LTE Raises the Bar - Is the Telecom Industry Rising to the Challenge?


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An analyst briefing presentation led by Olga Yashkova, program manager in Frost & Sullivan's measurement & instrumentation group, with executives from Anritsu and Ixia.

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  • The test configuration let us achieve several critical measurements.  With respect to master clock interaction, we verified that that the 7705 Boundary Clock successfully synchronized to the grandmaster.   With respect to slave interaction, we verified the Boundary Clock established and maintained accurate synchronization with all 100 slaves under real-world traffic load. We monitored the message exchange per slave and measured the minimum, maximum and average offset and path delay per slave. By generating negative conditions, - including delayed, dropped and CRC errors on PTP messages we also validated the robustness of the Alcatel-Lucent 1588v2 implementation.  Finally, traffic latency, jitter, loss and throughput measurements demonstrate that both traffic forwarding and timing synchronization requirements were met at the same time under real-world network conditions. This provided a very comprehensive validation of the 7705 SAR’s Boundary Clock performance and its ability to meet synchronization requirements for mobile backhauling over packet networks
  • LTE Raises the Bar - Is the Telecom Industry Rising to the Challenge?

    1. 1. LTE Raises the Bar: Is the Telecom Industry Rising to the Challenge<br />Olga Yashkova, Program Manager<br />Measurement & Instrumentation<br />May 24, 2011<br />Guest Speakers: <br />Mike Barrick, Global Account Manager, Anritsu<br />Michael Haugh, Sr. Product Manager, Ixia<br />
    2. 2. Today’s Presenters<br />Olga Yashkova, Program ManagerFrost & Sullivan<br />Mike Barrick, Global Business Development Manager, Wireless Portfolio, Anritsu<br />Michael Haugh, Sr. Product Manager, Ixia<br />
    3. 3. Focus Points<br />1<br />Market Overview<br />2<br />Market Dynamics:<br /><ul><li>Industry Challenges
    4. 4. Market Drivers/Restraints</li></ul>Key Opportunities:<br />3<br />Mobile Device Testing:<br /><ul><li>Mobile Device Categories and Trends
    5. 5. Evolution of Test in the Mobile Device Supply Chain</li></ul>Wireless Backhaul Testing:<br /><ul><li>Key Technology
    6. 6. Test Methodology required to move to all IP/Ethernet Backhaul</li></ul>4<br />Key Take-Aways<br />5<br />Q&A<br />
    7. 7. Market Overview<br />Wireless Test Equipment Market: <br />Revenue Forecast (World), 2010 and 2017<br />Wireless Test Equipment Market: <br />Revenue Contribution by Segment (World), 2010 <br />Note: All figures are rounded; the base year is 2010. Source: Frost & Sullivan analysis.<br />
    8. 8. Industry Challenges<br />Wireless Test Equipment Market: Impact of Industry Challenges (World), 2010-2017<br />3-4Years<br /> 1-2 Years<br />5-7Years<br />Increasing Data Rates<br />Migration to Ethernet Backhaul<br />Industry Challenges<br />Impact<br />Complexity<br />of Wireless<br />Technology<br />Low<br />Source: Frost & Sullivan analysis.<br /> High<br />Medium<br />Low<br />
    9. 9. Mobile Backhaul Infrastructure Market: Spending <br />on IP/MPLS Equipment (World), 2008-2015<br />Source: Frost & Sullivan analysis<br />
    10. 10. Key Drivers and Restraints<br />Wireless Test Equipment Market: Key Market Drivers and Restraints (World), 2011-2017<br />Wireless Data<br />LTETechnology<br />Location-based<br />Services<br />Smart Devices<br />LTE-advanced<br />MIMO<br />Drivers<br />Drivers<br />Restraints<br />Restraints<br />Home-grown Solutions<br />Budget <br />Consolidation<br />Denotes Current Impact<br />Denotes Long term Impact <br />Source: Frost & Sullivan analysis.<br />
