Surface analysisversion3

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  • Surface analysisversion3

    1. 1. It’s what’s on the outside that counts, true story! 1Promotor: Pieter-Jan Sabbe & Dr. A. Adriaens Bachelorstudents: Nils De Rybel, Nicky Huys, Maria Gomez Rodriguez
    2. 2. Outline• Why study surfaces?• Goal of project• Corrosion layers of copper• Spectroscopic techniques used• Conclusion 2
    3. 3. Goal• Make copper corrosion layers• Study surface specific techniques• Apply surface specific techniques• Compare the layers 3
    4. 4. Why study surfaces? Polymer biodegradation Surface tension control Catalysis Adsorption, desorption SensorsSurface hardening Friction control Behaviour determined Applications by surface Corrosion Crystal growthControlled release polymers Optical recording media Anti-reflection coatings Magnetic recording media 4
    5. 5. Corrosion of copperName Chemical formulaCuprite Cu2ONantokite CuClAtacamite Cu2Cl(OH)3Paratacamite Cu2Cl(OH)3Tenorite CuOChalcokite Cu2S
    6. 6. Optical Microscopy
    7. 7. Optical Microscopy• Cupper coupon:• Chalcokite
    8. 8. Optical Microscopy• Cuprite.• Nantokite
    9. 9. Optical microscopy• Atacamite.• Paratacamite
    10. 10. Optical microscope• Tenorite• Chalcokite
    11. 11. X-ray Diffraction (XRD)
    12. 12. X-ray Diffraction (XRD)
    13. 13. X-ray Diffraction (XRD)ParatacamiteCopperNantokite
    14. 14. X-ray Diffraction (XRD)ParatacamiteCopperNantokite
    15. 15. X-ray Diffraction (XRD)ChalcokiteCopper
    16. 16. X-ray Photoelectron Spectroscopy (XPS) 16
    17. 17. X-ray PhotoelectronSpectroscopy (XPS) S-Probe Monochromatized XPS spectrometer from Surface Science Instruments (VG) AlKα x-ray (1486.6 eV) 1x10-9 mbar Analysis surface : 250 x 1000 μm 17
    18. 18. Standard spectra 18
    19. 19. Spectra 300000 Copper peaks 250000 200000Intensity (CPS) Tenorite (CuO) 150000 Nantokite (CuCl) Cuprite (Cu2O) 100000 Chalcocite (Cu2S) Paratacamite (Cu2Cl(OH)3) 50000 0 900 910 920 930 940 950 960 970 980 990 Binding energy (eV) 19
    20. 20. Auger Electron Spectroscopy (AES) Scanning depth is 1-5nm and lateral resolution ~10nm Sensitivity is about 1 to 100ppm Sample conductive Mutch more specific then XPS 20
    21. 21. X-ray Excited Optical Luminescence (XEOL)• How it works 21
    22. 22. X-ray Excited Optical Luminescence (XEOL)• Source 22
    23. 23. X-ray Excited Optical Luminescence (XEOL) Nantokite Paratacamite(?) 20.00 18.00 Ref. Nantokite (CuCl) 16.00 Nantokite Paratacamite(?) 14.00 Normalized Intensity 12.00 10.01 Ref. Paratacamite (Cu2Cl(OH)3) 08.01 06.01 04.01 02.01 00.01 889.20 891.00 892.79 894.59 896.38 898.18 899.97 901.77 903.56 905.36 907.15 -2 Energy / keV 10 23
    24. 24. Scanning Electron Microscopy (SEM) 24
    25. 25. Scanning Electron Microscopy (SEM) 25
    26. 26. Scanning Electron Microscopy (SEM) 26
    27. 27. Scanning Electron Microscopy (SEM) 1 - 30 keV 0.5 - 10 nm 27
    28. 28. Scanning Electron Microscopy (SEM)• Secondary electrons 28
    29. 29. Scanning Electron Microscopy (SEM)• Backscattered electrons 29
    30. 30. Scanning Electron Microscopy (SEM) 30

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