This is a four parts lecture series. The course is designed for reliability engineers working in electronics, opto-electronics and photonics industries. It explains the roles of Highly Accelerated Life Testing (HALT) in the design and manufacturing efforts, with the emphasis on the design one (the HALT in manufacturing is the well known late Greg Hobb’s approach), and teaches what could and should be done to design, when high probability is a must, a product with the predicted, specified (“prescribed”) and, if necessary, even controlled, low probability of the field failure.
Part 3: • Design for Reliability (DfR)
• Probabilistic Design for Reliability (PDfR): role, attributes, challenges, pitfalls
• Safety margin and safety factor
• Practical examples: assemblies subjected to thermal and/or dynamic loading
Part 4: • More general PDfR approach
• New Qualification Approaches Needed?
• One effective way to improve the existing QT practices and specifications