Power Device Analyzer/Curve Tracer

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This is the PDF versiono of a web seminar that I gave last year on the B1505A Power Device Analyzer/Curve Tracer.

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Power Device Analyzer/Curve Tracer

  1. 1. New Power Device Analyzer / Curve Tracer Solves C S High Power Device Testing Challenges New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 1 October 22, 2009
  2. 2. Agenda for Today • Challenges Facing Power Device Measurement • Overview of the B1505A and EasyEXPERT Software • Curve Tracer Mode: Features & Benefits • Packaged Part Test & Wafer Probing Solutions • Solar Cell Test with the B1505A • Summary & Conclusions New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 2 October 22, 2009
  3. 3. Challenges Facing Power Device g g Measurement New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 3 October 22, 2009
  4. 4. Key Power Device Measurement Challenges – 1 Insufficient Measurement Capability No single measurement solution available that can perform both high current and high voltage IV and CV high-current high-voltage measurements. Novel Device (SiC, GaN, etc.) Characterization (SiC GaN etc ) The high breakdown voltages and fast switching speeds of these devices require wide measurement dynamic ranges for proper characterization. characterization Curve Tracer Obsolescence and Support Support and repair of obsolete curve tracers is becoming increasingly difficult. Also, getting curve tracer data into PC compatible formats is inconvenient. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 4 October 22, 2009
  5. 5. Key Power Device Measurement Challenges – 2 Safe & Efficient Packaged Device Testing The lack of a standardized test fixture for power devices has forced many users to jury rig their own solution solution, which often compromises both safety and performance. Power Device Development Costs The ability to probe power devices on-wafer saves both time and money by eliminating the need to package the devices beforehand However until now on-wafer test beforehand. However, on wafer of power devices has not been easy to do. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 5 October 22, 2009
  6. 6. The New Agilent B1505A Meets these Measurement Challenges • Voltage force/measure capability up to 3000 V • Accurate sub picoamp level current measurement at high sub-picoamp voltage bias • Current force/measure capability up to 40 A • 50 μs current pulse width at high current • Switch between high current and high voltage measurement without needing to recable • Capacitance measurement at up to 3000 V of DC bias p p • True curve tracer functionality with knob sweep capability • MS Windows based EasyEXPERT software facilitates data management and simplifies data analysis • Standard test fixture with interlock for safe packaged power device testing • Supported and secure on-wafer high power testing New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 6 October 22, 2009
  7. 7. Overview of the B1505A & EasyEXPERT Software New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 7 October 22, 2009
  8. 8. The EasyEXPERT Parametric Test Environment True Tr e knob s eep c r e sweep curve tracer functionality IV & CV all in one box Easy data analysis & parameter extraction High power wafer prober control b t l Offline test development and p data analysis New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 8 October 22, 2009
  9. 9. Agilent EasyEXPERT 4.0 Software Over 50 high power Innovative task-based Measure, append and Microsoft Windows-based Windows based approach to parametric test repeat functions EasyEXPERT software application tests Built-in semi-auto wafer prober drivers Supported Functions: 1. Sweep 2. Multi-channel sweep Standby mode for 3. List sweep circuit debug 4. Time sampling 5. 5 1 kHz to 5 MHz CV 6. Quasi-static CV 7. Direct control “My Favorite Setup” feature allows users to customize application “Tracer Mode supports Tracer Mode” tests knob-sweep curve tracer functionality Intuitive GUI-based application test setup windows Can automatically export Data and setup information can be measurement data to “Quick Test” utility automatically saved or selectively external drives supports test sequencing without programming saved after each measurement New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 9 October 22, 2009
  10. 10. EasyEXPERT and Desktop EasyEXPERT Software form a Complete Measurement Environment Desktop EasyEXPERT Desktop Desktop EasyEXPERT Online Mode EasyEXPERT y Offline Mode is free! Measurement data & test setups M td t t t t • Data analysis • Full functionality & control • Test development from a separate PC EasyEXPERT on the B1505A New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 10 October 22, 2009
