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  • 1. ZVxPlus- Pulsed DC and RF Characterisation of Nonlinear RF/HF Components in Time and Frequency domain - An extension kit for Rohde and Schwarz ZVA and ZVT May 2011
  • 2. Outline ● ZVxPlus in CW Mode ● From CW to Pulsed DC and RF ● Generic Blockdiagram for Pulsed DC and RF Operation ● Generic Extensions in ICE supporting Pulsed DC and RF Operation ● Some Practical Setups ● Measurements ● Conclusion© NMDG 2010-2011 2
  • 3. ZVxPlus ● ZVXPlus measures ● The “complete” behaviour of a device under test i.e. the v and i (or a and b) at all DUT ports ● Accurately ● Under almost realistic conditions ● Excitation and mismatch ● Using a single connection ● Including small-signal analysis a1 a2 i1 i2 v1 v2 b1 b2 CW MODE© NMDG 2010-2011 3
  • 4. From CW to Pulsed DC and RF CW Pulsed DC and RF ● Iso-thermal characterisation ● Trapping effects ● Radar Applications© NMDG 2010-2011 4
  • 5. Generic Blockdiagram for Pulsed DC and RF Operation Measure Trigger Large-Signal Network Analyser DUT RF Pulser DC Analyser Measure TriggerTiming V Low V High V Low V High Input Pulser Output Pulser RF Pulser Input Pulser Output Pulser LSNA Trigger DC Trigger© NMDG 2010-2011 5
  • 6. Generic ICE Extensions in support of DC and RF Pulsing© NMDG 2010-2011 6
  • 7. Setup supporting DC and RF Pulsing with Focus MPIV R&S RTO Scope:● Measuring CW/Pulsed DC I-V ZVxPlus RF Pulse Modulator Focus MPIV-DPMC: Focus MPIV-GPM: ● Output DC Pulser ● Synchronisation DC - RF ● Input DC Pulser© NMDG 2010-2011 7
  • 8. Non-50 Ohm setup supporting DC and RF Pulsing with Focus PIV© NMDG 2010-2011 8
  • 9. Dissection of Setup with Focus MPIV System Focus Microwaves: ● MPIV System ● DC Pulsers ● Synchronization DC Pulsers, RF Pulse Modulators and VNA & Scope Measurements ● CCMT / MPT tuners ● Source and load tuning Rohde & Schwarz: ● ZVA and ZVT series network analyzer and ZVAx ● S-parameters and Wave quantities ● Pulse measurements ● Average pulse mode ● Point in Pulse ● Pulse Profile: Presently not supported through ZVxPlus / ICE ● ZVAx contains pulse modulators ● RTO Scope ● DC IV measurements under CW/pulsed conditions NMDG: ● ZVxPlus and ICE ● Coherent combination of all instruments for nonlinear characterization under pulsed conditions in non-50 Ohm environment© NMDG 2010-2011 9
  • 10. Setup supporting DC and RF Pulsing with Auriga SystemZVxPlus Auriga AU4750 ● Biasing and Measuring CW/Pulsed DC ● Synchronization DC - RF RF Pulse ModulatorDC Pulsers© NMDG 2010-2011 10
  • 11. Non-50 Ohm setup supporting DC and RF Pulsing with Auriga System© NMDG 2010-2011 11
  • 12. Dissection of Setup with Auriga System Auriga Microwave: ● AU4750 Pulsed IV System ● DC Pulsers ● Synchronization DC Pulser, RF Pulse Modulators and VNA Measurements ● DC IV characteristics under pulsed conditions ● Bias-dependent S-parameters under pulsed conditions by synchronisation between Auriga system and network analyser Rohde & Schwarz: ● ZVA and ZVT series network analyzer and ZVAx ● S-parameters and Wave quantities ● Pulse measurements ● Average pulse mode ● Point in Pulse ● Pulse Profile: Presently not supported through ZVxPlus / ICE ● ZVAx contains pulse modulators Focus Microwaves: ● CCMT / MPT tuners ● Source and load tuning NMDG: ● ZVxPlus and ICE ● Coherent combination of all instruments for nonlinear characterization under pulsed conditions in non-50 Ohm environment© NMDG 2010-2011 12
  • 13. Measurement Results – CW Transistor in Pinch Off© NMDG 2010-2011 13
  • 14. Measurement Results – DC and RF Pulsed Transistor in Pinch Off Average Pulse Mode Period: 100us Duty cycle: 1%© NMDG 2010-2011 14
  • 15. Measurement Results – DC and RF Pulsed Transistor in Pinch Off Point in Pulse Mode Period: 100us Duty cycle: 1%© NMDG 2010-2011 15
  • 16. Conclusion ● With an incremental investment on a suitable R&S ZVA or ZVT, it is possible to characterise devices with one single connection ● small-signal behaviour: S-parameters ● large-signal harmonic behaviour under realistic conditions: complete input and output waveforms ● under pulsed DC and RF conditions ● possibly in a non-50 Ohm environment ● The accurate and complete large-signal harmonic measurements enable new insights in component behaviour, resulting in ● better semiconductor technologies ● better models and design kits ● better designs ● faster ways of testing, possibly in non-50 Ohm environments For more information info@nmdg.be www.nmdg.be© NMDG 2010-2011 16
  • 17. Want to try? Contact us at icesupport@nmdg.be© NMDG 2010-2011 17