    11. 11. Smartphones Shipment Forecast (North America), 2009-2015<br />Smartphones CAGR:21.0%<br />Overall Device Market CAGR: 1.9%<br />>140 mil<br />Shipments (Million)<br />Source: Frost & Sullivan analysis<br />
    12. 12. Opportunities<br /><ul><li>Mobile Device Testing
    13. 13. Mobile Backhaul Testing</li></li></ul><li>Mobile Device Testing<br />Presented by <br />Mike Barrick<br /> Global Business Development Manager, Wireless Portfolio, Anritsu<br />
    14. 14. Mobile Device Categories and Trends<br />Applications<br />Processor<br />NFC<br />GPS<br />Wi-Fi<br />Data<br />Bluetooth<br />Voice<br />Data<br />WAN Modem<br />Hi-Fi<br />Audio<br />Voice<br />HD Video<br />Clock<br />Memory<br />SIM<br />Touch<br />Screen<br />2G Phone<br />- Voice Centric-<br />4G Smart Phone<br />-Data and Voice-<br />Embedded Wireless Data Devices<br />Module-Based and On-Board Designs<br />
    15. 15. Mobile Device Supply Chain Model<br />OEM<br />Integration<br />OEM<br />Factory<br />Conformance<br />& Op. Accept Test<br />BB Chipset & OS<br />Dev & Mfg.<br />ODM<br />UE Integration<br />EMS<br />Factory<br />Carrier<br />Distribution<br />Consumer<br />Aftermarket<br />Service<br />Alternate Channel<br />Distribution<br />
    16. 16. Evolution of Test in the Mobile Device Supply Chain<br />
    17. 17. Chipset and Sub-Component Test<br />Carriers<br />1 to 5 Carriers<br />Sim. In Diff. Bands<br />Carrier Aggreg.<br />Data Rates<br />7.2 MB/s to 1 GB/s<br />> 100 x Increase<br />High-Level<br />Trends<br />Bandwidths<br />5 MHz to 100 MHz<br />20 x Increase<br />Modulation<br />CDMA to OFDM<br />Formats<br />2G to 4G, Wi-Fi, BT, GPS<br />Simultaneous Operation<br />Protocol Stack<br />Test Trends<br />Transportable <br />Test Cases<br />Challenging Simulation of L1<br /> - Particularly w/Multi-Band<br />Multiple Carriers<br /> Synch of Multiple Instruments<br /> Modular Multi-Carrier Approach<br />High Bandwidth OFDM <br /> Increased Processing Power<br /> Higher Front-End Bandwidth<br />Baseband, <br />RFIC, & Power Amp <br />Test Trends<br />Multiple Formats<br />Flexible Generation & Analysis/Demod<br />
    18. 18. Integration and Functional Test<br />Network Handovers<br />2G, 3G, & 4G Networks<br />Differing Coverage<br />Roaming<br />Need for Simultaneous<br />Voice and Data<br />Dual-Radio Designs<br />High-Level<br />Trends<br />Less Battery Life<br />Multiple Radios<br />Backlight<br />Apps Processor<br />More Complex SW<br />High-Level OS<br />Multi-Context SW<br />State-Machine Based Test Cases<br />Complexity of Script-Based<br />Test Not Desired<br />Graphical User Interface<br />Enabling Black-Box Style Testing<br />Test Trends<br />Multiple BTS Test<br />Enabling Functional Test<br />During Handover<br />E2E Application Test<br />Using Server-Based Apps<br />Battery Life Test<br />Using High-Demand Apps<br />
    19. 19. Conformance Test<br />CT Required for Operator Acceptance<br />RF and Protocol<br />GCF or PTCRB<br />High-Level<br />Trends<br />Increasing Number of Bands<br />Linearly Increases Test Time & Cost<br />Increasing Functionality<br />Linearly Increases Test Time & Cost<br />HSDPA – WI-014<br />HSUPA – WI-025<br />LTE – WI-080<br />Multi-Band/Multi-Mode Systems<br />Many Test Case Variations w/1 Conn.<br />24/7 Test<br />Test Case and UE Automation<br />24/7 Test<br />Test Trends<br />Increased Test Speed<br />Parallel Testing<br />Adv. Algorithms<br />Reports to GCF/PTCRB Criteria<br />