  11. 11. The B1505A Supports a Variety of Source/Monitor Units (SMUs) for High Power Test High Voltage SMU (HVSMU) High current SMU (HCSMU) Multi-frequency capacitance measurement unit (MFCMU) High power SMU (HPSMU) 4.2 Amp ground unit (GNDU) Ten l t T slot modular mainframe d l i f New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 11 October 22, 2009
  12. 12. The High-Current SMU (HCSMU) Can Output a 20 A Current Pulse with a 50 Microsecond Width The HCSMU’s pulsing p g capability minimizes 20 A device heating effects to insure proper device characterization. characterization 50 μs 200 nV voltage measurement resolution! New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 12 October 22, 2009
  13. 13. You Can Combine Two HCSMUs in Parallel to Supply up to 40 A A 40 A current pulse applied to a 100 mΩ resistor using two HCSMU modules in parallel V drop at 100 mΩ Resistor = (20 + 20) x 0.1 = 4.0 (V) Power at 100 mΩ Resistor = 40 x 4.0 = 160 (W) New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 13 October 22, 2009
  14. 14. Bipolar Transistor Emitter Resistance Measurement Using the HCSMU The B1505A can also automatically draw a regression line and calculate the emitter resistance. resistance The HCSMU can function as a precision voltmeter to measure the emitter resistance of a bipolar transistor. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 14 October 22, 2009
  15. 15. The High Voltage SMU (HVSMU) Can Sweep from Microvolts to 3000 Volts in Milliseconds A breakdown voltage of more than 1800 V accurately characterized y on a Schottky diode fabricated on a diamond substrate 3000 V ~7 8 ms 7.8 10 fA current measurement resolution! New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 15 October 22, 2009
  16. 16. High DC Bias Capacitance Measurements Output capacitance (Coss) measured at 1500 V New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 16 October 22, 2009
  17. 17. Curve Tracer Mode: Features & Benefits New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 17 October 22, 2009
  18. 18. Using the B1505A Curve Tracer Function 1. 1 Click or press the repeat button. 2. Select the parameter to be controlled with the knob sweep. 3. Move the knob and observe the curve as it changes. Note: The default colors have been changed for easier viewing on these slides. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 18 October 22, 2009
  19. 19. The Curve Tracer Mode in Action Functionality exactly the same as a traditional analog curve tracer! New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 19 October 22, 2009
  20. 20. Pre-Defined Curve Tracer Setups are Included Clicking on the “utility” icon in the setup window opens up a menu of pre- defined curve tracer setups for the most common teststests. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 20 October 22, 2009
  21. 21. Curve Tracer Issue #1 – Difficult to Manage Trace Data It is VERY difficult to export curve tracer data into PC compatible formats. Many curve tracers have no or limited trace overlay capabilities. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 21 October 22, 2009
  22. 22. Trace Management Feature - 1 Clicking on the camera icon saves trace data into memory. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 22 October 22, 2009
  23. 23. Trace Management Feature - 2 Clicking on the adjacent icon j opens up the trace manager window. window New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 23 October 22, 2009
  24. 24. Using the Trace Management Feature Pulsed Non-Pulsed Measurement Measurement Using the trace management feature, it is easy to show the effects of device self- heating by comparing the results of pulsed and non-pulsed measurements. measurements New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 24 October 22, 2009
  25. 25. Trace Manager Feature Detail Show/Hide Invert Selected Delete Selected Open (Import) Save Selected Selected Trace Trace Trace a Trace Trace Data Simply Click on a Trace to Select It New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 25 October 22, 2009
  26. 26. You Can Easily Save Data into XML (Spreadsheet) or CSV Formats New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 26 October 22, 2009
  27. 27. Curve Tracer Issue #2 – Difficult to Define “No Go Regions No Go” Many times it is useful to set up “stop” limits to prevent your power device from being damaged. Conventional curve tracers do not have this type of capability. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 27 October 22, 2009
  28. 28. Forbidden Region (Stoplight) Feature - 1 Clicking on the stoplight icon allows you to set up a “forbidden” forbidden region using the mouse. Note that this region can be both voltage and current sensitive. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 28 October 22, 2009
