500MPLFLN10XBDP, 1x zoomPolarized light observation1mm1mm500µm500µm
    • DSX Applications4Decarbonized Structure/Observation of texture changesUser’s Department:Quality ControlSample Information:A test piece of polished metal in a resin blockSample Usage:A standard test piece that is used to observe a metalstructure.Purpose of Inspection/Observation:In order to determine whether heat processing wasperformed correctly, users observe the state of thedecarbonization on the surface of the carbon steel.(Supplement) Decarbonizing makes inhomogeneoushardening and creates cracking. Parts with this kind ofstructure are defective because the life span of the partsbecomes shorter and their mechanical performance isdramatically reduced.Current Method of Inspection/Observation:Use an inverted microscope with bright-field illuminationUser’s Concern:The sample exhibits a whitedecarbonized (ferrite) part andan inner dark (perlite) part on thesurface which cannot be clearlyobserved at the same time usinga conventional digital camera anddepth of field.Solution by DSX:Using Fine HDR an image withhigher contrast can be obtained bytaking multiple images at differentexposures to clearly observe boththe carbonized structure and theinner structure. In addition, theblackened perlite structure canalso be observed using EFI whichremoves depth of field limitations.Material scienceDSX500iXLMPLFLN10XDSX, 3x zoomBright-field observation, Fine HDR, EFIFractured metal surface/3D observationUser’s Department:Quality Control Sample Information:Tensile test piece. The material is CoCr alloy(cobalt chrome alloy).Sample Usage:Dental alloy for artificial teeth and orthoprosthesisPurpose of Inspection/Observation:Assess the mechanical strength using a tensile test.In addition, the state of breakdown can be studied byobserving the fractured surface.Current Method of Inspection/Observation:A stereo microscope is used. The unevenness of the surfacecan be visually observed by tilting the sample, but a sharpimage of the surface cannot be achieved.Solution by DSX:Using the EFI function to obtain aclear image of the fractured surfacedespite unevenness, thus removingdepth of field limitations.Solution by DSX:The 3D image function displaysthe fractured surface as a threedimensional image and makes itpossible to clearly observe theunevenness and other conditions.Material scienceDSX500MPLFLN5XBDP, 1x zoomMIX observation, 3DDSX500MPLFLN5XBDP, 1x zoomMIX observation, EFI200µm200µm1mm
    • DSX ApplicationsDiamond wheel/Inspection of the distribution ofabrasive grainsUser’s Department:Quality ControlSample Information:Disk-shaped diamond abrasiveSample Usage:Diamond wheel used for compact grinding equipment. Usedto deburr parts after processing.Purpose of Inspection/Observation:Visually inspect whether the abrasive grains are evenlydistributed. The polished surface will become smooth andthe diamond wheel will last longer if the grains are evenlydistributed.Current Method of Inspection/Observation:An optical microscope or large magnifying glass are used.User’s Concern:Bright-field observation can notobtain bright image of abrasivegrains. It is almost hard to see thesurface condition.Solution by DSX:Polarized light observationprovides an image in color andwith high contrast. This techniqueis particularly effective whenobserving minerals. It is alsopossible to switch between bright-field and polarized light observationwith the touch of a button.MachineryDSX500MPLFLN20XBDP, 1x zoomPolarized light observation5Automotive brake pad/Observation of abrasionUser’s Department:Research and DevelopmentSample Information:The sample is cut from a used brake pad.Sample Usage:Key component used in automotive industry.Purpose of Inspection/Observation:Observe the state of abrasion on the brake pad. In thepast, asbestos was used but now that it is prohibited, thecondition of the substitute fiber is being studied.Current Method of Inspection/Observation:A standard optical microscope has typically been used.Though it can be difficult to obtain a clear image by bright-field observation. Using Polarized light can improve this but itmakes the operation more complicated and less repeatable.User’s Concern:There are times when bright-fieldobservation can not obtain a sharpimage and the contrast of thesample is low.Solution by DSX:The material responds to polarizedillumination making it possible toacquire a color image with thefibers resolved. Using the DSXmakes the application of polarizedillumination simple and repeatable.AutomotiveDSX500iMPLFLN10XBDP, 1.6x zoomPolarized light observation400µm400µm200µm200µm