    20. 20. Operator Acceptance Test<br />OAT Required for Operator Acceptance<br />Data Performance, System Selection, SMS, etc.<br />Beyond 3GPP<br />High-Level<br />Trends<br />Increasing Number of Test Plans for Each Operator<br />Drastically Increases Test Time & Cost<br />Test Trends<br />Multi-Band/Multi-Mode Systems<br />Many Test Plans w/1 Conn.<br />24/7 Test<br />Automation of Test Cases and UE<br />24/7 Test<br />Test Plan-Specific Req.<br />Data Perf – High IP TPut w/Fading<br />System Selection – Multiple RATs<br />Reports to Operator Criteria<br />
    21. 21. Manufacturing Test<br />Lower Target Test Times<br />More Air Interfaces to be<br />Cal’d and Tested<br />Cellular, Wi-Fi, BT, etc.<br />High-Level<br />Trends<br />Continued Downward Cost Pressures<br />Lower Cost Devices -> Lower Cost Mfg.<br />Consolidation of Mfg. in Low-Wage Countries<br />Asia-Pacific, Latin America, Eastern Europe<br />No Call-Based Testing<br />Replacement for Call-Based Test<br />Due to Decreased Test Time<br />Intuitive APIs for Factory Integration<br />Test Trends<br />Simultaneous Testing<br />Of Multiple Air Interfaces<br />Simultaneous Calibration of<br />Transmit and Receive<br />
    22. 22. Reverse Logistics Test<br />Broken Devices Need to be<br />Repaired or Scrapped<br />High-Level<br />Trends<br />Call-Based Test for Repair<br />Due to High Mix/Low Volume<br />Established Device Repair Chain<br />With 2G/3G Repair Capability<br />No Established Repair Capability <br />for Embedded Devices <br />Expansion of Wireless Device<br />Troubleshoot & Repair into <br />Embedded Device Supply Chain<br />Call-Based Test Required for<br />Aftermarket Repair<br />Test Trends<br />Easy-to-Use UIs Important for<br />Embedded Device Repair<br />
    23. 23. Summary and Conclusions<br />Wireless Devices Continue to Evolve<br />Trends are Smart Phones and Wireless Devices Embedded in Consumer Electronics<br />New and Evolved Test Capability is Needed to Match <br />Wireless Device Capabilities<br />Supply Chain Requirements<br />Anritsu is Closely Watching These Requirements to Provide an Optimal Solution Portfolio to Match Customer Needs<br />Chipset and Sub-Component Test<br />MS269X Vector Signal Analyzer/Generator<br />MD8430A LTE Signaling Tester<br />Functional Test<br />MD8475A 2G-4G Applications Tester<br />Conformance Test<br />ME7873L LTE RF Conformance Test System<br />ME7832L LTE Protocol Conformance System<br />Operator Acceptance Test<br />ME7834L Operator Acceptance Test System<br />Manufacturing and Reverse Logistics Test<br />MT8820C C 2G-4G One-Box Tester<br />
    24. 24. Wireless Backhaul Testing<br />Presented by<br />Michael Haugh<br />Sr. Product Manager, Ixia<br />
    25. 25. Wireless Backhaul Key Challenges<br />Service Provider Challenges<br />Support the bandwidth required for 3G services<br />Roll-out new 4G (LTE/WiMAX) Services<br />Lower the “cost per bit” on the backhaul network as speeds increase<br />Leverage a common infrastructure (IP/Ethernet)<br />Migrate away from legacy Infrastructure (SONET/SDH/TDM)<br />Next Generation Metro/Aggregation Network for Backhaul<br />IP/Ethernet (Carrier Ethernet) based and/or IP/MPLS/MPLS-TP<br />Requires:<br />Quality of Service<br />High Reliability<br />Highly Scalable<br />Timing Synchronization<br />Service Management<br />
    26. 26. Backhaul Migration from TDM to IP/Ethernet<br />100% of global Service Providers claim to be deploying IP/Ethernet backhaul in 2010<br />Most current deployments are ‘hybrid’ using retaining TDM for voice due to clock synchronization requirements<br />Unlike SONET/SDH, Ethernet has no native clock transfer mechanism<br />65% of service providers plan to move to a single Ethernet mobile backhaul for carrying all traffic <br />First require assurance that timing over packet (ToP) technologiesmeet clock accuracy and network synchronization requirements<br />
