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What makes hitachi gst the industry leader in quality and reliability
 

What makes hitachi gst the industry leader in quality and reliability

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Hitachi Global Storage Technologies (HGST) has been consistently ranked top on quality and reliability in HDD industry. The most recent awards include HP Quality Award, Supplier Excellence Award from ...

Hitachi Global Storage Technologies (HGST) has been consistently ranked top on quality and reliability in HDD industry. The most recent awards include HP Quality Award, Supplier Excellence Award from Google, and Number One Supplier recognition from Sony for the best quality, reliability, and service. This presentation provides an experience sharing of HGST’s success story with best practices in quality and reliability.
It covers the following topics:
1. HGST Quality and Reliability philosophy & vision
2. Define Quality and Reliability leadership and team building
3. Understand Product Life-Cycle Reliability Pattern and Define Closed-Loop Reliability Activities
4. Define Quality and Reliability Matrices and Conduct Reliability Prediction and Allocation
5. Assure System Quality & Reliability Starting from Bottom - Component and Supplier Quality Monitoring
6. Grow/Mature Product Reliability during Development
7. Ongoing Quality & Reliability Monitoring during Volume Production
8. Holistic product health monitoring and proactive processes – parametric Quality and Reliability
9. “Ochibo” spirit – learn from “mistakes” through Problem Deep Diving and continuous improvement
It is hoped that the audience can get a systematic view and appreciation of reliability efforts behind a successful company.

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    What makes hitachi gst the industry leader in quality and reliability What makes hitachi gst the industry leader in quality and reliability Presentation Transcript

    • What Makes Hitachi GST the  Industry Leader in Quality and  Reliability (是什么造就了日立 R li bilit (是什么造就了日立 全球资讯储存质量和可靠性的 资 业界领导地位) Dr. Feng‐Bin (Frank) Sun (孙凤 斌博士) 斌博士 ©2011 ASQ & Presentation Sun Presented live on Dec 07th, 2011http://reliabilitycalendar.org/The_Reliability_Calendar/Webinars_liability Calendar/Webinars ‐_Chinese/Webinars_‐_Chinese.html
    • ASQ Reliability Division  ASQ Reliability Division Chinese Webinar Series Chinese Webinar Series One of the monthly webinars  One of the monthly webinars on topics of interest to  reliability engineers. To view recorded webinar (available to ASQ Reliability  Division members only) visit asq.org/reliability ) / To sign up for the free and available to anyone live  webinars visit reliabilitycalendar.org and select English  Webinars to find links to register for upcoming eventshttp://reliabilitycalendar.org/The_Reliability_Calendar/Webinars_liability Calendar/Webinars ‐_Chinese/Webinars_‐_Chinese.html
    • What Makes Hitachi GST the Industry Leader in Quality & Reliability?是什么造就了日立全球资讯储存技术(HGST) 质量和可靠性的业界领导地位? Frank Sun, Ph.D.孙凤斌博士 HDD Reliability Engineering Hitachi Global Storage Technologies US Headquarters, San Jose, California Headquarters Jose franksun99@yahoo.com December 2011 ASQ Reliability Mandarin Webinar Copyright © 2010, Hitachi Global Storage Technologies, All rights reserved.
