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Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
Subway Process Study (Operations Management, B-School)
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Subway Process Study (Operations Management, B-School)

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  • 1. An Underground Odyssey Dong Jun Park Scott Hice James Igoe Operations Management Professor Orsini Fall 2002
  • 2. Study Limitations <ul><li>Subway turnstile location </li></ul><ul><ul><li>Thirty-fourth (34th) Street subway entrance </li></ul></ul><ul><ul><li>Just off of, and under, Path station </li></ul></ul><ul><ul><li>Single turnstile bank, closest to entrances </li></ul></ul><ul><li>Time frame </li></ul><ul><ul><li>Non-peak hours </li></ul></ul><ul><ul><li>Weekend </li></ul></ul><ul><li>Tally </li></ul><ul><ul><li>Anonymous </li></ul></ul><ul><ul><li>Intuitive assessment of failure cause by observer </li></ul></ul><ul><ul><li>Number of failures per twenty attempts </li></ul></ul><ul><ul><li>Multiple failures by a subject is treated as one failure </li></ul></ul><ul><li>Swipe </li></ul><ul><ul><li>At least partial entry of card into reader </li></ul></ul><ul><ul><li>Forward motion of hand </li></ul></ul><ul><ul><li>Failure: a repeated swipe or exit from the turnstile after an swipe </li></ul></ul>
  • 3. Presumed Defect Causes (Ishikawa)
  • 4. Defect Groupings <ul><ul><ul><li>Tourist </li></ul></ul></ul><ul><ul><ul><li>Immigrant </li></ul></ul></ul><ul><ul><ul><li>Aged </li></ul></ul></ul><ul><ul><ul><li>Children </li></ul></ul></ul><ul><ul><ul><li>Insufficient fare </li></ul></ul></ul><ul><ul><ul><li>Defective card </li></ul></ul></ul><ul><ul><ul><li> Rushed (pressed from behind or by exiting) </li></ul></ul></ul><ul><ul><ul><li> Wet (or related weather conditions) </li></ul></ul></ul><ul><ul><ul><li>Closed (attempts at entry into closed turnstiles) </li></ul></ul></ul><ul><ul><ul><li>Other </li></ul></ul></ul>
  • 5. Defect Statistics (np Chart)
  • 6. Turnstile Failures (np Chart)
  • 7. Defect Analysis
  • 8. Process Improvements (Alternative Technologies) <ul><li>Change Card Reader Mechanism </li></ul><ul><ul><ul><li>Tourist </li></ul></ul></ul><ul><ul><ul><li>Immigrant </li></ul></ul></ul><ul><ul><ul><li>Aged </li></ul></ul></ul><ul><ul><ul><li>Children </li></ul></ul></ul><ul><ul><ul><li>Rushed (pressed from behind or by exiting) </li></ul></ul></ul><ul><ul><ul><li>Wet (or related weather conditions) </li></ul></ul></ul><ul><li>Redesign turnstile entry </li></ul><ul><ul><ul><li>Closed (attempts at entry into closed turnstiles) </li></ul></ul></ul><ul><li>User Error </li></ul><ul><ul><ul><li>Insufficient fare </li></ul></ul></ul><ul><ul><ul><li>Defective card </li></ul></ul></ul>

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