  29. 29. Forbidden Region (Stoplight) Feature - 2 As soon as the curve enters the forbidden region, the measurement stops. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 29 October 22, 2009
  30. 30. Curve Tracer Issue #3 – Easy to Destroy Devices & Lose Data Especially with power devices, it is easy to inadvertently apply too much voltage/current and destroy the DUT. When using conventional curve tracers, once the device is destroyed there is no means to recover the data. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 30 October 22, 2009
  31. 31. Auto Record Feature Detail Toggle Auto Record Open a Trace Save a Trace Feature On/Off Record Record Replay Controls Record Settings New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 31 October 22, 2009
  32. 32. Auto Record Feature Example - 1 Notice that the instrument is “off” (i.e. not making an active measurement) New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 32 October 22, 2009
  33. 33. Auto Record Feature Example - 2 New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 33 October 22, 2009
  34. 34. Auto Record Feature Example - 3 The data “snapshot” can be saved anywhere as you move th slider the lid bar along. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 34 October 22, 2009
  35. 35. The B1505A is More Than Just a Digital Curve Tracer + = The B1505A improves upon curve tracer functionality by: • Supporting the easy export of numerical and g p pp g y p graphical data into PC- based formats • Making it easy to overlay and compare trace data • Providing a graphical means to limit current/voltage and prevent device damage • Automatically recording trace data so that information is not lost even if the DUT is damaged or destroyed New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 35 October 22, 2009
  36. 36. Packaged Part Test and g Wafer Probing Solutions New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 36 October 22, 2009
  37. 37. The N1259A Test Fixture Supports Convenient and Safe Testing of Packaged Devices Universal Socket Module 3-Pin In-line Socket Module Blank Teflon Board New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 37 October 22, 2009
  38. 38. You Can Create Your Own Customer Socket Modules with the Universal Socket Module For more information please refer to the product note B1505A-1, “Creating Custom Socket Modules for Packaged Power Devices.” New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 38 October 22, 2009
  39. 39. The Module Selector Unit Facilitates Device Test D Module Selector G Unit S PSMU HP MU MU MU DU HCSM HVSM HPSM GND New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 39 October 22, 2009
  40. 40. The High Voltage Bias-T Supports CV Measurements with up to 3000 V of DC Bias New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 40 October 22, 2009
  41. 41. The N1259A Test Fixture Shown with the Module Selector and High Voltage Bias-T Options Bias T N1259A-020 N1259A-300 p HV bias-T option Module selector option p New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 41 October 22, 2009
  42. 42. The B1505A Supports All Popular High-Power Analytical Wafer Probers Quick Test Quick Test allows you to perform test sequencing Q f without any programming. You can also use Quick Test with the built-in semiautomatic wafer prober drivers to automate testing across an entire wafer. The test data can b saved to any available storage d i be d il bl device. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 42 October 22, 2009
  43. 43. Setting Up to Auto Probe Across a Wafer New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 43 October 22, 2009
  44. 44. High Voltage Wafer Probing Connection Example -1 New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 44 October 22, 2009
  45. 45. High Current Wafer Probing Connection Example - 2 New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 45 October 22, 2009
  46. 46. Module Selector Wafer Probing Example New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 46 October 22, 2009
  47. 47. The N1260A High Voltage Bias-T (Wafer Prober Version) 3 SHV Outputs 164 mm 53 mm AC Guard Low High 125 mm High-voltage triaxial connector 4 BNC C-meter connections ti Note: The d t face h screw h l N t Th adapter f has holes so that it can be mounted on a plate. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 47 October 22, 2009
  48. 48. Cgd Measurement Example (Lateral Device) New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 48 October 22, 2009
  49. 49. Gate-to-Drain Capacitance (Cgd) Measured at 500 V New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 49 October 22, 2009