    • Hitachi GST Market Segment Overview (HGST 产品市场概貌) Hitachi provides digital storage that Endurastar delivers pioneering technology and Personal QUALITY that customer can count on. Storage Solid State Drives CinemaStar (SSD) Enterprise Desktop Mobile 2.5/3.5- 2.5/3.5-inch 3.5- 3.5-inch 2.5- 2.5-inch LifeStudio and G-Technologygy Ultrastar series Deskstar series Travelstar series Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 2
    • Hitachi GST Global Operations ( HGST 全球业务分布) US Headquarters: San Jose, California Worldwide locations: 7 Revenue: US$6B (2010) Employees: Approximate 45,000 worldwide Netherlands US Headquarters San Jose, California Beijing, China Rochester, Minnesota Fujisawa, Japan Shenzhen, China Odawara , Japan Taiwan Prachinburi , Thailand Hong Kong, China Global Center Laguna, Philippines HSPC, Shenzhen, China Singapore Established:1995 Sarawak, Malaysia Focus: Head gimbal assembly (HGA) manufacturing HGST, Shenzhen, China Established:1997 Focus: Disk manufacturing HGSP, Shenzhen, China Established: 2005 Focus: HDD manufacturing gThe image cannot be display ed. Your computer may not hav e enough memory to open the image, or the image may hav e been corrupted. Restart y our computer, and then open the file again. If the red x still appears, y ou may hav e to delete the image and then insert it again. Headquarters R&D Manufacturing Customer Centers Logistics Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 3
    • 2011 HP Quality Award (2011 HP 质量大奖)• The 2011 HP Quality Award recognized Hitachi Hit hi GST for being first in quality among f b i fi t i lit all suppliers supporting every area of Hewlett Packards business business. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 4
    • 2011 Supplier Excellence Award from Google & Sony(2011 谷歌 和 索尼 最佳供应商) • Google Award: For the first time • Hitachi GST merited perfect in its company history, Google p y y, g scores for On-time Delivery, HDD y, presented the Supplier Excellence Quality, HDD Reliability and Award to “recognize suppliers for Engineering for Random Access their th i commitment, quality, service it t lit i seek performance in Googles k f i G l and value-add to Google.” data center environment. • Sony Award: For the fourth quarter in a row, Hitachi GST received the Number One Supplier ranking from the Sony Group for the best quality and service. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 5
    • World Class Quality - - Customer Ranking(基于用户评审的世界级品质) Hitachi Quality positions customers for success #1 in Quality by majority of OEM customers! Sustained Leadership for the last 4 years 1st 2ndHitachi Qualityas rankedby Customers 3rd 4th Q1 Q2 Q3 Q4 Q1 Q2 Q3 Q4 Q1 Q2 Q3 Q4 Q1 Q2 Q3 Q4 Q1 Q2 Q3 Q4 2006 2007 2008 2009 2010 Hitachi Confidential Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 6
    • World Class Reliability - - Enterprise Products (世界级可靠性 – 高端(性能)产品 用户体验) Field Performance: 15K RPM Server Drives 1.2% Field Performance - - Enterprise Drives %) Annualized Failure rate (% 1.0% 1 0% Competitive functions, features, 0.8% performance, and environmental footprint 0.6% (1.6 M Hrs MTTF) At d demonstrated and consistent Best of t t d d i t tB t f 0.4% Breed Quality and Reliability 0.2% Delivers unparalleled Total Cost of p 0.0% Ownership 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 Months After Volume Production Field Performance: 10K RPM Server Drives Field Performance: 7.2K RPM Nearline Drives 1.2% 1.2% alized Failure rate (%) alized Failure rate (%) 1.0% 1.0% r r 0.8% 0.8% (1.2 M Hrs MTTF) 0.6% 0.6% (2.0 M Hrs MTTF) 0.4% 0 4% 0.4% 0 4%Annua Annua 0.2% 0.2% 0.0% 0.0% 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 Months After Volume Production Months After Volume Production Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 7
    • World Class Reliability - - Desktop & Mobile Products(世界级可靠性 – 台式 和 移动 (电脑)产品用户体验 ) Field Performance: Mobile Drives 1.2% %) Annualized Failure rate (% 1.0% 1 0% 0.8% (500 K Hrs MTTF) 0.6% 0.4% Field Performance - - Mobile & Desktop Drives 0.2% Hitachi means RELIABILITY 0.0% 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 Consistently setting best-of-breed goals . . . Months After Volume Production And consistently outperforming to those Field Performance: Desktop Drives goals 1.2% alized Failure rate (%) 1.0% r 0.8% 0.6% (800 K Hrs MTTF) 0.4% 0 4% Annua 0.2% 0.0% 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 Months After Volume Production Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 8
