This is a four parts lecture series. The course is designed for reliability engineers working in electronics, opto-electronics and photonics industries. It explains the roles of Highly Accelerated Life Testing (HALT) in the design and manufacturing efforts, with the emphasis on the design one (the HALT in manufacturing is the well known late Greg Hobb’s approach), and teaches what could and should be done to design, when high probability is a must, a product with the predicted, specified (“prescribed”) and, if necessary, even controlled, low probability of the field failure.
Part 1:• Reliability Engineering (RE) as part of Applied Probability (AP) and Probabilistic Risk Management (PRM)
• Accelerated Testing (AT) and its categories
• Qualification Testing (QT), Accelerated Testing and Highly Accelerated Life Testing (HALT)
• Predictive Modeling (PM) and its role
Part 2: • The most widespread HALT models: 1) Power law (used when PoF is unclear); 2) Boltzmann-Arrhenius equation (used when elevated temperature is the major cause of failure); 3) Coffin-Manson equation (an inverse power law used to evaluate low cycle fatigue life-time); 4) crack growth equations (used to evaluate fracture toughness of brittle materials); 5) Bueche-Zhurkov and Eyring equations (used to consider the combined effect of high temperature and mechanical loading); 6) Peck equation (to evaluate the combined effect of elevated temperature and relative humidity); 7) Black equation (to evaluate the combined effects of elevated temperature and current density); 8) Miner-Palmgren rule (to assess fatigue lifetime when the yield stress of the material is not exceeded); 9) creep rate equations; 10) weakest link model (applicable to extremely brittle materials with defects); 11) stress-strength (demand-capacity) interference model
• Example: typical HALT for an assembly subjected to thermal loading
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