    27. 27. Technologies enabling IP/Ethernet for Mobile Backhaul<br />Quality of Service<br />IP ToS/DiffServ<br />Ethernet 802.1p<br />MPLS (EXP bits defined as Traffic Class)<br />High Reliability<br />PBB-TE<br />MPLS Fast Re-Route<br />MPLS-TP APS<br />Highly Scalable<br />Ethernet using PB, PBB<br />IPv4 migrating to IPv6<br />MPLS, MPLS-TP<br />Timing Synchronization<br />1588-2008 (Precision Timing Protocol)<br />SyncE (ESMC)<br />Service Management<br />Service OAM, Link OAM, ELMI<br />
    28. 28. Timing Protocols are critical to move to IP/Ethernet<br />IEEE 1588v2 Precision Time<br />Protocol (PTPv2)<br />Protocol Layer<br />Synchronizes frequency and time-of-day<br />Subject to network load<br />‘Version 2” introduces Transparent Clocks and Boundary Clocks<br />Synchronous Ethernet (SyncE)<br />Physical Layer<br />Synchronizes only frequency<br />Not impacted by network load<br />Every switch/router path must support SyncE<br />Synchronization Status Message (SSM) carries clock quality level (1pps)<br />Network devices must be able to recognize, select, and propagate highest quality clock<br />
    29. 29. Industry Example: 1588v2 Performance Test<br />Boundary Clock Implementation <br /><ul><li>Synchronization to Grandmaster Clock
    30. 30. Synchronization with 100 Slave Clocks
    31. 31. Traffic forwarding requirements met
    32. 32. Robust under negative conditions</li></ul>Transparent Clock Implementation<br /><ul><li>Correction Field modified for 150 slave clocks
    33. 33. Synchronization operation verified </li></ul><br />
    34. 34. Key Take-Aways<br />Service providers are moving to an IP/Ethernet Backhaul<br />Many technologies are available including new options like MPLS-TP<br />Testing covers many protocols for scale, reliability, QoS, synchronization and management<br />One of the most significant current challenges is addressing synchronization when moving from TDM to IP/Ethernet<br />Significant progress has been made over the last few years<br />
    35. 35. Conclusion<br /><ul><li>Industry’s move to LTE brings a number of challenges
    36. 36. Rapid move to IP/Ethernet Backhaul is inevitable
    37. 37. Testing of mobile devices, components, networks and infrastructure </li></ul>becomes absolutely critical<br />
    38. 38. Next Steps<br /><ul><li>Request a proposal for or Growth Partnership Services or Growth Consulting Services to support you and your team to accelerate the growth of your company. ( 1-877-GoFrost (1-877-463-7678)
    39. 39. Join us at our annual Growth, Innovation, and Leadership 2011: A Frost & Sullivan Global Congress on Corporate Growth (
    40. 40. Register for Frost & Sullivan’s Growth Opportunity Newsletter and keepabreast of innovative growth opportunities(</li></li></ul><li>Your Feedback is Important to Us<br />Growth Forecasts?<br />Competitive Structure?<br />Emerging Trends?<br />Strategic Recommendations?<br />Other?<br />What would you like to see from Frost & Sullivan?<br />Please inform us by rating this presentation.<br />Frost & Sullivan’s Growth Consulting can assist with your growth strategies<br />
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    42. 42. For Additional Information<br />Sarah Saatzer<br />Corporate Communications<br />Measurement & Instrumentation<br />(210) 477-8427<br /><br />Michael Haugh,<br />Sr. Product Manager,<br />818-444-3161<br /><br />Olga Yashkova<br />Program Manager<br />Measurement & Instrumentation<br />(210) 247-3863<br /><br />Michael Barrick<br />Sales Manager<br />972-644-1777<br /><br />