    • What’s Behind HGST’s World Class Quality & Reliability(HGST世界级质量和可靠性的背后是什么?) Customer-centered proactive Quality and Reliability philosophy C d i Q li d R li bili hil h Strong leadership in Quality and Reliability teams Robust margin through Design for Reliability Strict and consistent supplier qualification Vigorous qualification test and Reliability Growth process Holistic product health monitoring and proactive processes – parametric Quality and Reliability t i Q lit d R li bilit “Ochibo” spirit – learn from “mistakes” through Problem Deep Diving and continuous improvement Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 9
    • Define Leadership and Philosophy D fi L d hi d Phil h in Quality and Reliability(确立 确有效的质量和可靠性领导机制和理念)(确立正确有效的质量和可靠性领导机制和理念) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 10
    • Hitachi GST Executive Staff – Quality/Reliability Path ( HGST 质量和可靠性的行政执行架构) Quality and Reliability at Hitachi GST On par in importance with other key elements of a healthy and sustainable business Led by Sr. Vice President President & Chief Executive Officer Offi Strategy & Chief Strategist Corporate of Data Storage DevelopmentChief Technology Sales & Marketing Quality Chief Financial Officer Human Resources Branded Business General Counsel & Operations Officer Japan Operations Reliability Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 11
    • Hitachi GST Quality/Reliability Team ( HGST 质量和可靠性的工作团队和功能) End to End Quality Focus Quality & Reliability R li bilit Test and Quality Supplier WW Head WW Media Desktop & Customer Reliability Enterprise QA Systems Quality Quality Quality Mobile QA Tech. Support EngineeringTotal Quality System Includes Suppliers Processes & Technology Design Validation Product & Process on Monitor Ensure Customer Delight Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 12
    • World Wide Reliability & Statistics Trainings(全球性的可靠性和工程统计培训: 确保强有力的技术团队) Training in Session China Thailand Japan Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 13
    • HGST Reliability Philosophy(HGST可靠性理念) Philosophy(HGST可靠性理念) Eliminate customer reliability issues through: • Early problem discovery aimed at – Characterizing and improving design robustness – Evaluating major components – Systematically growing product reliability Test beyond product specification to define design margins Conduct accelerated stress testing whenever possible Conduct full h C d t f ll characterization of drive performance t i ti fd i f Incorporate HGST specification and key customer requirements p p y q Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 14
    • HGST Reliability Slogan! (HGST可靠性口号) Have PRIDE! (以可靠性为荣) Put 将 Reliability 可靠性 靠性 融于 Into 每一天的 Daily 工作努力 Effort 之中 Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 15
    • Understand Product Life-Cycle Reliability Pattern and y y Define Closed-Loop Reliability Activities (了解产品全寿命期的可靠性特征; 定义闭环可靠性活动) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 16
    • HDD Reliability Life Cycle Pattern - Theoretical Perception*(产品全寿命期的可靠性特征 – 理论模型) Early Wearout failure Useful life period period period ate Failure ra TS = steady state T W = wear-out starting time: starting time: around 1 year 5 to 7 years F Cumulative operating time * Reference (10) by Sun and Yang, 1997 Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 17
    • HDD Reliability Life Cycle Pattern - - In Real World*(产品全寿命期的可靠性特征 – 实际观察) • HDD hazard rate function doesn’t h d t f ti d ’t follow the traditional bathtub curve. • g It manifests itself as an increasing- decreasing-stabilized pattern during warranty. • The time-to-steady-state is not always one year. year* See Reference (3) by Sun and Zhang, 2007 Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 18
