Analog, mixed-signal and custom designs face unique challenges when it comes to power and reliability analysis. SRAM and FLASH memories are pushing the envelope to handle large designs, while mixed-signal and RF designs need concurrent analysis of large analog blocks with interspersed digital logic as well as substrate noise coupling. This presentation demonstrates how Totem, a single platform for Power Noise and Reliability, can be used to address the unique challenges for analog, mixed-signal and custom designs. Learn more on our website: https://bit.ly/1qk5Juj