New Product Commercialization

1,799 views

Published on

New Product Commercialization Strategy

Published in: Technology, Business
1 Comment
0 Likes
Statistics
Notes
  • Be the first to like this

No Downloads
Views
Total views
1,799
On SlideShare
0
From Embeds
0
Number of Embeds
3
Actions
Shares
0
Downloads
90
Comments
1
Likes
0
Embeds 0
No embeds

No notes for slide

New Product Commercialization

  1. 1. New ProductNew Product CommercializationCommercialization John GlenningJohn Glenning July 23, 2009July 23, 2009
  2. 2. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems
  3. 3. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems
  4. 4. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification
  5. 5. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification • Identify accuracy and precision problems Accurate but not precise Precise but not accurate
  6. 6. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification • Identify accuracy and precision problems Accurate but not precise Precise but not accurate • Precision Problems: Excessive variability with incoming material, processing conditions and equipment conditions in space and time
  7. 7. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification • Identify accuracy and precision problems Accurate but not precise Precise but not accurate • Precision Problems: Excessive variability with incoming material, processing conditions and equipment conditions in space and time • Accuracy Problems: 1 or 2 processing conditions are not at the optimum (Designed Experiments)
  8. 8. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification • Identify accuracy and precision problems Accurate but not precise Precise but not accurate • Precision Problems: Excessive variability with incoming material, processing conditions and equipment conditions in space and time • Accuracy Problems: 1 or 2 processing conditions are not at the optimum (Designed Experiments) • Cp & Cpk will identify the accuracy & precision problems
  9. 9. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 1. Identify and resolve fundamental problems 2. Repeatability Studies for both product and process measurement systems 3. Identify and resolve processing problems: Capability Analysis Study • Cp and Cpk by location for all product specification • Identify accuracy and precision problems Accurate but not precise Precise but not accurate • Precision Problems: Excessive variability with incoming material, processing conditions and equipment conditions in space and time • Accuracy Problems: 1 or 2 processing conditions are not at the optimum (Designed Experiments) • Cp & Cpk will identify the accuracy & precision problems • Precision problems must be solved before accuracy problems
  10. 10. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications
  11. 11. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment
  12. 12. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions
  13. 13. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream
  14. 14. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions
  15. 15. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions • These are the mid-stream measurements that identify that a process adjustment is required
  16. 16. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions • These are the mid-stream measurements that identify that a process adjustment is required • Correlate process conditions to interim product conditions
  17. 17. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions • These are the mid-stream measurements that identify that a process adjustment is required • Correlate process conditions to interim product conditions • This identify the process adjustments to be made
  18. 18. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions • These are the mid-stream measurements that identify that a process adjustment is required • Correlate process conditions to interim product conditions • This identify the process adjustments to be made • Correlate incoming material conditions to final product conditions
  19. 19. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 4. Consistently meet product specifications 5. Optimize the manufacturing process using Designed Experiment • Resolution IV Experiment • Optimized Conditions • SPC • Measure interim product conditions mid-stream • Correlate interim product conditions to final product conditions • These are the mid-stream measurements that identify that a process adjustment is required • Correlate process conditions to interim product conditions • This identify the process adjustments to be made • Correlate incoming material conditions to final product conditions • Incoming material specifications
  20. 20. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ
  21. 21. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable”
  22. 22. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable”
  23. 23. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable” • Cp & Cpk ≥ 2.00 for features at all locations: Elimination of mass inspection
  24. 24. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable” • Cp & Cpk ≥ 2.00 for features at all locations: Elimination of mass inspection • Cp & Cpk ≥ 3.00 for features at all locations: World Class Manufacturer
  25. 25. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable” • Cp & Cpk ≥ 2.00 for features at all locations: Elimination of mass inspection • Cp & Cpk ≥ 3.00 for features at all locations: World Class Manufacturer • High Yields
  26. 26. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable” • Cp & Cpk ≥ 2.00 for features at all locations: Elimination of mass inspection • Cp & Cpk ≥ 3.00 for features at all locations: World Class Manufacturer • High Yields • Eliminate Mass Inspection • Buckbee-Mears: 70% of the manufacturing costs occurred after the product was made
  27. 27. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 6. Develop High Capability • Cp & Cpk • Cp = (USL – LSL)/6σ • Cpk = lesser of (USL - µ)/3σ and (µ- LSL)/3σ • Cp & Cpk < 1.00: Process is “Not Capable” • Cp & Cpk ≥ 1.00 for features at all locations: Process is “Capable” • Cp & Cpk ≥ 2.00 for features at all locations: Elimination of mass inspection • Cp & Cpk ≥ 3.00 for features at all locations: World Class Manufacturer • High Yields • Eliminate Mass Inspection • Buckbee-Mears: 70% of the manufacturing costs occurred after the product was made • IBM: “It cost 10 times more to solve problems in manufacturing than in development and it cost 10 times more to solve problems in development than in R & D”
  28. 28. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…)
  29. 29. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line
  30. 30. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards
  31. 31. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early
  32. 32. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing
  33. 33. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk)
  34. 34. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time
  35. 35. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time • Equipment Up-time
  36. 36. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time • Equipment Up-time • Manufacturing Costs
  37. 37. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time • Equipment Up-time • Manufacturing Costs • WIP
  38. 38. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time • Equipment Up-time • Manufacturing Costs • WIP • Identify trends early
  39. 39. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Process Development Overview: 7. Qualify the manufacturing process • Four Level Qualification Process (IBM, HTI, GE, Motorola, Intel…) • Stress the manufacturing line • More product is made in a shorter period of time to higher standards • Identify high volume manufacturing problems early 7. Transfer the process into manufacturing 8. Continuous Improvement by constantly tracking: • Product Quality (Cp & Cpk) • Cycle Time • Equipment Up-time • Manufacturing Costs • WIP • Identify trends early • Maintain high quality and low costs
  40. 40. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time
  41. 41. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product
  42. 42. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product • Retain samples of incoming material for future analysis
  43. 43. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product • Retain samples of incoming material for future analysis • Capture time-stamped processing data in a database
  44. 44. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product • Retain samples of incoming material for future analysis • Capture time-stamped processing data in a database • Time stamp product when run in each process
  45. 45. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product • Retain samples of incoming material for future analysis • Capture time-stamped processing data in a database • Time stamp product when run in each process • Measure product mid-stream
  46. 46. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech Manufacturing Philosophy: • Hold your suppliers to meet your material specifications in space & time • Track & identify incoming material lots to your product • Retain samples of incoming material for future analysis • Capture time-stamped processing data in a database • Time stamp product when run in each process • Measure product mid-stream • Continuously track key product parameters to reduce variability, identify problems and trends early • Capability • Cost • Cycle Time • Equipment Up-time • WIP
  47. 47. John Glenning’s Presentation to GrafTechJohn Glenning’s Presentation to GrafTech End of Presentation

×