    • Reliability In Product Life Cycle (产品全寿命期的可靠性活动) Reliability Activities in the Life Cycle of a Product - Interrelationships Among All Disciplines in the Creation and Merchandising of a Product Reliability y Research & R h Growth Pre-Prototype P P t t Development Testing DFR/RP/RA* Develop Design Specifications p Qualification Testing Start Deliver Quality, Reliability, Maintainability and Safety of Products, Customer C t On S h d l O Schedule Satisfaction! and at a Profit! (Marketing Research Manufacture of - Determine Prototype Customer Needs) All Segments of the Organization Must Align Themselves g to Attain These Objectives End Product Reliability Reliability Monitoring & Demonstration D t ti Improvement Testing MST/LORT** Field* DFR: Design for Reliability Full Scale Service Production RP: Reliability Prediction (Field AFR RA: Reliability Allocation Tracking) g)** MST: Manuf. Stress Testing; LORT: Long-term Ongoing Reliability Test Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 19
    • HGST Reliability Assessment Program (HGST 可靠性评审架构) ( 可靠性评审架构) Design For Reliability Reliability Reliability Growth/Maturity/Demo Monitoring and Maintenance F Build D Build HVM EOL Design; Historical FA Data Design Verification/Maturity Tests Reliability Prediction Reliability Growth and Demonstration Ongoing Reliability Monitoring Tests O i R li bilit M it i T t Field Reliability T ki Fi ld R li bilit Tracking Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 20
    • Define Quality d R li bilit M t i D fi Q lit and Reliability Matrices and dConduct Reliability Prediction and Allocation(确定质量和可靠性参数; 进行可靠性预测和分配) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 21
    • Measurement of HDD Quality and Reliability (硬盘质量和可靠性度量) Quality is a Snapshot & Reliability is a Motion Picture* asurement• Time zero defects (such as “P0”) are Parametric Mea Spec Level manufacturing mistakes that escaped final P0 P1 P2 test. Additional defects that appear over time Time “0” 0 T1 T2 (such as P1 and P2) are "reliability defects" or Time of Usage reliability fallout. function of time (CDF) parameter is below Probability th the product spec as a hat e } c• The quality level might be described by a single fraction defective (outside of spec), in P0 } P1 P2 terms of % defective, defects per million Time “0” 0 T1 Time of Usage T2 (DPM), defective parts per million (DPPM), etc. failure (parame below function (pdf) for time to Probability density product spec) eter P2 - P1- P0• Reliability can be described by life f s P1- P0 distribution and measured by the fraction P0 fallout over time (cumulative failure Time “0” 0 T1 T2 probability: CDF), mean ti b bilit CDF) time to failure t f il Time of Usage (MTTF), mean time between failures (MTBF), Quality and Reliability: An example annual (annualized) failure rate (AFR), etc. of product parametric measurement p p as a function of time.* Reference (4) by Sun, 2007 Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 22
    • Component and Failure Mechanism Based ReliabilityPrediction (基于元器件组成和产品实效机制的可靠性预测) Air filter Spindle motor Disk Criticality of Head-Disk Interface – A Nanometer World Voice coil magnet Base machined casting Boeing 747: 70.6m Long Load & unload casting Head stack assemblyPCBA & electronics Flex circuit & pre amp device p p Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 23
    • HGST Reliability Database Structure (可靠性数据库结构) S/W Field Return and/or Commercial Repair & FA F/W Databases Analysis D t A l i Data (Bellcore MIL- MIL-STD 217F) HGST Reliability Database HGST Supplier Data Internal • Life Test Qualification Q lifi ti • Rel. Monitor Test Data Tests Process Induced Failure Rate Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 24
    • Iteration of Reliability Prediction and Reliability Allocation(可靠性的预测和分配迭代) (2) Compare with (3-1) Meeting Target System Reliability Target (1) On Existing Design & Material & Supplier (3-2) Not Meeting Target Entry Reliability Reliability System Prediction Allocation Exit Design (5) On New Design & Material & Supplier (4) Improved Design & Material & Supplier Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 25
    • Assure S tA System Q lit & R li bilit Starting from Bottom Quality Reliability St ti f B tt -Component and Supplier Quality Monitoring(由下而 确保系统的质量和可靠性(由下而上确保系统的质量和可靠性 - 元器件供应商品质监控) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 26
    • “Web-based Component SPC” (基于互联网的在线统计过程控制) Functions Closely monitor supplier quality real time (Wkly to Daily) Eliminate non-confirming/out-of-control part escape to HGST Immediate & automatic trigger when “Out of Control” happens Objectives and Benefits Assure delivery of the Best-Quality HDDs to Customers. Assure hi h Effi i A high Efficiency and St bili ti d Stabilization on HDD Q lit and Yield. Quality d Yi ld Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 27