    • DSX ApplicationsCutting Tool/Review defectsUser’s Department:Quality ControlSample Information:Top Picture: Precision drill made of high speed steelBottom Picture: End mill made of carbon tool steelSample Usage:Machine tool for cutting and boring holes in metalPurpose of Inspection/Observation:Inspect the polished surface of the cutting tool and whetherthere are any defects before shipping. If there are anydefects, an image of the defect must be recorded.Current Method of Inspection/Observation:A stereo microscope is typically used. Though it is difficultto find flaws in the polished surface and search for defectsbecause the surface is so reflective.Solution by DSX:Flaws in a polished surface canbe easily acquired using dark-fieldobservation. In addition, the overallshape can be imaged using EFImode to combine a focused imageof both the area surrounding thedrill and its center, making it simpleto locate defects.Solution by DSX:Use dark-field observation to easilyfind defects. In addition, EFI modecan be used to favorably observethe condition of the defects, whichhelps in specifying the cause of thedefects.MachineryDSX500MPLFLN10XBDP, 1x zoomDark-field observation, EFIDSX500MPLFLN10XBDP, 1x zoomDark-filed observation, EFI6Gear used for Deceleration/External inspection of overall partUser’s Department:Quality ControlSample Information:Bevelled gear made of steel.Sample Usage:Used in the deceleration gears of a robot (automatedmachine on the manufacturing line)Purpose of Inspection/Observation:Visually inspect and record an image of the damaged areason the gear.Current Method of Inspection/Observation:A stereo microscope is used.Solution by DSX:Using the panorama (or stitching)function, the DSX can obtain ahigh resolution image with a widefield of view. The ability to createstitched images quickly and easilyis important for all quality controlenvironments. The left imageconsists of nine images.Solution by DSX:By combining the 3D imagecomposition function, a widefield 3-dimensional image can beconstructed. The 3D image can berotated, expanded and reducedusing the mouse or your hand.MachineryDSX100DSXPLFL3.6X, 1x zoomUpright observation, EFI, Stitching, 3DDSX100DSXPLFL3.6X, 1x zoomUpright observation, EFI, Stitching500µm500µm5mm
    • DSX ApplicationsImplant/Visual Inspection of the surfaceconditionUser’s Department:Quality ControlSample Information:Top Picture: Surface is treated with a polishingBottom Picture: Surface is treated with a coatingSample Usage:Implanted into the bone as the artificial root of a toothPurpose of Inspection/Observation:Visually Inspect for defects. Image the surface of the coatedimplant to confirm uniformity of the coating and if there areany defects.(Supplement) Visual inspection is important because theroughness of the coated surface relates to the affinity of thebone for the implant.Current Method of Inspection/Observation:A stereo microscope is typically used. High definitionobservation of the surface is required.Solution by DSX:The DSX100 is able to image theentire implant one field of view.Solution by DSX:By using HDR mode, users canobserve the details of the coatedsurface in high definition, enablingthem to better understand thematerial.(Supplement) The roughness of thecoated surface can be measuredusing Olympus laser scanningmicroscope OLS4000.Medical deviceDSX100DSXPLFL3.6X, 1.6x zoomUpright observation, HDRDSX100DSXPLFL3.6X, 1x zoomUpright observationDental tool/Confirm AppearanceUser’s Department:Quality ControlSample Information:Top Picture: A fine grinding tool with a diamond abrasivecoating on a ballBottom Picture: A fine grinding tool made of TungstenSample Usage:Cutting tool used for drilling teeth in Dentistry.Purpose of Inspection/Observation:Confirm the condition of the abrasive coating or the polishedblade at the edge of tool.Current Method of Inspection/Observation:A stereo microscope is typically used. Observation andinspection are conducted by changing the focal positionfrequently.Solution by DSX:The DSX’s EFI function makes iteasy to inspect samples even onesthat lie on different focal planes.Solution by DSX:Using the EFI function, a clearimage of the sample can beobtained by combining imagesfrom different focal positions. Inaddition, visual inspection can beconducted easily by using HDRmode. HDR modes provides clearhigh definition images of polishingflaws and surface conditions.Medical deviceDSX100DSXPLFL3.6X, 10x zoomUpright observation, HDR, EFIDSX100DSXPLFL3.6X, 6X zoomUpright observation, HDR, EFI72mm2mm400µm400µm
    • This product is designed for use in industrial environments for the EMC performance. Using it ina residential environment may affect other equipment in the environment.Discover another dimensionwww.olympus-ims.com/opto-digital/M1768E-012013