  50. 50. Solar Cell Test with the B1505A New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 50 October 22, 2009
  51. 51. Basic Solar Cell Parameters IV measurement Capacitance measurement Symbol Parameter Name Unit Symbol Parameter Name Unit Isc Short circuit current A Cp Parallel capacitance F Jsc Short circuit current density A/cm2 Nc Carrier density cm-3 3 Voc Open circuit voltage V Ndl Drive-level density cm-3 Pmax Maximum power point W Imax Current at maximum power point A Vmax Voltage at maximum power point V Time domain measurement FF Fill factor --- Symbol Parameter Name Unit η Conversion efficiency y % τ Minority carrier lifetime y s Rsh Shunt resistance Ω S Surface recombination velocity cm/s Rs series resistance Ω Ld Minority carrier diffusion length m New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 51 October 22, 2009
  52. 52. Solar Cell DC and AC Equivalent Circuits Solar Cell Rs Solar Cell rs + + Rsh Load Cp rp Load - - DC Equivalent Circuit AC Equivalent Circuit New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 52 October 22, 2009
  53. 53. EasyEXPERT Solar Cell Application Tests A suite of E i f EasyEXPERT EXPERT solar cell application tests is available from the B1505A web page. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 53 October 22, 2009
  54. 54. Sample Application Test List Application Test Name Type of Measurement Parameters & Plots Solar Cell IV IV measurement Isc, Jsc, Voc, Pmax, Imax, Vmax, Solar Cell Fwd IV measurement FF, η, Rsh, Rs Solar Cell Rev IV measurement Rsh Solar Cell Cp-V C-Vdc measurement Mott-Schottky Plot, Nc Solar Cell Nc W Nc-W C-V C Vdc measurement Nc Solar Cell Cp-Freq Log C-f measurement Solar Cell Nyquist Plot y C-f measurement Nyquist Plot y Solar Cell Cp-ACLevel C-Vac measurement Ndl Solar Cell DLCP C-Vac measurement Ndl New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 54 October 22, 2009
  55. 55. Typical Solar Cell IV Forward Characteristics ΔVsc Isc ΔVsc Rsh = − ΔIsc ΔIsc ΔVoc Rs = − ΔIoc Imax Pmax ΔVoc C ent Curre ΔIoc Voltage Vmax Voc New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 55 October 22, 2009
  56. 56. Solar Cell Test Example (IV Fwd) Note that EasyEXPERT automatically extracts all important device parameters. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 56 October 22, 2009
  57. 57. C-AC Voltage Plot and DLCP Measurement C-AC Voltage Plot Drive-level Capacitance Profile (DLCP) New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 57 October 22, 2009
  58. 58. Cp-f and Nyquist Plots Cp-Frequency Plot Nyquist Plot Cole-Cole Plot Complex Impedance Plot New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 58 October 22, 2009
  59. 59. Summary & Reference Information y New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 59 October 22, 2009
  60. 60. The Agilent B1505A Power Device Analyzer / Curve Tracer is the only Single Box Solution That Can… • Measure and source current and voltage at up to 3000 V and 40 A • Measure capacitance at up to 3000 V of DC bias • Provide true curve tracer functionality with easy data export into PC based work environments • Safely support both packaged part and wafer prober testing environments New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 60 October 22, 2009
  61. 61. How Do I Get More Information? For more information please go to: www.agilent.com/find/b1505a www agilent com/find/b1505a On this web page you can find: • Data Sheet • Manuals • Drivers & Software • Application Notes • Trade-In Information New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 61 October 22, 2009
  62. 62. How Can I Get a Live Demonstration? Our staff at the North American technical contact center (TCC) can give you a live demonstration of the B1505A at your desk using Webex Please Webex. call one of the following numbers to arrange for a B1505A demo. United States: 800-829-4444 Canada: 877-894-4414 Latin America: 305-269-7500 If a live demonstration at your site is necessary, then th th the TCC engineers can put you in t i t i touch with h ith an application engineer local to your area. New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 62 October 22, 2009
  63. 63. Trade In Program Trade-in Credit Trade-in Model Towards B1505A1,2 Tek 370A, 370B, $5,000 371A or 371B Program to be Tek 575, 576 or 577 $1,000 extended into 2010! Agilent 4142B $3,900 1. These credits are valid for US only. Due to currency fluctuations the discount amount will vary for other regions. 2. Trade-ins can only be made on a 1:1 basis (i.e. only one trade-in per B1505A purchased). New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 63 October 22, 2009
  64. 64. Questions? New Power Device Analyzer / Curve Tracer Agilent Technologies 2009 © Page 64 October 22, 2009

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