    • Supplier Statistic Process Control Overview(供应商统计过程控制流程) Define Critical Parameters Daily Review on Critical Parameters (by “DEV” & “CE”) (by SQE)Hitachi GST CIP Supplier SPC Activities Feedback and Analysis SPC Plan / Analysis SPC Review (Parameter Selection & Data Collection) (with Management) SPC Preparation Feedback & Operation Feedback and Improvement Analysis Supplier Online SPC Monitoring Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 28
    • Sample Charts from Component Web SPC(基于互联网的在线统计过程控制图结果示范) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 29
    • Grow/Mature Product Reliability G /M t P d t R li bilit During Development(在研发阶段的产品可靠性增长和成熟) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 30
    • Reliability Growth Through Extensive and Vigorous Testing(通过全面和有力的试验进行产品可靠性增长) System Integration Test Lab System Integration & Compatibility Firmware Root Cause FA Performance Issues Corrective Actions Mechanical Detected & Identified Preventive Actions Electrical Reliability Growth Environmental Stress E i t l St Reliability Demonstration Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 31
    • Extensive and Vigorous Testing: System Compatibility(全面和有力的试验:系统兼容性测试) Mobile Desktop Enterprise CE Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 32
    • Extensive and Vigorous Testing: Mechanical(全面和有力的试验:机械可靠性测试) Rotational Vibration (Shaker & Performance RV) Vibration (Op & Non op) Non-op) Shock (Operational & Non-Op) Acoustics (Sound Power or Pressure) Rotational Shock (Non-op) Th Thermal (Th l (Thermocouple and I f l d Infrared) d) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 33
    • Extensive and Vigorous Testing: Electrical(全面和有力的试验:电器可靠性测试) Current / Power Power Supply Variation Power Line Noise Injection Temperature and Voltage Sequencing Position Error Signal Servo Stress Serial Signal Analysis Vibration S Stress Test Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 34
    • Extensive and Vigorous Testing: Performance(全面和有力的试验:性能可靠性测试) All segments • Mobile, Desktop, CE, Enterprise • HDD & SSD Industry standard Benchmarks • IOMeter • PCMark Vantage • H2Bench • SysMark • Etc. Customer Unique Benchmarks Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 35
    • Extensive and Vigorous Testing: Environmental Stress(全面和有力的试验:环境应力综合可靠性测试) Temperature Humidity Voltage Workload/scripts Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 36
    • Reliability Growth during Development: Actual vs Theoretical*(研发阶段可靠性增长: 实际结果和理论预期之比较) Expected and Actual RDT Failure Rate ‐ An Example  Expected RDT FR Actual Normalized RDT FR 90% Lower CL for RDT FR 90% Upper CL for RDT FR 12.00% 10.00% 9.11% 8.00% ailure Rate 6.31% 6.00% RDT Fa 4.00% 2.97% 2.25% 2.00% 2.39% 1.65% 0.92% 0.83% 0.00% pRDT0 pRDT1 pRDT2 RDT * Duane Model RDT Test Phases Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 37
    • Reliability Demonstration Test TTF Trend: Actual vs Expected(可靠性验证试验的实效时间趋势: 实际结果和理论预期之比较) Example of RDT TTF Trend Tracking - Actual vs Expected CL 80% Lower CL (Beta=0.7) 80% Upper CL (Beta=0.7) Actual Cum Fail % CDF-(Beta=0.7) 1.4000% 1.2000% Theoretical/Expected Fail % and 80% CL with Field MTTF_SS = 2 Million Hr and Beta=0.70 1.0000% 0.8000% Actual RDT Cum Fail % Cum Fail % 0.6000% 0.4000% 0.2000% 0.0000% 0 200 400 600 800 1000 1200 -0.2000% RDT TTF, Hours Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 38
    • Predicted MTTF vs HDD Temperature & Functional Duty Cycle(表征平均寿命与产品温度和 工作负荷关系的预测谱图) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 39
    • Predicted AFR vs HDD Temperature & Functional Duty Cycle(表征年实效概率与产品温度和 工作负荷关系的预测谱图) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 40
    • Ongoing Quality & Reliability Monitoring O i Q lit R li bilit M it i during Volume Production(进入批量生产期间质量和可靠性的在线监控) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 41
    • Manufacturing Stress Testing for Product Quality Monitoring(产品质量监控的制造应力试验) Drives Sensor Temperature & Chamber Temperature and Voltage Profile 100 Drive Sensor lsius) 90 Temperature 80Temperatur (Degree Cel 70 60 Chamber Temperature 50 re Power Off Ramp 40 30 20 Power Off Ramp 10 0 -10 Temperature & Voltage Cycling -20 -30Volatge Margin -40 -50 e -60 -70 -80 Time in Test Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 42
    • Manufacturing Stress Testing: Quality Control Charts(制造应力试验:产品质量监控图) Failure % Control Charts: Individual Week vs 4-Week Rolling MST P-Control Individual Week P (MST) PA (MST) PA +3Sigma (MST) PA +2Sigma (MST) 8% PA +1Sigma (MST) 7% 6% Fail Rate 5% R 4% 3% 2% 1% 0% WK27 WK28 WK29 WK30 WK31 WK32 WK33 WK34 WK35 WK36 WK37 WK38 WK39 WK40 WK42 WK43 WK44 WK45 WK46 WK47 WK48 WK49 WK16 WK17 WK18 WK19 WK20 WK21 WK22 WK23 WK24 WK25 WK26 MST P-Control 4 WKs Rolling P (MST) PA (MST) PA +3Sigma (MST) PA +2Sigma (MST) PA +1Sigma (MST) 8% 7% 6% F Rate 5% 4% Fail 3% 2% 1% 0% WK16 6 WK17 7 WK18 8 WK19 9 WK20 0 2 WK22 WK23 3 WK24 4 WK25 5 WK26 6 WK27 7 WK43 3 WK44 4 WK45 5 WK46 6 WK47 7 WK48 8 WK49 9 WK21 WK28 8 WK29 9 WK30 0 WK32 2 WK33 3 WK34 4 WK35 5 WK36 6 WK37 7 WK38 8 WK39 9 WK40 0 WK42 2 WK31 Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 43
    • Long-Term Ongoing Reliability Test (LORT)(长期在线可靠性试验) Drives S D i Sensor Temperature & Voltage Profile (High) T t V lt P fil (Hi h) Time In Hours Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 44
    • Sample LORT Tracking Plots: P-Chart vs Steady-State AFR(长期在线可靠性试验监控示范图:失效百分图与稳态年失效概率图) Server Drive P-Chart for LORT 8.0 4-weeks Rolling Average Observations: 6.0 • Consistent trends . • “AFR Ch t” i more sensitive Chart” is iti All “Green” on “p-Chart” % failure 4.0 2.0 0.0 W3709 W3909 W4109 W4309 W4509 W4709 W4909 W5109 W0210 W0410 W0610 W0810 W1010 W1210 W1410 W1610 W1810 W2010 W2210 W2410 W2610 W2810 W3010 W3210 W3410 W1509 W1709 W1909 W2109 W2309 W2509 W2709 W2909 W3109 W3309 W3509 Week % failure for LORT P-Bar (3 Sigma) for LORT P-Bar (2 Sigma) for LORT P-Bar (1 Sigma) for LORT P-Bar for LORT Server Drive (MTTF Target = 1.6E6 Hr) 2.50% Ongoing Rel Audit, 4-week Rolling Steady-State AFR dy-State AFR, %/year 2.00% Steady-State AFR with All Failures Steady-State AFR with CA AFR Green AFR Red % There were some “Yellow” 1.50% High risk: Red warnings on “AFR Chart” 1.00% Medium risk: YellowStead 0.50% Low risk: Green 0.00% 910 110 310 510 710 910 110 310 510 509 709 909 109 309 509 709 909 109 309 509 709 909 109 309 509 709 909 109 110 310 510 710 910 110 310 510 710 W19 W21 W23 W25 W27 W29 W31 W33 W35 W15 W17 W19 W21 W23 W25 W27 W29 W31 W33 W35 W37 W39 W41 W43 W45 W47 W49 W51 W01 W03 W05 W07 W09 W11 W13 W15 W17 Work Week Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 45
    • Understand Product Quality and Reliability Holistically U d t d P d t Q lit d R li bilit H li ti ll – Parametric ORT Tracking(全息地了解产品质量和可靠性 – 基于参数退化的可靠性监控试验) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 46
    • What’s Happening Inside Your Product?(您了解您产品中正在发生什么吗?) * Reference (2) by Sun, et. Al. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 47
    • Goals and Values of Parametric Monitoring*(参数退化监控的目标和价值) 1. 1 Improve customer integration and field quality and reliability 1. Improve customer integration and field quality and reliability 2. Provide correlation with key components (head, disk, and motor) 2. Provide correlation with key components (head, disk, and motor) 3. Enable early detection of component and process changes prior to 3.customerearly detection of component and process changes prior to Enable integration customer integration 4. Assist in the failure analysis process 4. Assist in the failure analysis process 5. Optimization of the manufacturing test process 5. Optimization of the manufacturing test process 6. Revealing latent defects, improving manufacturing process and product 6 R li l d f i i f i d d 6.design will reduce defects,Field Returns Revealing latent overall improving manufacturing process and product design will reduce overall Field Returns* Note that HGST owns the Patent of Parametric ORT Process (Reference [13]) by Dr. Chris Lin, et. al. Chris started thisinitiative back in 1995 for IBM at the time. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 48
    • ORT Parametric Methodology* (参数退化监控的方法) ORT Parametric monitoring is a proactive measure Designed to gauge our manufacturing process by measuring key parameters on ORT sampled drives Each E h parameter is charted six ways: i h d i Sample mean and sigma Delta mean and sigma Delta = After - Before ORT testing “Warning” drives “Initial Warning drives - % drives exceeding parametric Initial Warning” threshold before ORT testing “Delta Warning” drives - % drives exceeding delta threshold value after ORT testing Triggers can be generated from any of the six charts Detect undesirable trends before drive failure* Reference (14) by Chris Lin. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 49
    • ORT Parametric Tracking Example* (参数退化监控的图例) X BAR Delta Initial X BAR ORT Test Program 2DSA017 Sigma Initial Delta Sigma Warning Delta Drives Warning Initial Drives* Reference (14) by Chris Lin. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 50
    • “Ochibo” S i it Learn from “Mistakes” Th“O hib ” Spirit – L f “Mi t k ” Through P bl h Problem Deep Diving and Continuous Improvement ( 奥棋搏 精神 从错误中学习 寻根纠底、不断改善) (“奥棋搏”精神 – 从错误中学习:寻根纠底、不断改善) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 51
    • What is ‘Ochibo’? (什么是“奥棋搏”精神?) ‘Ochibo’ = Gleaning in the field after the harvest. Learn from Mistakes 从错误和 疏漏中学习 ! Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 52
    • “Ochibo” Spirit and Practice ( “奥棋搏”精神和实践)• “Ochibo” Spirit : Listen to Customer’s Voice• 1951: Dr. Baba started ‘Ochibo’ Campaign• Dr. Baba’s Three Questions – Arent you unkind to other companies or other people? Aren t – Aren’t you suspicious to claims for your products? – Aren’t you saying empty theories to outside?• Problem Deep Diving and Preventive Actions – P bl Problem History and Customer Impact Hi t dC t I t – Failure Phenomenon – FA Root Cause and Containment (Countermeasure) – Motivational Root Cause Diving – 5 Layered Questions – Preventive Actions Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 53
    • Ochibo in Action ( “奥棋搏”在行动) Meeting Place Layout General Quality Status including (Reviewers and Audience) "What is Ochibo ?" Explanation of actual failed products Problem Deep Dive Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 54
    • Summary ( 总结)In summary, HGST quality and reliability achievement is a direct result of effectiveimplementation of multi-function system engineering and the following important factorscontribute to its success story: –Define Leadership and Philosophy in Quality and Reliability (确立正确有效的质量和可靠性领 导机制和理念) –Understand Product Life-Cycle Reliability Pattern and Define Closed-Loop Reliability Activities (了解产品全寿命期的可靠性特征; 定义闭环可靠性活动) –Define Quality and Reliability Matrices and Conduct Reliability Prediction and Allocation ( 确定质量和可靠性参数; 进行可靠性预测和分配) –Assure System Quality & Reliability Starting from Bottom - Component and Supplier Assure Quality Monitoring (由下而上确保系统的质量和可靠性 - 元器件供应商品质监控) –Grow/Mature Product Reliability During Development (在研发阶段的产品可靠性增长和成熟) –Ongoing Quality & Reliability Monitoring during Volume Production (进入批量生产期间质量 和可靠性的在线监控) –Understand Product Quality and Reliability Holistically – Parametric ORT Tracking (全息地 了解产品质量和可靠性 – 基于参数退化的可靠性监控试验) –“Ochibo” Spirit – Learn from “Mistakes” Through Problem Deep Diving and Continuous “Ochibo” Improvement(“奥棋搏”精神 – 从错误中学习:寻根纠底、不断改善) Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 55
    • Acknowledgements (致谢) • Deep appreciation to the kind support from HGST Quality and Reliability management team for granting this experience sharing sharing, especially Mr. Steven Craig (VP of Quality), Mr. Raul Gonzalez (Director of Test and Reliability), Mr. Steve Lock (Manager of HDD Reliability), Mr. Kavosh Dehpanah (Director, Enterprise Quality Assurance), Mr. Georgi Pernov (Manager - HDD Product Quality Engineering), Mr Engineering) Mr. Abdullah Rafiq (Senior Director Worldwide SQE & Director, CE), Mr. Brian Rodrigues (Director World Wide Media Quality), and Mr. Ali Asgari (Vice President Global Customer Technical Support), etc. for reviewing the materials and providing constructive feedbacks. • Thanks to Mr. Masao Matsushita, Dr. Chris Lin, Mr. Patrick Corpus, Ms. Mary Chagnon etc for providing data comments and relevant Chagnon, etc. data, comments, information. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 56
    • References – Papers (参考文献 –相关论文) 1. Feng-Bin Sun and Donald Gillis, “System Reliability with Competing Components and Load Sharing – A Hard Disk Drive Perspective,” Proceedings of 17th ISSAT International Conference on Reliability and Quality in Design, Vancouver, Canada, August, 2011. 2. 2 Shaoang Zh Sh Zhang, FFeng-Bin S Bi Sun, and Ross G dR Gough, “Application of An Empirical Growth Model in Predicting Hard Disk Drive h “A li ti fA E i i lG th M d l i P di ti H d Di k D i Field Warranty Returns,” Proceedings of 16th ISSAT International Conference on Reliability and Quality in Design, Washington, D.C., August, 2010. 3. Feng-Bin Sun, Eve Ou, and Shaoang Zhang, “Quantifying And Controlling Hard Disk Drive Reliability Through Parametric Monitoring D i P d t O M it i During Product Ongoing Reliability Test,” Proceedings of 15th ISSAT International Conference on Reliability and i R li bilit T t ” P di f I t ti lC f R li bilit d Quality in Design, San Francisco, California, August, 2009. 4. Feng-Bin Sun and Shaoang Zhang, “Does Hard Disk Drive Failure Rate Enter Steady-State After One Year?”, Proceedings of 2007 Annual Reliability and Maintainability Symposium, Orlando, Florida, January 22-25, 2007. 5. Feng-Bin Sun, “Predicting Customer Integration Fallout Based on Producer’s Final Quality Audit (FQA) Results,” Proceedings of 2007 Annual Reliability and Maintainability Symposium, Orlando, Florida, January 22-25, 2007. 6. Feng-Bin Sun, Jimmy Yang, Richard Murphy, et al., "A Conditional Reliability Monitoring Chart for the Extended Reliability Test (XRT), (XRT)," Proceedings of 2001 Annual Reliability and Maintainability Symposium, Philadelphia, Pennsylvania, pp. 64-69, January, 64 69, 2001. 7. David Groebel, Adamantios Mettas and Feng-Bin Sun, "On Activation Energy and Its Estimation from Accelerated Life Tests," Proceedings of 2001 Annual Reliability and Maintainability Symposium, Philadelphia, Pennsylvania, pp. 58-63, January, 2001. 8. Feng-Bin Sun and Wayne Chang, “Reliability Evaluation of A Flash RAM Using Step-Stress Test Results,” Proceedings of 2000 Annual Reliability and Maintainability Symposium, Los Angeles, CA, pp. 254-259, 2000. 9. Feng-Bin Sun and Jimmy Yang, “HDD Accelerated Life Test Modeling and Software Development,” Proceedings of 1999 Symposium of Institute of Environmental Sciences & Technology, Ontario, CA, May 2-7, 1999. 10. Sophie Chen, Feng-Bin Sun and Jimmy Yang, “A New Method for Hard-Disk Drive MTTF Projection Using Data From an Early Life Test,” Proceedings of 1999 Annual Reliability and Maintainability Symposium, Washington, DC, pp. 252-257, 1999. 11. Feng-Bin Sun and Jimmy Yang, “A Comprehensive Review of Hard-Disk Drive Reliability,” Proceedings of 1999 Annual Reliability and Maintainability Symposium, Washington, DC, pp. 403 409 1999 Symposium Washington DC pp 403-409, 1999. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 57
    • References – Books and Reports (参考文献 – 相关书籍和报告) 1. Reliability Engineering Handbook Vol1, by Dimitri Kececioglu, Published 1991 2. Reliability Engineering Handbook, Vol 2, by Dimitri Kececioglu, Published 1991 3. Reliability and Life Testing Handbook, Vol 1, by Dimitri Kececioglu, Published 1993 4. Reliability and Life Testing Handbook, Vol 2, by Dimitri Kececioglu, Published 1994 5. Practical Reliability Engineering, 4th Edition, by Patrick D. T. OConnor, Published 2002 y g g, , y , 6. Burn-In Testing: Its Quantification and Optimization, by Dimitri Kececioglu and Feng-Bin Sun, Published 1997 7. Environmental Stress Screening: Its Quantification, Optimization and Management, by Dimitri Kececioglu and Feng-Bin Sun, Published 1995 8. Accelerated Testing: Statistical Models, Test Plans and Data Analyses (Wiley Series in Probability and Mathematical Statistics- Applied Probability), by Wayne Nelson, Published 1990 9. Applied Life Data Analysis, by Wayne Nelson, Published 1982 10. Statistical Methods for Reliability Data (Wiley Series in Probability and Statistics. Applied Probability and Statistics Section), by William K. Meeker and Luis A. Escobar, Published 1998 11. Reliability: Probabilistic Models and Statistical Methods, by Lawrence M. Leemis, Published 1995 12. 12 “HGST Reliability Assessment Program Overview”, by F R li bili A P O i ” b Feng-Bin (Frank) Sun, HGST I Bi (F k) S Internal T i i B k 2010 l Training Book, 2010. 13. US Patent Number 7663828, "Determining the Reliability of a Disk Drive“, Date Issued: 02/16/2010, by Chris Lin, et. al. 14. “ORT Parametric Data Monitoring”, by Chris Lin, HGST Internal Report, 2006. 15. “World Class Reliability and Quality”, HGST Internal Report, 2011. 16. “SIT Lab Overview”, HGST Internal Report, 2011. 17. “Component Web SPC”, by Worldwide Supplier Quality Engineering, HGST Internal Report, 2011. Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved. 58
    • Copyright © 2009, Hitachi Global Storage Technologies, All rights reserved.59 59